IP Library Granted Patent US 9,911,769
Granted Patent B2
US 9,911,769 · App. 15/254,745 · Granted Mar 6, 2018

Elevated pocket pixels, imaging devices and systems including the same and method of forming the same

Inventor: Salman Akram (Boise, ID)
Assignee: Micron Technology, Inc.
H01L27/14607H01L27/146H01L27/14601H01L27/14603H01L27/14605H01L27/14621H01L27/14627H01L27/14632H01L27/14643H01L27/14645H01L27/14647H01L27/14685H01L27/14687H01L27/14689H01L27/14692H01L31/028H01L31/0288H01L31/02162H01L31/022408H01L31/0352H01L31/03762H01L31/035281H01L31/1804
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,911,769
App. No.
15/254,745
Granted
Mar 6, 2018
Kind
B2
Abstract

An elevated photosensor for image sensors and methods of forming the photosensor. The photosensor may have light sensors having indentation features including, but not limited to, v-shaped, u-shaped, or other shaped features. Light sensors having such an indentation feature can redirect incident light that is not absorbed by one portion of the photosensor to another portion of the photosensor for additional absorption. In addition, the elevated photosensors reduce the size of the pixel cells while reducing leakage, image lag, and barrier problems.

Claims (61)

1. A method of operating an image sensor comprising at least one pixel having a photosensitive region including a hydrogenated amorphous silicon material adapted to redirect reflected light, the method comprising:

receiving light radiation at the photosensitive region of a pixel, the photosensitive region comprising an indentation feature;

absorbing a first portion of the light radiation at a first location of the indentation feature;

reflecting, with the hydrogenated amorphous silicon material, a second portion of the light radiation from the first location of the indentation feature to a second location of the indentation feature; and

absorbing at least some of the second portion of the light radiation at the second location of the indentation feature.

2. The method of claim 1 , further comprising:

converting the absorbed first and second portions of the light radiation to an electrical charge;

accumulating the electrical charge in a doped region of a substrate beneath the indentation feature; and

transferring the electrical charge to a floating diffusion region of the pixel.

3. The method of claim 2 , further comprising:

when the pixel is selected for readout, outputting the electrical charge from the floating diffusion region of the pixel.

4. A method of operating an image sensor comprising at least one pixel, the method comprising:

receiving light radiation at a photosensitive region of a pixel, the photosensitive region comprising an indentation feature;

absorbing a first portion of the light radiation at a first location of the indentation feature;

reflecting a second portion of the light radiation from the first location of the indentation feature to a second location of the indentation feature;

absorbing at least some of the second portion of the light radiation at the second location of the indentation feature; and

filtering the light radiation with a color filter formed in the indentation region.

5. The method of claim 1 , further comprising focusing the light radiation with a microlens formed over the indentation region.

6. The method of claim 1 further comprising:

reflecting, with the hydrogenated amorphous silicon material, a third portion of the light radiation from the second location of the indentation feature to a third location of the indentation feature; and

absorbing at least some of the third portion of the light radiation at the third location of the indentation feature.

7. The method of claim 1 wherein:

the indentation feature includes a plurality of sidewalls;

the first location of the indentation feature is on a first one of the plurality of sidewalls; and

the second location of the indentation feature is not on the first one of the plurality of sidewalls.

8. The method of claim 7 wherein the plurality of sidewalls includes one or more slanted sidewalls.

9. The method of claim 7 wherein the plurality of sidewalls includes one or more curved sidewalls.

10. The method of claim 7 wherein the indentation feature further includes a bottom surface disposed between the plurality of sidewalls, and wherein the second location is on the bottom surface.

11. The method of claim 1 wherein the first portion of the light radiation and the at least some of the second portion of the light radiation have a first wavelength, wherein the indentation feature is a first indentation feature having a first effective area configured to absorb the light radiation having the first wavelength, and wherein the photosensitive region has a second indentation feature having a second effective area configured to absorb the light radiation having a second wavelength, the method further comprising:

absorbing a third portion of the light radiation at a third location on the second indentation feature; and

reflecting, with the hydrogenated amorphous silicon material, a fourth portion of the light radiation from the third location on the second indentation feature to a fourth location on the second indentation feature.

12. A method of operating an image sensor comprising a pixel array, the method comprising:

receiving light radiation at a photosensitive region of a first pixel in a pixel array, the photosensitive region comprising a hydrogenated amorphous silicon material adapted to redirect reflected light and an indentation feature;

absorbing a first portion of the light radiation at a first location of the indentation feature;

reflecting, with the hydrogenated amorphous silicon material, a second portion of the light radiation from the first location of the indentation feature to a second location of the indentation feature; and

absorbing at least some of the second portion of the light radiation at the second location of the indentation feature.

13. The method of claim 12 , further comprising:

converting the absorbed first and second portions of the light radiation to an electrical charge;

accumulating the electrical charge in a doped region of a substrate beneath the indentation feature; and

transferring the electrical charge to a floating diffusion region of the pixel.

14. The method of claim 13 , further comprising:

when the first pixel is selected for readout, outputting the electrical charge from the floating diffusion region of the first pixel.

15. The method of claim 14 , further comprising:

scattering a scattered portion of the light radiation from the first location of the indentation feature to a second pixel in the pixel array, wherein the second pixel is not selected for readout at a same time as the first pixel.

16. A method of operating an image sensor comprising a pixel array, the method comprising:

receiving light radiation at a photosensitive region of a first pixel in a pixel array, the photosensitive region comprising an indentation feature;

absorbing a first portion of the light radiation at a first location of the indentation feature;

reflecting a second portion of the light radiation from the first location of the indentation feature to a second location of the indentation feature;

absorbing at least some of the second portion of the light radiation at the second location of the indentation feature; and

filtering the light radiation with a color filter formed in the indentation region.

17. The method of claim 12 , further comprising focusing the light radiation with a microlens formed over the indentation region.

18. The method of claim 12 further comprising:

reflecting, with the hydrogenated amorphous silicon material, a third portion the light radiation from the second location of the indentation feature to a third location of the indentation feature; and

absorbing at least some of the third portion of the light radiation at the third location of the indentation feature.

19. A method of operating an image sensor comprising a pixel array, the method comprising:

capturing light radiation incident on a photosensitive region of a pixel in the pixel array, the photosensitive region comprising a hydrogenated amorphous silicon material adapted to redirect reflected light and at least one indentation feature allowing one portion of the photosensitive region to redirect reflected light radiation to another portion of the photosensitive region;

converting the light radiation to an electrical signal;

accumulating the electrical signal in a doped region of a substrate of the pixel; and

transferring the electrical signal to a floating diffusion region of the pixel.

20. The method of claim 19 wherein the at least one indentation feature has at least one of a v-shaped configuration and a u-shaped configuration.

21. The method of claim 19 wherein the at least one indentation feature has a rounded bottom capable of redirecting light.

Assignments (4)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050680/0268 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
SUPPLEMENT NO. 2 TO PATENT SECURITY AGREEMENT Recorded Feb 10, 2017
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041671/0902 →
Continuity (4)
Continuation 14448756 · Jul 31, 2014
Continuation 13084649 · Apr 12, 2011
Division 11657013 · Jan 24, 2007
Related Publication 20160372505A1 · Dec 22, 2016