IP Library Granted Patent US 10,037,045
Granted Patent B2
US 10,037,045 · App. 15/283,605 · Granted Jul 31, 2018

Systems and apparatuses for a configurable temperature dependent reference voltage generator

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Quick Facts
Patent No.
US 10,037,045
App. No.
15/283,605
Granted
Jul 31, 2018
Kind
B2
Abstract

Systems and apparatuses for a configurable, temperature dependent reference voltage generator are provided. An example apparatus includes control logic configured receive temperature data, and produce a signal, based on the temperature data, indicative of the temperature data, a temperature dependence and a temperature slope. The apparatus may also include a temperature slope reference generator configured to produce a reference voltage having the temperature dependence and the temperature slope, based on the signal from the control logic.

Claims (56)

1. A system comprising:

a temperature sensor configured to provide a first signal indicative of temperature data;

a temperature slope generator communicatively coupled to the temperature sensor, the temperature slope generator further comprising:

control logic configured to produce a second signal, based on the first signal, indicative of a temperature dependence, a temperature slope, and the temperature data;

a temperature slope reference generator configured to produce a reference voltage having the temperature dependence and the temperature slope, based on the second signal.

2. The system of claim 1 , wherein the temperature dependence is one of a proportional to absolute temperature, a complementary to absolute temperature, or a flat temperature dependence.

3. The system of claim 1 , wherein the temperature slope is determined, at least in part, by a temperature sensitivity of the reference voltage, wherein temperature sensitivity determines a threshold change in temperature data needed to cause a voltage change in the reference voltage, and wherein the control logic is configured to adjust the temperature sensitivity of the reference voltage.

4. The system of claim 1 , wherein the temperature slope reference generator further comprises a temperature slope trim resistance stack, wherein the temperature slope trim resistance stack is configured to change in resistance based at least in part on the second signal.

5. The system of claim 4 , wherein the temperature slope is based at least in part on the temperature slope trim resistance stack, wherein the temperature slope trim resistance stack defines the amount of voltage change in the reference voltage in relation to a change in the temperature data.

6. The system of claim 1 , wherein the second signal is further indicative of a voltage shift in the reference voltage, and wherein the voltage shift is based, at least in part, on the temperature slope.

7. The system of claim 6 , wherein the temperature slope reference generator further comprises a voltage shift resistance stack configured to cause the direct-current voltage shift in the reference voltage.

8. The system of claim 1 , wherein the second signal is further indicative of clipping behavior at at least one of a high threshold temperature or a low threshold temperature, wherein the temperature slope reference generator is further configured to clip the reference voltage at the at least one of the high threshold temperature or the low threshold temperature.

9. The apparatus of claim 1 , wherein the control logic is communicatively coupled with a process monitor, wherein the process monitor is configured to provide one or more control signals indicative of a process corner to the control logic, wherein the control logic determines at least one of the temperature dependence and temperature slope based, at least in part, on the process corner.

10. An apparatus comprising:

control logic configured receive temperature data, wherein the control logic is configured to produce a signal, based on the temperature data, indicative of the temperature data, a temperature dependence and a temperature slope, wherein the signal is further indicative of a voltage shift in the reference voltage, and wherein the voltage shift is based, at least in part, on the temperature slope;

a temperature slope reference generator configured to produce a reference voltage having the temperature dependence and the temperature slope, based on the signal.

11. The apparatus of claim 10 , wherein the temperature dependence is one of a proportional to absolute temperature, a complementary to absolute temperature, or a flat temperature dependence.

12. An apparatus comprising:

control logic configured receive temperature data, wherein the control logic is configured to produce a signal, based on the temperature data, indicative of the temperature data, a temperature dependence and a temperature slope; and

a temperature slope reference generator configured to produce a reference voltage having the temperature dependence and the temperature slope, based on the signal,

wherein the temperature slope is determined, at least in part, by a temperature sensitivity of the reference voltage, wherein temperature sensitivity determines a threshold change in temperature data needed to cause a voltage change in the reference voltage, and wherein the control logic is configured to adjust the temperature sensitivity of the reference voltage.

