IP Library Granted Patent US 10,084,114
Granted Patent B2
US 10,084,114 · App. 15/149,740 · Granted Sep 25, 2018

Textured optoelectronic devices and associated methods of manufacture

Inventors: Lifang Xu (Boise, ID); Scott D. Schellhammer (Meridian, ID); Shan Ming Mou (Singapore, SG); Michael J. Bernhardt (Meridian, ID)
Assignee: Micron Technology, Inc.
H01L33/38H01L31/0236H01L31/02168H01L31/02363H01L33/22H01L33/42H01L33/58H01L2933/0091Y02E10/50
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,084,114
App. No.
15/149,740
Granted
Sep 25, 2018
Kind
B2
Abstract

Textured optoelectronic devices and associated methods of manufacture are disclosed herein. In several embodiments, a method of manufacturing a solid state optoelectronic device can include forming a conductive transparent texturing material on a substrate. The method can further include forming a transparent conductive material on the texturing material. Upon heating the device, the texturing material causes the conductive material to grow a plurality of protuberances. The protuberances can improve current spreading and light extraction from the device.

Claims (17)

1. An optoelectronic device, comprising:

an optoelectronic transducer having at least a first semiconductor material, a second semiconductor material, and an active region between the first and second semiconductor materials;

a texturing material including titanium deposited over the optoelectronic transducer; and

a transparent conductive material on the texturing material, wherein the transparent conductive material has a plurality of protuberances projecting away from the texturing material.

2. The device of claim 1 wherein the transparent conductive material comprises indium tin oxide.

3. The device of claim 1 wherein the texturing material has a thickness from about 30 angstroms to about 60 angstroms.

4. The device of claim 1 , further comprising a mask deposited over at least a portion of the texturing material.

5. The device of claim 1 wherein the protuberances of the transparent conductive material comprise a plurality of irregular pillars in a random pattern across the optoelectronic transducer.

6. The device of claim 1 wherein the solid state optoelectronic transducer includes a N-type gallium nitride (GaN) material, an indium gallium nitride (InGaN) material over the N-type material, and a P-type GaN material over the InGaN material.

7. An optoelectronic device, comprising:

an optoelectronic transducer having a first semiconductor material, a second semiconductor material, and an active region positioned between the first and second semiconductor materials;

a texturing material positioned on the second semiconductor material;

a conductive material positioned on the texturing material and having a plurality of protuberances extending outwardly in a direction away from the texturing material, wherein the plurality of protuberances comprise a plurality of irregular pillars, wherein the conductive material is a first portion of conductive material;

a mask positioned on at least a portion of the texturing material; and

a second portion of conductive material positioned on the mask, wherein the first portion of the conductive material and the second portion of the conductive material form a pattern via absence and presence of the plurality of protuberances.

8. The optoelectronic device of claim 7 wherein the plurality of protuberances have a density, a size, a shape, an arrangement, or a combination thereof characteristic of a heating temperature used to grow the plurality of protuberances.

9. The optoelectronic device of claim 7 wherein the texturing material includes a plurality of ridges and valleys, and wherein the ridges and valleys define a pattern for the plurality of protuberances.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050676/0782 →
RELEASE OF SECURITY INTEREST Recorded Jul 20, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 046635/0634 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
SUPPLEMENT NO. 1 TO PATENT SECURITY AGREEMENT Recorded Aug 26, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 039841/0207 →
SUPPLEMENT NO. 1 TO PATENT SECURITY AGREEMENT Recorded Aug 25, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 039824/0681 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 9, 2016
From: XU, LIFANG; SCHELLHAMMER, SCOTT D; MOU, SHAN MING; BERNHARDT, MICHAEL J.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 038517/0279 →
Continuity (2)
Division 13190872 · Jul 26, 2011
Related Publication 20160254412A1 · Sep 1, 2016
Cited By (1)
US 12,283,644