IP Library Granted Patent US 10,373,991
Granted Patent B2
US 10,373,991 · App. 15/230,727 · Granted Aug 6, 2019

Imaging device, operating method thereof, and electronic device

Inventors: Takuro Ohmaru (Kasuya, JP); Naoto Kusumoto (Isehara, JP); Kentaro Hayashi (Atsugi, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H01L27/14605H01L27/14616H01L27/14643H04N5/23245H04N5/347H04N5/3696H04N5/37457
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Quick Facts
Patent No.
US 10,373,991
App. No.
15/230,727
Granted
Aug 6, 2019
Kind
B2
Abstract

An imaging device with low power consumption is provided. The pixel of the imaging device includes first and second photoelectric conversion elements, and first to fifth transistors. A cathode of the first photoelectric conversion element is electrically connected to the first transistor. An anode of a second photoelectric conversion element is electrically connected to the second transistor. Imaging data of a reference frame is obtained using the first photoelectric conversion element, and then imaging data of a difference detection frame is obtained using the second photoelectric conversion element. After the imaging data of the difference detection frame is obtained, a first potential that is a potential of a signal output from the pixel and a second potential that is a reference potential are compared. Whether or not there is a difference between the imaging data of the reference frame and the imaging data of the difference detection frame is determined using the first potential and the second potential.

Claims (46)

1. An imaging device comprising:

a first photoelectric conversion element;

a second photoelectric conversion element;

a first transistor;

a second transistor;

a third transistor;

a fourth transistor; and

a fifth transistor,

wherein each of the first transistor and the second transistor is n-channel transistor,

wherein a cathode of the first photoelectric conversion element is electrically connected to one of a source and a drain of the first transistor,

wherein an anode of the second photoelectric conversion element is electrically connected to one of a source and a drain of the second transistor,

wherein the other of the source and the drain of the first transistor is electrically connected to the other of the source and the drain of the second transistor,

wherein the other of the source and the drain of the first transistor is electrically connected to one of a source and a drain of the third transistor,

wherein the other of the source and the drain of the first transistor is electrically connected to a gate of the fourth transistor, and

wherein one of a source and a drain of the fourth transistor is electrically connected to one of a source and a drain of the fifth transistor.

2. The imaging device according to claim 1 ,

wherein the first to third transistors each comprise an oxide semiconductor in an active layer, and

wherein the oxide semiconductor contains In, Zn, and M, where M is Al, Ti, Ga, Sn, Y, Zr, La, Ce, Nd, or Hf.

3. The imaging device according to claim 1 , wherein the first photoelectric conversion element and the second photoelectric conversion element each contain a material containing selenium.

4. The imaging device according to claim 1 , further comprising a capacitor, wherein one terminal of the capacitor is electrically connected to the other of the source and the drain of the first transistor.

5. An electronic device comprising:

the imaging device according to claim 1 ; and

a display device.

6. An imaging device comprising:

a first photoelectric conversion element;

a second photoelectric conversion element;

a first transistor;

a second transistor;

a third transistor;

a fourth transistor; and

a fifth transistor,

wherein a cathode of the first photoelectric conversion element is electrically connected to one of a source and a drain of the first transistor,

wherein an anode of the second photoelectric conversion element is electrically connected to one of a source and a drain of the second transistor,

wherein the other of the source and the drain of the first transistor is electrically connected to the other of the source and the drain of the second transistor,

wherein the other of the source and the drain of the first transistor is electrically connected to one of a source and a drain of the third transistor,

wherein the other of the source and the drain of the first transistor is electrically connected to a gate of the fourth transistor,

wherein one of a source and a drain of the fourth transistor is electrically connected to one of a source and a drain of the fifth transistor,

wherein each of the first to third transistors comprises an oxide semiconductor in an active layer, and

wherein a first signal which is input to a gate of the first transistor is different from a second signal which is input to a gate of the second transistor.

7. The imaging device according to claim 6 , wherein the oxide semiconductor in the first to third transistors comprises In and Zn.

8. The imaging device according to claim 6 , wherein the first photoelectric conversion element and the second photoelectric conversion element each contain a material containing selenium.

9. The imaging device according to claim 6 , further comprising a capacitor, wherein one terminal of the capacitor is electrically connected to the other of the source and the drain of the first transistor.

10. An electronic device comprising:

the imaging device according to claim 6 ; and

a display device.

11. The imaging device according to claim 1 , wherein a first signal which is input to a gate of the first transistor is different from a second signal which is input to a gate of the second transistor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 7, 2016
From: OHMARU, TAKURO; KUSUMOTO, NAOTO; HAYASHI, KENTARO
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 039656/0378 →
Priority Claims (1)
JP 2015-161851 · Aug 19, 2015 · national
Continuity (1)
Related Publication 20170054930A1 · Feb 23, 2017
Cited By (1)
US 12,294,805