13. An apparatus comprising:

control logic configured receive temperature data, wherein the control logic is configured to produce a signal, based on the temperature data, indicative of the temperature data, a temperature dependence and a temperature slope; and

a temperature slope reference generator configured to produce a reference voltage having the temperature dependence and the temperature slope, based on the signal,

wherein the temperature slope is determined, at least in part, by the temperature slope reference generator, wherein the temperature slope reference generator is configured to determine the amount of voltage change in the reference voltage in relation to a change in the temperature data.

14. An apparatus comprising:

control logic configured receive temperature data, wherein the control logic is configured to produce a signal, based on the temperature data, indicative of the temperature data, a temperature dependence and a temperature slope; and

a temperature slope reference generator configured to produce a reference voltage having the temperature dependence and the temperature slope, based on the signal,

wherein the signal is further indicative of clipping behavior at least one of a high threshold temperature or a low threshold temperature, wherein the temperature slope reference generator is further configured to clip the reference voltage at the at least one of the high threshold temperature or the low threshold temperature.

15. An apparatus comprising:

a temperature slope generator, communicatively coupled to a temperature sensor and configured to:

receive temperature data from the temperature sensor;

determine a temperature dependence for a reference voltage;

determine a temperature slope for the reference voltage; and

generate the reference voltage, having at least the temperature dependence and the temperature slope, based on the temperature data, wherein the temperature slope generator is further configured to shift the reference voltage by an offset voltage, and wherein the offset voltage is based, at least in part, on the temperature slope.

16. An apparatus comprising:

a temperature slope generator, communicatively coupled to a temperature sensor and configured to:

receive temperature data from the temperature sensor;

determine a temperature dependence for a reference voltage;

determine a temperature slope for the reference voltage; and

generate the reference voltage, having at least the temperature dependence and the temperature slope, based on the temperature data,

wherein the temperature slope generator is further communicatively coupled to a process monitor, wherein the temperature slope generator is further configured to receive one or more control signals from the process monitor, wherein the control signals are indicative of a process corner, and wherein at least one of the temperature dependence and the temperature slope are determined, at least in part, based on the process corner.

17. An apparatus comprising:

a temperature slope generator, communicatively coupled to a temperature sensor and configured to:

receive temperature data from the temperature sensor;

determine a temperature dependence for a reference voltage;

determine a temperature slope for the reference voltage; and

generate the reference voltage, having at least the temperature dependence and the temperature slope, based on the temperature data,

wherein the temperature slope generator is further configured to implement clipping behavior at least one of a high threshold temperature or a low threshold temperature, wherein the temperature slope reference generator is further configured to clip the reference voltage at the at least one of the high threshold temperature or the low threshold temperature.

18. An apparatus comprising:

a temperature slope generator, communicatively coupled to a temperature sensor and configured to:

receive temperature data from the temperature sensor;

determine a temperature dependence for a reference voltage;

determine a temperature slope for the reference voltage; and

generate the reference voltage, having at least the temperature dependence and the temperature slope, based on the temperature data,

wherein the temperature slope is determined, at least in part, by a temperature sensitivity of the reference voltage, wherein temperature sensitivity determines a threshold change in temperature data needed to cause a voltage change in the reference voltage, and wherein the temperature slope generator is configured to adjust the temperature sensitivity of the reference voltage.

Assignments (5)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050680/0268 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
SUPPLEMENT NO. 2 TO PATENT SECURITY AGREEMENT Recorded Feb 10, 2017
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041671/0902 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 3, 2016
From: WAN, YUANZHONG; PAN, DONG
To: MICRON TECHNOLOGY, INC.
Reel/Frame 039921/0401 →
Cited By (2)
US 12,235,169 US 12,260,895