Scan chain operation in sensing circuitry

1. An apparatus, comprising:

an array of memory cells coupled to sensing circuitry including a sense amplifier and a compute component, wherein the sensing circuitry is controlled to:

receive a scan vector from a first portion of the array of memory cells;

perform a scan chain operation on the scan vector to yield a resulting scan vector;

perform a compression operation using the sensing circuitry to reduce a size of the resulting scan vector; and

write the resulting scan vector to a second portion of the array of memory cells.

2. The apparatus of claim 1 , wherein at least a portion of the sensing circuitry is operable as a shift register.

3. The apparatus of claim 1 , comprising a scan_in pin coupled to a first end of the sensing circuitry and a scan_out pin coupled to a second end of the sensing circuitry.

4. The apparatus of claim 1 , wherein the sensing circuitry includes transistors formed on pitch with memory cells of the array of memory cells.

5. The apparatus of claim 1 , comprising a controller coupled to the sensing circuitry, the controller to provide a clock signal to toggle logic in response to the scan operation completing.

6. The apparatus of claim 1 , the controller to control comparing the compressed resulting scan vector to an expected value vector.

7. The apparatus of claim 1 , the controller to control performing an exclusive-or (XOR) operation on the resulting scan vector and the expected value vector.

8. The apparatus of claim 7 , the controller to control combine a vector resulting from the XOR operation with a global resultant vector.

9. An apparatus, comprising:

sensing circuitry including a plurality of sense amplifiers and compute components configured to:

store a scan vector received from a first portion of a memory array;

perform a scan chain operation on the scan vector to yield a resulting scan vector; and

perform a compression operation on the resulting scan vector to yield a pass/fail flag;

transfer the resulting scan vector to a second portion of the memory array; and

a clock coupled to the sensing circuitry, the clock to control timing of the scan chain operation associated with the scan vector.

10. The apparatus of claim 9 , the sensing circuitry to initiate the scan chain operation a rising edge of a clock signal received from the clock.

11. The apparatus of claim 9 , the sensing circuitry to initiate the scan chain operation at a falling edge of a clock signal received from the clock.

12. The apparatus of claim 9 , wherein the clock provides a core clock signal to toggle logic associated with of the sensing circuitry in response to completion of the scan chain operation.

13. The apparatus of claim 9 , the clock to provide a signal to control timing of clocking a second scan vector into a plurality of flip flops in response to a first scan vector being clocked out of the plurality of flip flops.

14. The apparatus of claim 13 , the clock to provide a signal to control timing of clocking the second scan vector in to the sensing circuitry concurrently with the first scan vector being clocked out of the sensing circuitry.

15. A method, comprising:

receiving a scan chain vector from a first portion of a memory array;

storing the scan vector in sensing circuitry having a sense amplifier and a compute component;

performing a scan chain operation on the scan vector using the sensing circuitry;

performing a compression operation on the resulting scan vector using the sensing circuitry; and

transferring the resulting scan vector to a second portion of the memory array.

16. The method of claim 15 , comprising:

generating a clock signal to toggle logic associated with the scan chain operation;

writing the scan vector out of the sensing circuitry, wherein the scan vector is a first scan vector;

writing a second scan vector into the sensing circuitry; and

performing the scan chain operation on the second scan vector using the sensing circuitry.

17. The method of claim 15 , comprising:

performing the scan chain operation on a first portion of the scan vector;

receiving a second portion of the scan vector; and

performing the scan operation on the second portion of the scan vector.

18. The method of claim 15 , comprising comparing a resultant scan vector to an expected output scan vector.

19. The method of claim 18 , wherein comparing the resultant scan vector to the expected output scan vector includes performing an exclusive-or (XOR) operation on the resultant scan vector and the expected output scan vector.

20. The method of claim 18 , comprising generating an indication that a scan test is successful in response to the resultant scan vector and the expected output scan vector having greater than a threshold number of data values in common.

21. A method, comprising:

receiving a first page of data from a first portion of an array of memory cells to sensing circuitry having a sense amplifier and a compute component;

performing a scan chain operation on the first page of data using the sensing circuitry;

writing a resultant first page of data to a second portion of the array of memory cells;

receiving a second page of data to the sensing circuitry; and

performing the scan chain operation on the second page of data.

22. The method of claim 21 , wherein writing the resultant first page of data to the storage location and receiving the second page of data to the sensing circuitry occur concurrently.

23. The method of claim 21 , comprising storing the resultant first page of written data to different sensing circuitry having a sense amplifier and a compute component.

24. The method of claim 21 , comprising storing the resultant first page of written data to the memory array, wherein the memory array is coupled to sensing circuitry.

25. The method of claim 21 , comprising storing the resultant first page of written data to the memory array, wherein the memory array is on pitch with the sensing circuitry.