IP Library Granted Patent US 10,581,399
Granted Patent B2
US 10,581,399 · App. 15/220,940 · Granted Mar 3, 2020

Impedance matching component

Inventors: Chong Mei (Jamesville, NY); Omar Eldaiki (East Syracuse, NY); Hans Peter Ostergaard (Viborg, DK)
Assignee: Anaren, Inc.
H03H7/38H05K1/11
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,581,399
App. No.
15/220,940
Granted
Mar 3, 2020
Kind
B2
Abstract

The present invention is directed to an impedance matching network for use at a predetermined frequency. The network includes: a low impedance port having a first impedance substantially equal to an impedance of an RF amplifier port; a first distributive transmission line network coupled to the low impedance port, the first distributive transmission line network including a plurality of first transmission lines, each first transmission line being characterized by a first characteristic impedance and a first electric line length at the predetermined frequency to form a first quasi-lumped reactive element so that the plurality of first transmission lines form a first quasi-lumped element impedance matching stage; at least one second distributive transmission line network coupled to the first distributive transmission line network and a high impedance port, the second distributive transmission line network including a plurality of second transmission lines, each second transmission line being characterized by a second characteristic impedance and a second electric line length at the predetermined frequency to form a second quasi-lumped reactive element so that the plurality of second transmission lines form at least one second quasi-lumped element impedance matching stage; and a high impedance port coupled to the at least one second quasi-lumped element impedance matching stage, the high impedance port having a second impedance substantially equal to a system impedance.

Claims (32)

1. An impedance matching device for use at a predetermined frequency, the device comprising:

a low impedance port having a first impedance substantially equal to an impedance of an RF amplifier port;

a first distributive transmission line network coupled to the low impedance port, the first distributive transmission line network including a plurality of first transmission lines, each first transmission line being characterized by a first characteristic impedance and a first electric line length less than 45° at the predetermined frequency to form a first quasi-lumped reactive element so that the plurality of first transmission lines form a first quasi-lumped element impedance matching stage;

at least one second distributive transmission line network coupled to the first distributive transmission line network and a high impedance port, the second distributive transmission line network including a plurality of second transmission lines, each second transmission line being characterized by a second characteristic impedance and a second electric line length less than 45° at the predetermined frequency to form a second quasi-lumped reactive element so that the plurality of second transmission lines form at least one second quasi-lumped element impedance matching stage, wherein the high impedance port is coupled to the at least one second quasi-lumped element impedance matching stage, the high impedance port having a second impedance substantially equal to a system impedance;

wherein at least one of the plurality of first transmission lines comprises a first coupled line and at least one of the plurality of second transmission lines comprises a second coupled line, wherein a coupler structure comprises the first coupled line and the second coupled line, wherein the low impedance port is coupled to a first end of the first coupled line of the first distributive transmission line while a second opposite end of the first coupled line is left open, and a first end of the second coupled line of the second distributive transmission line network is left open while the high impedance port is coupled to a second opposite end of the second coupled line.

2. The device of claim 1 , wherein the impedance matching device includes a first major surface and a second major surface.

3. The device of claim 2 , wherein the plurality of first transmission lines or the plurality of second transmission lines are formed by an outer metallization layer disposed on the second major surface, the outer metallization layer being configured to be coupled to a carrier metallization layer formed on a carrier printed circuit board, the outer metallization layer and the carrier metallization layer having substantially similar form factors.

4. The device of claim 2 , wherein the first major surface and the second major surface include metalized ground layers.

5. The device of claim 1 , wherein the first quasi-lumped element impedance matching stage is selected from a group of networks including a L-type network, a T-type network and a Pi-type network.

6. The device of claim 1 , wherein the second quasi-lumped element impedance matching stage is selected from a group of networks including a L-type network, a T-type network and a Pi-type network.

7. The device of claim 1 , wherein the first quasi-lumped reactive element is a transmission line that substantially approximates a capacitor or an inductor.

8. The device of claim 1 , wherein the second quasi-lumped reactive element is a transmission line that substantially approximates a capacitor or an inductor.

9. The device of claim 1 , wherein the plurality of second transmission lines includes a fourth transmission line shunted from an output of the coupler structure to ground.

10. The system of claim 1 , wherein at least one of the plurality of first transmission lines is configured to approximate a capacitor and at least one of the plurality of first transmission lines is configured to approximate an inductor.

