IP Library Granted Patent US 10,388,555
Granted Patent B2
US 10,388,555 · App. 15/247,947 · Granted Aug 20, 2019

Bonding apparatus and bonding method

Inventors: Osamu Kakutani (Tokyo, JP); Taito Kobayashi (Tokyo, JP); Yasushi Sato (Tokyo, JP)
Assignee: SHINKAWA LTD.
H01L21/67703H01L21/67721H01L21/68785H01L24/75H01L24/95H01L24/16H01L24/32H01L24/81H01L24/83H01L24/97H01L2224/16225H01L2224/32225H01L2224/7598H01L2224/75744H01L2224/75745H01L2224/75753H01L2224/75802H01L2224/75804H01L2224/75824H01L2224/75901H01L2224/95H01L2224/97
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Quick Facts
Patent No.
US 10,388,555
App. No.
15/247,947
Granted
Aug 20, 2019
Kind
B2
Abstract

A bonding apparatus, which includes: an intermediate stage; a transfer unit configured to transfer a semiconductor chip and to place the semiconductor chip on the intermediate stage; and a first bonding unit and a second bonding unit each configured to pick up the semiconductor chip from the intermediate stage, and to bond the semiconductor chip to a circuit substrate. The intermediate stage moves between a first position and a second position. The first position is a position at which the first bonding unit is allowed to pick up the semiconductor chip, and the second position is a position at which the second bonding unit is allowed to pick up the semiconductor chip. With this, it is possible to provide a bonding apparatus capable of reducing processing time per circuit substrate and suppressing an increase of a space, as well as such a bonding method.

Claims (14)

1. A bonding apparatus comprising:

an intermediate stage;

a transfer unit configured to transfer a semiconductor chip from a wafer stage and to place the semiconductor chip on the intermediate stage;

a first bonding unit and a second bonding unit each configured to pick up the semiconductor chip from the intermediate stage, and to bond the semiconductor chip to a circuit substrate, wherein the first bonding unit and the second bonding unit are arranged side by side along a first direction parallel to X-axis, and the wafer stage, the transfer unit, and the first bonding unit are arranged along a second direction parallel to Y-axis and perpendicular to the first direction; and

a linear motor disposed under the intermediate stage, wherein

the linear motor extends from a first position to a second position to drive the intermediate stage to move between the first position and the second position only along the first direction, the first position being a position at which the first bonding unit is allowed to pick up the semiconductor chip, the second position being a position at which the second bonding unit is allowed to pick up the semiconductor chip.

2. The bonding apparatus according to claim 1 , wherein

one of the first position and the second position is a position at which the transfer unit is allowed to place the semiconductor chip on the intermediate stage.

3. The bonding apparatus according to claim 1 , wherein

the intermediate stage is disposed between the transfer unit and the first and the second bonding unit.

4. The bonding apparatus according to claim 1 , further comprising:

a camera for chip configured to take an image of the semiconductor chip.

5. The bonding apparatus according to claim 2 , wherein

the intermediate stage is disposed between the transfer unit and the first and the second bonding unit.

Assignments (2)
MERGER Recorded Dec 4, 2025
From: SHINKAWA LTD.
To: YAMAHA ROBOTICS CO., LTD.
Reel/Frame 073833/0572 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 24, 2016
From: KAKUTANI, OSAMU; KOBAYASHI, TAITO; SATO, YASUSHI
To: SHINKAWA LTD.
Reel/Frame 040106/0860 →
Priority Claims (1)
JP 2014-037161 · Feb 27, 2014 · national
Continuity (2)
Continuation PCTJP2014075922 · Sep 29, 2014
Related Publication 20160365267A1 · Dec 15, 2016