System and method for decoding commands based on command signals and operating state
View Patent ↗A system and method for decoding command signals that includes a command decoder configured to generate internal control signals to perform an operation based on the command signals and an operating state. The same combination of command signals can request different commands depending on the operating state. A command is selected from a first set of operations according to the command signals when the memory system is in a first operating state and a command is selected from a second set of operations according to the command signals when the memory system is in a second operating state.
1. An apparatus comprising a memory device, wherein the memory device is configured to:
perform, when the memory device is in an active memory state, a first operation responsive, at least in part, to a first combination of logic states of command signals;
perform, when the memory device is in an inactive memory state, a second operation responsive, at least in part, to the first combination of logic states of the command signals; and
perform, when the memory device is in the active memory state, a third operation responsive, at least in part, to a second combination of logic states of the command signals,
wherein the command signals are commands for memory operation, and
wherein a combination of logic states of the command signals and monitoring of the active memory state is used to select a plurality of commands for the memory device.
2. The apparatus of claim 1 , wherein the first operation comprises a write operation.
3. The apparatus of claim 1 , wherein the third operation comprises a write operation.
4. The apparatus of claim 1 , wherein the third operation comprises a read operation.
5. The apparatus of claim 1 , wherein the third operation comprises a load mode operation.
6. A memory device comprising a command control circuit, wherein the command control circuit is configured to:
cause the memory device to perform a first memory operation responsive, at least in part, to a first combination of logic states of the command signals and a first combination of logic levels of active state signals;
cause the memory device to perform a second memory operation responsive, at least in part, to the first combination of logic states of the command signals and a second combination of logic levels of inactivate state signals; and
cause the memory device to perform a third memory operation responsive, at least in part, to a second combination of latched logic states of the command signals and the first combination of logic levels of active state signals, wherein
the first combination of logic states of the command signals and monitoring of the first combination of logic levels of active state signals is used to select a plurality of commands for the memory device.
7. The memory device of claim 6 , wherein the first operation comprises a write operation.
8. The memory device of claim 6 , wherein the third operation comprises a write operation.
9. The memory device of claim 6 , wherein the third operation comprises a read operation.
10. The memory device of claim 6 , wherein the third operation comprises a load mode operation.
11. A method for operating a semiconductor device comprising:
setting the semiconductor device into an active memory state or an inactive memory state;
issuing a first combination of logic levels of command signals to the semiconductor device activates the active memory state so that the semiconductor device operates in a first memory operation;
issuing the first combination of logic levels of the command signals to the semiconductor device activates the inactive memory state so that the semiconductor operates in a second memory operation; and
issuing a second combination of logic levels of the command signals to the semiconductor device activates the active memory state so that the semiconductor operates in a third memory operation, and
wherein the first combination of logic levels of command signals and monitoring of the active memory state is used to select a plurality of commands for the semiconductor device.
12. The method of claim 11 , wherein the first operation comprises a write operation.
13. The method of claim 11 , wherein the third operation comprises a write operation.
14. The method of claim 11 , wherein the third operation comprises a read operation.
15. The method of claim 11 , wherein the third operation comprises a load mode operation.