IP Library Granted Patent US 9,806,196
Granted Patent B2
US 9,806,196 · App. 15/255,862 · Granted Oct 31, 2017

Semiconductor device with fin and related methods

Inventors: Pierre Morin (Grenoble, FR); Nicolas Loubet (Guilderland, NY)
Assignee: STMICROELECTRONICS, INC.
H01L29/7848H01L27/0886H01L29/165H01L29/66795H01L29/785
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Quick Facts
Patent No.
US 9,806,196
App. No.
15/255,862
Granted
Oct 31, 2017
Kind
B2
Abstract

A semiconductor device may include a substrate, a fin above the substrate and having a channel region therein, and source and drain regions adjacent the channel region to generate shear and normal strain on the channel region. A semiconductor device may include a substrate, a fin above the substrate and having a channel region therein, source and drain regions adjacent the channel region, and a gate over the channel region. The fin may be canted with respect to the source and drain regions to generate shear and normal strain on the channel region.

Claims (51)

1. A device, comprising:

a substrate;

a plurality of fins on the substrate;

source and drain regions adjacent to the plurality of fins, the source and drain regions have an extension, the plurality of fins are canted with respect to the source and drain regions and the extension of the source and drain regions;

a channel region in each of the fins, the channel regions being between the source and drain region; and

a gate structure over the channel regions, the gate structure has an extension that is substantially parallel to the extension of the source and drain regions.

2. The device of claim 1 wherein the channel region includes shear and normal strain in response to the plurality of fins being canted with respect to the source and drain regions.

3. The device of claim 1 wherein the plurality of fins are canted at a 45 degrees angle with respect to the source and drain regions.

4. The device of claim 1 wherein the plurality of fins are canted in the range of 22.5 and 67.5 degrees with respect to the source and drain regions.

5. The device of claim 1 wherein the plurality of fins are canted in the range of 40 and 50 degrees with respect to the source and drain regions.

6. The device of claim 1 further comprising a dielectric layer between the substrate and the plurality of fins.

7. The device of claim 1 wherein the source and drain regions each includes silicon germanium.

8. A device, comprising:

a substrate;

a plurality of gate structures on the substrate, each gate structure having a length that extends along a first axis;

a plurality of fins extending from a surface of the substrate and aligned with each other along a second axis, each fin overlapped by a respective one of the plurality of gate structures, the first axis at an oblique angle to the second axis; and

source and drain regions adjacent to the plurality of fins and between ones of the plurality of gate structures, the source and drain regions are aligned along the first axis.

9. The device of claim 8 wherein the plurality of gate structures are staggered with respect to each other.

10. The device of claim 8 further comprising a plurality of channel regions in the plurality of fins, each channel region being between the source and drain regions.

11. The device of claim 10 wherein the plurality of gate structures are above the plurality of channel regions.

12. The device of claim 10 wherein the plurality of channel regions include a strain in response to the oblique angle between the first and second axis.

13. The device of claim 8 wherein the plurality of gate structures are controlled by a single signal.

14. A device, comprising:

a substrate;

a plurality of fins aligned along a first axis;

a gate structure aligned along a second axis that is oblique to the first axis, the gate structure positioned above the plurality of fins; and

source and drain regions adjacent to the gate structure, the source and drain regions are aligned along the second axis.

15. The device of claim 14 further comprising a channel region positioned below the gate structure, the channel region being between the source and drain regions.

16. The device of claim 15 wherein the channel region includes shear and normal strain in response to the oblique angle between the first and second axis.

17. A device, comprising:

a substrate;

a plurality of fins on the substrate;

source and drain regions adjacent to the plurality of fins, the plurality of fins are canted with respect to the source and drain regions;

a channel region in each of the fins, the channel regions being between the source and drain region, the channel region includes shear and normal strain in response to the plurality of fins being canted with respect to the source and drain regions; and

a gate structure over the channel regions.

18. The device of claim 17 wherein the plurality of fins are canted in the range of 40 and 50 degrees with respect to the source and drain regions.

19. The device of claim 17 wherein the gate structure has an extension that is substantially parallel to an extension of the source and drain regions where the extension of the source and drain regions is canted with respect to the plurality of fins.

20. A device, comprising:

a substrate;

a plurality of fins aligned along a first axis;

a gate structure aligned along a second axis that is oblique to the first axis, the gate structure positioned above the plurality of fins, the gate structure has an extension that is aligned along the second axis; and

source and drain regions adjacent to the gate structure, the source and drain regions have an extension that is substantially parallel to the extension of the gate structure.

21. The device of claim 20 wherein the source and drain regions are aligned along the second axis.

22. A device, comprising:

a substrate;

a plurality of fins on the substrate;

source and drain regions adjacent to the plurality of fins, the plurality of fins are canted with respect to the source and drain regions;

a channel region in each of the fins, the channel regions being between the source and drain region; and

a gate structure over the channel regions, the gate structure aligned substantially parallel to the source and drain regions.

23. The device of claim 22 wherein the channel region includes shear and normal strain in response to the plurality of fins being canted with respect to the source and drain regions.

24. The device of claim 22 wherein the plurality of fins are canted in the range of 40 and 50 degrees with respect to the source and drain regions.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 10, 2022
From: STMICROELECTRONICS, INC.
To: STMICROELECTRONICS INTERNATIONAL N.V.
Reel/Frame 061915/0364 →
Continuity (3)
Continuation 14663843 · Mar 20, 2015
Provisional Application 61972527 · Mar 31, 2014
Related Publication 20170012127A1 · Jan 12, 2017