IP Library Granted Patent US 9,779,796
Granted Patent B1
US 9,779,796 · App. 15/258,852 · Granted Oct 3, 2017

Redundancy array column decoder for memory

Inventors: Daniele Vimercati (El Dorado Hills, CA); Xinwei Guo (Folsom, CA)
Assignee: MICRON TECHNOLOGY, INC.
G11C11/221G11C11/2259G11C11/2273
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Quick Facts
Patent No.
US 9,779,796
App. No.
15/258,852
Granted
Oct 3, 2017
Kind
B1
Abstract

Methods, systems, and apparatuses for redundancy in a memory array are described. A memory array may include some memory cells that are redundant to other memory cells of the array. Such redundant memory cells may be used if a another memory cell is discovered to be defective in some way; for example, after the array is fabricated and before deployment, defects in portions of the array that affect certain memory cells may be identified. Memory cells may be designated as redundant cells for numerous other memory cells of the array so that a total number of redundant cells in the array is relatively small fraction of the total number of cells of the array. A configuration of switching components may allow redundant cells to be operated in a manner that supports redundancy for numerous other cells and may limit or disturbances to neighboring cells when accessing redundancy cells.

Claims (44)

1. An apparatus, comprising:

a first portion of a memory array that includes a first number of memory cells;

a second portion of the memory array that includes a second number of memory cells, wherein the first number is an even integer multiple of the second number;

a set of shunt control lines in electronic communication with the memory cells of the first portion of the memory array and at least one memory cell of the second portion of the memory array;

a first set of switching components coupled with the shunt control lines and associated with the first portion of the memory array; and

a second set of switching components coupled with the shunt control lines and associated with the second portion of the memory array, wherein a configuration of the second set of switching components with respect to the memory cells of the second portion of the memory array is based at least in part on a configuration of the first set of switching components with respect to the memory cells of the first portion of the memory array.

2. The apparatus of claim 1 , wherein the configuration of the first set of switching components with respect to the memory cells of the first portion of the memory array is based at least in part on a cyclic shift of the memory cells of the first portion of the memory array.

3. The apparatus of claim 1 , wherein the second set of switching components comprises:

a first subset of switching components;

a second subset of switching components.

4. The apparatus of claim 3 , wherein the first subset of switching components couples the memory cells of the second portion of the memory array to ground or virtual ground.

5. The apparatus of claim 3 , wherein the second subset of switching components couples each memory cell of the second portion of the memory array to a sense amplifier.

6. The apparatus of claim 3 , wherein:

a configuration of the first subset of switching components with respect to the memory cells of the second portion of the memory array is based at least in part on the configuration of the first set of switching components with respect to the memory cells of the first portion of the memory array;

a configuration of the second subset of switching components with respect to the memory cells of the second portion of the memory array is based at least in part on the configuration of the first set of switching components with respect to the memory cells of the first portion of the memory array; and

the configuration of the first subset of switching components is different from the configuration of the second subset of switching components.

7. The apparatus of claim 6 , wherein the configuration of the first subset of switching components and the configuration of the second subset of switching components are based at least in part on a subset of memory cells of the first portion of the memory array coupled to a single shunt control line.

8. The apparatus of claim 7 , wherein:

a first memory cell of the second portion of the memory array is associated with the subset of memory cells of the first portion of the memory array; and

at least one switching component of the first subset of switching components is positioned on the single shunt control line and is in electronic communication with the first memory cell of the second portion of the memory array.

9. The apparatus of claim 7 , wherein:

a second memory cell of the second portion of the memory array is unassociated with any memory cell in the subset of memory cells of the first portion of the memory array; and

at least one switching component of the second subset of switching components is positioned on the single shunt control line and is in electronic communication with the second memory cell of the second portion of the memory array.

10. The apparatus of claim 1 , further comprising:

a set of access lines in electronic communication with the first portion of the memory array and isolated from the second portion of the memory array.

11. The apparatus of claim 1 , further comprising:

a third portion of the memory array that includes the first number of memory cells; and

a third set of switching components coupled with the shunt control lines and associated with the third portion of the memory array, wherein a configuration of the third set of switching components with respect to the memory cells of the third portion of the memory array is based at least in part on the configuration of the first set of switching components with respect to the memory cells of the first portion of the memory array.

12. The apparatus of claim 1 , wherein the at least one memory cell of the second portion of the memory array is redundant to at least one memory cell of the first portion of the memory array.

13. The apparatus of claim 12 , wherein the at least one memory cell of the second portion of the memory array is redundant to multiple memory cells of the first portion of the memory array.

14. The apparatus of claim 1 , wherein a number of switching components of the second set of switching components is an integer multiple of the second number of memory cells.

15. The apparatus of claim 1 , further comprising:

a first set of sense amplifiers coupled to the memory cells of the first portion of the memory array; and

a second set of sense amplifiers coupled to the memory cells of the second portion of the memory array.

16. An apparatus, comprising:

a first portion of a memory array that includes a first number of memory cells;

a second portion of the memory array that includes a second number of memory cells, wherein the first number is an integer multiple of the second number;

a number of shunt control lines in electronic communication with the memory cells of the first portion of the memory array and the memory cells of the second portion of the memory array, wherein the second number of memory cells in the second portion of the memory array is equal to the number of shunt control lines; and

a set of first switching components in electronic communication with the number of shunt control lines, wherein the first set of switching components couples the memory cells of the first portion of the memory array and the memory cells of the second portion of the memory array to ground or virtual ground.

17. The apparatus of claim 16 , wherein:

a subset of memory cells from the first portion of the memory array is coupled to a single shunt control line; and

a single memory cell of the second portion of the memory array corresponds to the subset of memory cells and is coupled to the single shunt control line.

18. The apparatus of claim 16 , further comprising:

a second set of switching components in electronic communication with the number of shunt control lines, wherein the second set of switching components couples the memory cells of the second portion of the memory array to sense amplifiers.

Assignments (5)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050680/0268 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
SUPPLEMENT NO. 2 TO PATENT SECURITY AGREEMENT Recorded Feb 10, 2017
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041671/0902 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 2, 2017
From: VIMERCATI, DANIELE; GUO, XINWEI
To: MICRON TECHNOLOGY, INC.
Reel/Frame 041161/0778 →