IP Library Granted Patent US 9,748,197
Granted Patent B2
US 9,748,197 · App. 15/192,760 · Granted Aug 29, 2017

Methods for packaging integrated circuits

Inventors: Loon Kwang Tan (Kepala Batas, MY); Yuanlin Xie (Fremont, CA); Ping Chet Tan (Gelugor, MY)
Assignee: Altera Corporation
H01L24/73H01L21/4857H01L21/568H01L21/6836H01L23/36H01L24/16H01L24/32H01L24/48H01L23/3128H01L23/49827H01L24/13H01L24/29H01L24/45H01L24/81H01L24/83H01L24/85H01L24/92H01L2221/68372H01L2224/04042H01L2224/131H01L2224/1624H01L2224/16225H01L2224/291H01L2224/2919H01L2224/3224H01L2224/32225H01L2224/32245H01L2224/45124H01L2224/45144H01L2224/45147H01L2224/48091H01L2224/48227H01L2224/48229H01L2224/48247H01L2224/73204H01L2224/73215H01L2224/73253H01L2224/73265H01L2224/81005H01L2224/81192H01L2224/83005H01L2224/83851H01L2224/85005H01L2224/92125H01L2224/92225H01L2224/92247H01L2924/12042H01L2924/14H01L2924/15192H01L2924/15311H01L2924/181H01L2924/1815H01L2924/18161H01L2924/3511H01L2924/364
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Quick Facts
Patent No.
US 9,748,197
App. No.
15/192,760
Granted
Aug 29, 2017
Kind
B2
Abstract

Techniques for packaging an integrated circuit include attaching a die to a conductive layer before forming dielectric layers on an opposing surface of the conductive layer. The conductive layer may first be formed on a carrier substrate before the die is disposed on the conductive layer. The die may be electrically coupled to the conductive layer via wires or solder bumps. The carrier substrate is removed before the dielectric layers are formed. The dielectric layers may collectively form a coreless package substrate for the integrated circuit package.

Claims (18)

1. An integrated circuit package, comprising:

a coreless package substrate having a topmost surface and a bottommost surface, wherein the coreless package substrate lacks a core layer and includes only build-up layers and a solder mask layer;

an integrated circuit die that is mounted on the topmost surface of the coreless package substrate;

conductive bumps that protrude from the topmost surface of the coreless package substrate and that are formed directly under the integrated circuit die;

molding compound that encapsulates the integrated circuit die within the integrated circuit package; and

solder balls that are formed at the bottommost surface of the coreless package substrate.

2. The integrated circuit package of claim 1 , further comprising:

solder bumps interposed between the integrated circuit die and the conductive bumps.

3. The integrated circuit package of claim 1 , further comprising:

a protective layer formed over the integrated circuit die.

4. The integrated circuit package of claim 3 , further comprising:

an adhesive layer interposed between the protective layer and the integrated circuit die.

5. The integrated circuit package of claim 3 , wherein the adhesive layer is as wide as the protective layer.

6. The integrated circuit package of claim 1 , wherein the integrated circuit die is attached to the coreless package substrate in a flip-chip configuration.

7. The integrated circuit package of claim 1 , wherein the build-up layers include interconnect paths formed in dielectric layers.

8. The integrated circuit package of claim 7 , wherein the interconnect paths do not protrude above the topmost surface of the coreless package substrate.

9. The integrated circuit package of claim 7 , wherein the interconnect paths comprise a patterned conductive layer.

10. The integrated circuit package of claim 9 , wherein the conductive layer is patterned after the integrated circuit die has been mounted on the topmost surface.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 1, 2022
From: INTEL CORPORATION
To: TAHOE RESEARCH, LTD.
Reel/Frame 061827/0686 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 20, 2022
From: ALTERA CORPORATION
To: INTEL CORPORATION
Reel/Frame 060778/0032 →
Continuity (2)
Continuation 14175651 · Feb 7, 2014
Related Publication 20160307868A1 · Oct 20, 2016