IP Library Granted Patent US 9,900,528
Granted Patent B2
US 9,900,528 · App. 15/231,287 · Granted Feb 20, 2018

Method, apparatus and system providing a storage gate pixel with high dynamic range

Inventor: Parker Altice (Meridian, ID)
Assignee: Micron Technology, Inc.
H04N5/3559H01L27/14643H01L27/14656H04N5/3592H04N5/35527H04N5/35581H04N5/374H04N5/378H04N5/37452
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,900,528
App. No.
15/231,287
Granted
Feb 20, 2018
Kind
B2
Abstract

A method, apparatus and system are described providing a high dynamic range pixel. An integration period has multiple sub-integration periods during which charges are accumulated in a photosensor and repeatedly transferred to a storage node, where the charges are accumulated for later transfer to another storage node for output.

Claims (45)

1. An imager circuit comprising:

at least one pixel circuit, the at least one pixel circuit comprising—

a photosensor having a charge storage capacity, the photosensor configured to accumulate charge,

a first transistor connected to the photosensor for transferring charge from the photosensor,

a storage node selectively coupled to the photosensor for receiving charge from the photosensor via the first transistor, the storage node having a charge storage capacity that is greater than the charge storage capacity of the photosensor, and

a second transistor connected to the storage node for transferring charge from the storage node to a floating diffusion node; and

a control circuit operably coupled to the first transistor, the control circuit configured to—

define a plurality of successive integration periods during an image capture in which charges produced by the photosensor in each of the integration periods are successively stored and accumulated in the storage node, and

operate the second transistor to transfer charges accumulated in the storage node for the integration periods to the floating diffusion region.

2. The circuit of claim 1 wherein the storage node has a storage capacity of at least about twice the storage capacity of the photosensor.

3. The circuit of claim 1 , further comprising a readout circuit connected to the floating diffusion node to output a signal based on the charge stored at the floating diffusion node.

4. The circuit of claim 3 wherein the readout circuit further comprises:

a reset transistor connected to the floating diffusion node for resetting the charge on the floating diffusion node;

a source-follower transistor having a gate for receiving charge from the floating diffusion-node; and

a row-select transistor connected to the source-follower transistor for outputting a signal produced by the source-follower transistor.

5. The circuit of claim 4 , further comprising an anti-blooming transistor electrically connected to the photosensor for draining charge from the photosensor.

6. The circuit of claim 4 wherein the control circuit is operable to apply a constant voltage to a gate of the anti-blooming transistor during the plurality of successive integration periods.

7. An imaging device comprising:

a pixel array comprising a plurality of pixels, wherein at least some of said pixels comprise—

a photosensor having a charge storage capacity, the photosensor configured to accumulate charge,

a first transistor connected to the photosensor for transferring charge from the photosensor,

a storage node coupled to the photosensor for receiving charge from the photosensor via the first transistor, and

a second transistor connected to the storage node for transferring charge from the storage node to a floating diffusion node; and

a control circuit operably coupled to the first transistor, the control circuit configured to—

define a plurality of successive integration periods during an image capture in which charges produced by the photosensor in each of the integration periods are successively stored and accumulated in the storage node, and

transfer charges accumulated in the storage node for the integration periods to the floating diffusion region.

8. The imaging device of claim 7 wherein the storage node charge storage capacity is at least about twice the storage capacity of the photosensor.

9. The imaging device of claim 7 , further comprising a readout circuit connected to the floating diffusion node to output a signal based on the charge accumulated at the floating diffusion region.

10. A processing system comprising:

an array of pixels, each of the pixels including a photosensor for generating charges;

a first transistor connected to the photosensor for transferring charge from the photosensor;

a storage node selectively coupled to the photosensor for receiving charge from the photosensor via the first transistor, the storage node having a charge storage capacity that is greater than a charge storage capacity of the photosensor;

a second transistor connected to the storage node for transferring charge from the storage node to a floating diffusion node; and

a control circuit operably coupled to the first transistor, the control circuit configured to—

define a plurality of successive integration periods during an image capture in which charges produced by the photosensor in each of the integration periods are successively stored and accumulated in the storage node, and

operate the second transistor to transfer charges accumulated in the storage node for the integration periods to the floating diffusion region.

11. The system of claim 10 wherein the storage node charge storage capacity is at least about twice the storage capacity of the photosensor.

12. The system of claim 11 wherein the readout circuit further comprises:

a reset transistor connected to the floating diffusion node for resetting the charge on the floating diffusion node;

a source-follower transistor having a gate for receiving charge from the floating diffusion node; and

a row-select transistor connected to the source-follower transistor for outputting a signal produced by the source-follower transistor.

13. The system of claim 12 further comprising an anti-blooming transistor electrically connected to the photosensor for draining charge from the photosensor.

14. The circuit of claim 12 wherein the control circuit is operable to apply a constant voltage to a gate of the anti-blooming transistor during the plurality of successive integration periods.

15. The system of claim 12 wherein the system is a camera processor system.

16. The system of claim 10 further comprising a readout circuit connected to the floating diffusion node to output a signal based on the charge accumulated at the floating diffusion gate.

Assignments (4)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050702/0451 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
SUPPLEMENT NO. 4 TO PATENT SECURITY AGREEMENT Recorded May 4, 2017
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042405/0909 →
Continuity (4)
Continuation 14089225 · Nov 25, 2013
Continuation 13216664 · Aug 24, 2011
Continuation 11511310 · Aug 29, 2006
Related Publication 20170134676A1 · May 11, 2017