IP Library Granted Patent US 9,799,797
Granted Patent B2
US 9,799,797 · App. 15/287,140 · Granted Oct 24, 2017

Light-emitting semiconductor chip

Inventors: Matthias Peter (Regensburg, DE); Tobias Meyer (Regensburg, DE); Alexander Walter (Laaber, DE); Tetsuya Taki (Tokyo, JP); Juergen Off (Regensburg, DE); Rainer Butendeich (Regensburg, DE); Joachim Hertkorn (Woerth An Der Donau, DE)
Assignee: OSRAM OPTO SEMICONDUCTORS GMBH
H01L33/06H01L33/0079H01L33/04H01L33/14H01L33/24H01L33/32H01L33/382H01L33/22H01L2224/16225H01L2924/0002
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Quick Facts
Patent No.
US 9,799,797
App. No.
15/287,140
Granted
Oct 24, 2017
Kind
B2
Abstract

A semiconductor chip includes a semiconductor body with a semiconductor layer sequence. An active region intended for generating radiation is arranged between an n-conductive multilayer structure and a p-conductive semiconductor layer. A doping profile is formed in the n-conductive multilayer structure which includes at least one doping peak.

Claims (37)

1. A semiconductor chip comprising:

a semiconductor body with a semiconductor layer sequence, the semiconductor layer sequence comprising an n-conductive multilayer structure, a p-conductive semiconductor layer, and an active region provided for generating radiation; and

a contact layer;

wherein the n-conductive multilayer structure has a doping profile comprising at least one doping peak;

wherein the semiconductor body has a recess that extends through the p-conductive semiconductor layer and the active region into the n-conductive multilayer structure;

wherein the recess penetrates the at least one doping peak; and

wherein the contact layer is disposed in the recess and electrically contacts the n-conductive multilayer structure.

2. The semiconductor chip according to claim 1 , wherein a doping concentration in the at least one doping peak is at least five times as high as a doping concentration in a region of low n-conductive doping of the n-conductive multilayer structure.

3. The semiconductor chip according to claim 2 , wherein the doping concentration in the at least one doping peak is at least 4*10 18 cm −3 and wherein the doping concentration in the region of low n-conductive doping is at most 8*10 17 cm −3 .

4. The semiconductor chip according to claim 1 , wherein the at least one doping peak has a vertical extent that is between 1 nm and 30 nm, inclusive.

5. The semiconductor chip according to claim 4 , wherein the at least one doping peak has a vertical extent that is between 5 nm and 20 nm, inclusive.

6. The semiconductor chip according to claim 1 , wherein the at least one doping peak has a distance from the active region that is between 2 nm and 20 nm, inclusive.

7. The semiconductor chip according to claim 1 , wherein the n-conductive multilayer structure comprises a quantum structure with a first plurality of quantum layers.

8. The semiconductor chip according to claim 7 , wherein the active region comprises a second plurality of quantum layers, wherein the at least doping peak is arranged between a first quantum layer of the first plurality of quantum layers of the n-conductive multilayer structure that is closest to the active region and a second quantum layer of the second plurality of quantum layers of the active region that is closest to the n-conductive multilayer structure.

9. The semiconductor chip according to claim 8 , wherein a band gap of at least one quantum layer of the first plurality of quantum layers of the n-conductive multilayer structure is at least as large as a band gap of at least one quantum layer of the second plurality of quantum layers of the active region.

10. The semiconductor chip according to claim 7 , wherein the doping profile comprises a first doping peak and a second doping peak, wherein at least one quantum layer of the first plurality of quantum layers of the n-conductive multilayer structure is arranged between the first doping peak and the second doping peak.

11. The semiconductor chip according to claim 10 , wherein a sub-region of the quantum structure of the n-conductive multilayer structure comprises a high doping concentration by way of the second doping peak.

12. The semiconductor chip according to claim 1 , wherein the n-conductive multilayer structure comprises a plurality of quantum layers; and

wherein the recess penetrates the plurality of quantum layers of the n-conductive multilayer structure.

13. The semiconductor chip according to claim 1 , wherein the active region is based on a nitride compound semiconductor material.

14. The semiconductor chip according to claim 1 , wherein a crystal structure of the n-conductive multilayer structure comprises V-shaped indentations.

15. The semiconductor chip according to claim 1 , wherein a growth substrate for the semiconductor layer sequence is removed from the semiconductor body.

16. A semiconductor chip comprising:

a semiconductor body with a semiconductor layer sequence, the semiconductor layer sequence comprising an n-conductive multilayer structure; and

a contact layer;

wherein the n-conductive multilayer structure has a doping profile comprising at least one doping peak;

wherein the semiconductor body has a recess that penetrates the doping peak; and

wherein the contact layer in the recess electrically contacts the n-conductive multilayer structure.

17. The semiconductor chip according to claim 16 , wherein the semiconductor layer sequence further comprises a p-conductive semiconductor layer and an active region provided for generating radiation, the recess extending through the p-conductive semiconductor layer and the active region.

18. A semiconductor chip comprising:

a semiconductor body with a semiconductor layer sequence, the semiconductor layer sequence comprising an n-conductive multilayer structure and an active region provided for generating radiation;

a carrier, the semiconductor body being arranged on the carrier; and

a contact layer;

wherein the n-conductive multilayer structure has a doping profile comprising at least one doping peak;

wherein the n-conductive multilayer structure is arranged on a side of the active region remote from the carrier;

wherein the semiconductor body has a recess that penetrates the doping peak; and

wherein the contact layer is arranged in regions between the carrier and the semiconductor body and electrically contacts the n-conductive multilayer structure.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 3, 2020
From: OSRAM OPTO SEMICONDUCTORS GMBH
To: OSRAM OLED GMBH
Reel/Frame 051467/0906 →
Priority Claims (1)
DE 10 2009 060 747 · Dec 30, 2009 · national
Continuity (3)
Continuation 14662037 · Mar 18, 2015
Continuation 13518809
Related Publication 20170025570A1 · Jan 26, 2017