Formation of strained fins in a finFET device

1. A method for fabricating a field-effect transistor (FET) structure, the method comprising:

depositing a first mask on a semiconductor substrate;

epitaxially growing silicon-germanium (SiGe) on a portion of the semiconductor substrate that is not covered by the deposited first mask;

performing germanium (Ge) condensation on the epitaxially grown SiGe, wherein the Ge condensation diffuses Ge down into the underlying semiconductor substrate, which forms an area of SiGe in the semiconductor substrate;

removing oxide that is a result of the performed Ge condensation and removing the deposited first mask;

depositing a second mask on the semiconductor substrate;

etching the deposited second mask layer, an area of SiGe in the semiconductor substrate, and an area of semiconductor substrate to form one or more fins;

depositing oxide, wherein the deposited oxide fills in etched away areas of the area of SiGe in the semiconductor substrate, the area of the semiconductor substrate, and the deposited second mask;

performing a thermal anneal process to relax SiGe;

depositing a third mask that masks at least one of the one or more fins and exposes at least one of the one or more fins;

removing a portion of the at least one exposed fin, wherein the removed portion comprises the second mask; and

epitaxially growing a first semiconductor material in at least one trench formed by removing the portion of the at least one fin;

removing the deposited third mask;

depositing a fourth mask that masks at least the epitaxially grown first semiconductor material and exposes at least one of the one or more fins;

removing a portion of the at least one exposed fin, wherein the removed portion comprises the second mask; and

epitaxially growing a second semiconductor material in at least one trench formed by removing the portion of the at least one fin.

2. The method of claim 1 , further comprising: removing the deposited fourth mask; and performing chemical mechanical polishing (CMP).

3. The method of claim 2 , further comprising:

performing a shallow trench isolation (STI) recess on the deposited oxide to expose the epitaxially grown first semiconductor material and the epitaxially grown second semiconductor material, wherein the STI recess forms a plurality of fins comprised of the first semiconductor material and the second semiconductor material.

4. The method of claim 1 , further comprising

epitaxially growing a third semiconductor material in at least one trench formed by removing the portion of the at least one fin.

5. The method of claim 1 :

wherein the semiconductor substrate is an extremely thin semiconductor on insulator (ETSOI) wafer; and

wherein the ETSOI comprises a silicon (Si) substrate layer, a buried oxide (BOX) layer on the Si substrate, and a Si layer that is separated into one or more sections.

6. The method of claim 1 , wherein the epitaxially grown SiGe is defect-free strained SiGe that is grown on the semiconductor substrate utilizing selective epitaxy.

7. The method of claim 1 , wherein performing Ge condensation, further comprises:

applying heat to oxidize Si in the epitaxially grown SiGe and diffuse Ge down into an underlying Si portion of the semiconductor substrate; and

wherein heat is applied until enough Ge is diffused to reach a desired concentration level of SiGe.

8. The method of claim 1 , wherein etching the deposited second mask layer, an area of SiGe in the semiconductor substrate, and an area of semiconductor substrate to form one or more fins, further comprises;

utilizing a reactive ion etch (RIE) to form the one or more fins,

wherein the one or more fins are formed to comprise a base portion comprised of an area of SiGe in the semiconductor substrate or an area of semiconductor substrate, and an upper portion comprising the deposited second mask layer.

9. The method of claim 1 , wherein performing a thermal anneal process to relax SiGe, further comprises:

performing a thermal anneal process that allows the SiGe to relax in all directions, resulting in relaxed SiGe.

10. The method of claim 1 , wherein the first semiconductor material is Si.

11. The method of claim 1 , wherein the second semiconductor material is high-Ge content SiGe.