11. The device of claim 1 , wherein the predetermined frequency is a center frequency of a targeted frequency band.

12. An RF system, the system comprising:

an RF circuit device including a first major surface and a second major surface, the RF circuit device including,

a low impedance port having a first impedance substantially equal to an impedance of an RF amplifier port,

a first distributive transmission line network being coupled to the low impedance port, the first distributive transmission line network including a plurality of first transmission lines, each first transmission line being characterized by a first characteristic impedance and a first electric line length less than 45° at the predetermined frequency to form a first quasi-lumped reactive element so that

the plurality of first transmission lines form a first quasi-lumped element impedance matching stage,

at least one second distributive transmission line network coupled to the first distributive transmission line network and a high impedance port, the second distributive transmission line network including a plurality of second transmission lines, each second transmission line being characterized by a second characteristic impedance and a second electric line length less than 45° at the predetermined frequency to form a second quasi-lumped reactive element so that the plurality of second transmission lines form at least one second quasi-lumped element impedance matching stage, wherein the high impedance port is coupled to the at least one second quasi-lumped element impedance matching stage, the high impedance port having a second impedance substantially equal to a system impedance;

wherein at least one of the plurality of first transmission lines comprises a first coupled line and at least one of the plurality of second transmission lines comprises a second coupled line, wherein a coupler structure comprises the first coupled line and the second coupled line, wherein the low impedance port is coupled to a first end of the first coupled line of the first distributive transmission line while a second opposite end of the first coupled line is left open, and a first end of the second coupled line of the second distributive transmission line network is left open while the high impedance port is coupled to a second opposite end of the second coupled line; and

a printed carrier circuit board (PCB) including at least one RF circuit structure formed thereon, the RF circuit device being coupled to the at least one RF circuit structure.

13. The system of claim 12 , wherein the plurality of first transmission lines or the plurality of second transmission lines are formed by an outer metallization layer disposed on the second major surface, the plurality of first transmission lines or the plurality of second transmission lines being configured in accordance with a predetermined shape, the predetermined shape having predetermined dimensions, the predetermined shape and the predetermined dimensions substantially corresponding to a coupling region formed on the printed circuit board.

14. The system of claim 13 , wherein the outer metallization layer is configured to be coupled to the coupling region formed on the printed circuit board.

15. The system of claim 13 , wherein the first major surface and the second major surface include metalized ground layers.

16. The system of claim 12 , wherein the first quasi-lumped element impedance matching stage is selected from a group of networks including a L-type network, a T-type network and a Pi-type network.

17. The system of claim 12 , wherein the second quasi-lumped element impedance matching stage is selected from a group of networks including a L-type network, a T-type network and a Pi-type network.

18. The system of claim 12 , wherein the first quasi-lumped reactive element is a transmission line that substantially approximates a capacitor or an inductor.

19. The system of claim 12 , wherein the second quasi-lumped reactive element is a transmission line that substantially approximates a capacitor or an inductor.

20. The system of claim 12 , wherein the plurality of second transmission lines includes a fourth transmission line shunted from an output of the coupler structure to ground.

21. The system of claim 12 , wherein at least one of the plurality of first transmission lines is configured to approximate a capacitor and at least one of the plurality of first transmission lines is configured to approximate an inductor.

Assignments (7)
RELEASE OF SECURITY INTEREST IN PATENTS PREVIOUSLY RECORDED AT REEL/FRAME (063804/0702) Recorded Jun 2, 2026
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: TELEPHONICS CORPORATION; TTM TECHNOLOGIES, INC.; TTM TECHNOLOGIES NORTH AMERICA, LLC
Reel/Frame 075679/0852 →
PATENT SECURITY AGREEMENT (ABL) Recorded May 30, 2023
From: TELEPHONICS CORPORATION; TTM TECHNOLOGIES, INC.; TTM TECHNOLOGIES NORTH AMERICA, LLC
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 063804/0702 →
PATENT SECURITY AGREEMENT (TERM LOAN) Recorded May 30, 2023
From: TELEPHONICS CORPORATION; TTM TECHNOLOGIES, INC.; TTM TECHNOLOGIES NORTH AMERICA, LLC
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 063804/0745 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 23, 2021
From: ANAREN, INC.
To: TTM TECHNOLOGIES INC.
Reel/Frame 056635/0640 →
SUPPLEMENT TO PATENT SECURITY AGREEMENT - ABL Recorded Apr 23, 2018
From: ANAREN, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 045998/0401 →
SUPPLEMENT TO PATENT SECURITY AGREEMENT - TL Recorded Apr 23, 2018
From: ANAREN, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046000/0815 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 28, 2016
From: MEI, CHONG; ELDAIKI, OMAR; OSTERGAARD, HANS PETER
To: ANAREN, INC.
Reel/Frame 039277/0609 →
Continuity (2)
Provisional Application 62327839 · Apr 26, 2016
Related Publication 20170310297A1 · Oct 26, 2017