IP Library Granted Patent US 10,221,131
Granted Patent B2
US 10,221,131 · App. 15/167,223 · Granted Mar 5, 2019

Acid generator compounds and photoresists comprising same

Inventors: Irvinder Kaur (Marlborough, MA); Cong Liu (Marlborough, MA); Cheng-Bai Xu (Marlborough, MA)
Assignee: Rohm and Haas Electronic Materials LLC
C07C309/17C07C309/01C07C381/12C07D307/00C07D493/18G03F7/0045G03F7/0046G03F7/0397H01L21/0274C07C2601/14C07C2603/74
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Quick Facts
Patent No.
US 10,221,131
App. No.
15/167,223
Granted
Mar 5, 2019
Kind
B2
Abstract

Acid generator compounds are provided that are particularly useful as a photoresist composition component. In one preferred aspect, acid generators are provided that comprise one or more hydrophilic moieties.

Claims (28)

1. An acid generator comprising a structure of the following Formula (I):

wherein:

M + is a counter ion;

Z 1 and Z 2 each independently represent a hydrogen or non-hydrogen substituent, where at least one of Z 1 or Z 2 is fluorine or fluoroalkyl;

L 1 is a linker group;

W 1 is an optionally substituted carbon alicyclic group or optionally substituted heteroalicyclic group;

R 1 is —(C═O)O(—(CXY)CX′Y′O) n R where n is a positive integer, R is optionally substituted non-cyclic alkyl or, hydrogen and each X, Y, X′ and Y′ is a hydrogen or non-hydrogen substituent;

comprises one or more ether linkages; and

m is a positive integer.

2. The acid generator of claim 1 wherein R 1 is —(C═O)O(—CH 2 CH 2 O) n R where n is a positive integer and R is non-cyclic alkyl or hydrogen.

3. The acid generator of claim 1 wherein W 1 is an optionally substituted heteroalicyclic group.

4. The acid generator of claim 1 wherein W 1 is an optionally substituted lactone.

5. The acid generator of claim 1 wherein W 1 is an optionally substituted carbon alicyclic group.

6. The acid generator of claim 1 wherein n is 1 or 2 and/or m is 1 or 2.

7. The acid generator of claim 1 wherein both Z 1 and Z 2 are fluorine or fluoroalkyl.

8. A photoresist composition comprising a resin and an acid generator of claim 1 .

9. A method for providing a photoresist relief image comprising:

a) applying a coating layer of a photoresist of claim 8 on a substrate; and

b) exposing the photoresist composition layer to activating radiation and developing the exposed photoresist composition coating layer.

10. A photoresist composition comprising a resin and an acid generator of claim 2 .

11. A photoresist composition comprising a resin and an acid generator of claim 3 .

12. A photoresist composition comprising a resin and an acid generator of claim 4 .

13. A photoresist composition comprising a resin and an acid generator of claim 5 .

14. A photoresist composition comprising a resin and an acid generator of claim 6 .

15. A photoresist composition comprising a resin and an acid generator of claim 7 .

16. An acid generator of claim 1 wherein R is methyl or hydrogen.

17. An acid generator selected from the group consisting of:

18. A photoresist composition comprising a resin and an acid generator of claim 17 .

Assignments (4)
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 073515/0243 →
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 073517/0298 →
CHANGE OF NAME Recorded Oct 29, 2024
From: ROHM & HAAS ELECTRONIC MATERIALS LLC
To: DUPONT ELECTRONIC MATERIALS INTERNATIONAL, LLC
Reel/Frame 069272/0383 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 25, 2016
From: KAUR, IRVINDER; LIU, CONG; XU, CHENG-BAI
To: ROHM AND HAAS ELECTRONIC MATERIALS LLC
Reel/Frame 039539/0014 →
Continuity (2)
Provisional Application 62169402 · Jun 1, 2015
Related Publication 20160347709A1 · Dec 1, 2016