Systems and methods for memory system management based on thermal information of a memory system
Methods of mapping memory regions to processes based on thermal data of memory regions are described. In some embodiments, a memory controller may receive a memory allocation request. The memory allocation request may include a logical memory address. The method may further include mapping the logical memory address to an address in a memory region of the memory system based on thermal data for memory regions of the memory system. Additional methods and systems are also described.
1. An apparatus comprising:
a logic die not including memory cells; and
a plurality of memory dies separate from the logic die with each memory die in a vertical stack over the logic die, each memory die of the plurality of memory dies having memory cells, each memory die of the plurality of memory dies comprising a thermal sensor;
wherein the logic die comprises control logic to access a memory die of the plurality of memory dies to read a state of a respective thermal sensor of the respective memory die of the plurality of memory dies and to set thermal limits on the memory devices, the control logic operable to refresh memory cells of the plurality of memory dies based on temperatures sensed by the thermal sensors; and
wherein the logic die comprises a serial interface to transmit thermal maps and the state of the thermal sensor of the memory die of the plurality of memory dies to a device external to the logic die.
2. The apparatus of claim 1 , further comprising a memory controller coupled to the logic die, the memory controller being configured to receive the state of the thermal sensor of the memory die of the plurality of memory dies from the logic die via the serial interface.
3. The apparatus of claim 2 , wherein the apparatus further comprises a processor configured to issue a memory allocation request including a logical address; and
wherein the memory controller is configured to map a physical address of the plurality of memory dies based on the memory allocation request from the processor.
4. The apparatus of claim 3 , wherein the memory controller is configured to map the physical address of the plurality of memory dies responsive to the state of the thermal sensor of the respective memory die of the plurality of memory dies received from the logic die via the serial interface.
5. The apparatus of claim 1 , wherein each of the plurality of memory dies comprises a plurality of memory channels, wherein each of the plurality of memory dies includes as the thermal sensor a plurality of channel thermal sensors allocated correspondingly to the plurality of memory channels, and wherein channel thermal sensors of each of the plurality of memory dies are accessed by the logic die.
6. The apparatus of claim 1 , wherein the logic chip includes a thermal sensor and the serial interface is configured to transmit a state of the thermal sensor of the logic die to the external to the logic die.
7. The apparatus of claim 1 , wherein each memory die of the plurality of memory dies includes a plurality of thermal sensors such that regions of memory cells on each memory die are refreshed corresponding to thermal sensors correlated to the respective regions with refresh rates of the regions of memory cells varying dependent on sensed temperatures by the plurality of thermal sensors of the respective memory die.
8. A system comprising:
a memory controller;
a logic die not including memory cells and comprising a serial interface coupled with the memory controller; and
a plurality of memory dies separate from the logic die with each memory die in a vertical stack over the logic die, each memory die of the plurality of memory dies having memory cells, each memory die of the plurality of memory dies comprising a thermal sensor, the logic die having control logic operable to refresh memory cells of the plurality of memory dies based on temperatures sensed by the thermal sensors and to set thermal limits on the memory devices;
wherein the memory controller is configured to receive thermal maps and a state of a respective thermal sensor of a respective memory die of the plurality of memory dies from the logic die via the serial interface.
9. The system of claim 8 , wherein each of the plurality of memory dies comprises a plurality of memory channels wherein each of the plurality of memory dies includes as the thermal sensor a plurality of channel thermal sensors allocated correspondingly to the plurality of memory channels, and wherein the memory controller is configured to receive a state of a respective channel thermal sensor of each of the plurality of memory dies.
10. The system of claim 8 , wherein the logic chip includes a thermal sensor and the serial interface is configured to transmit a state of the thermal sensor of the logic die to the external to the logic die.
11. The system of claim 8 , wherein the apparatus further comprises a processor configured to issue a memory allocation request including a logical address, and wherein the memory controller configured to map a physical address of the plurality of memory dies based on the memory allocation request from the processor.
12. The system of claim 8 , wherein the memory controller is configured to map the physical address of the plurality of memory dies responsive to the state of the thermal sensor of a memory die of the plurality of memory dies being received from the logic die via the serial interface.