Thermal acid generators and photoresist pattern trimming compositions and methods
Provided are ionic thermal acid generators comprising an anion of an aromatic sulfonic acid comprising one or more fluorinated alcohol group and a cation. Also provided are photoresist pattern trimming compositions that include an ionic thermal acid generator, a matrix polymer and a solvent, and methods of trimming a photoresist pattern using the trimming compositions. The thermal acid generators, compositions and methods find particular applicability in the manufacture of semiconductor devices.
1. An ionic thermal acid generator, comprising: an anion of an aromatic sulfonic acid comprising one or more fluorinated alcohol group, wherein the anion comprises a fluoroalcohol group of the formula —C(CF 3 ) 2 OH; and a cation.
2. The ionic thermal acid generator of claim 1 , wherein the anion comprises a plurality of fluorinated alcohol groups of the formula —C(CF 3 ) 2 OH.
3. The ionic thermal acid generator of claim 1 , wherein the fluorinated alcohol group is bonded to an aromatic ring of the anion through an ester group.
4. The ionic thermal acid generator of claim 1 , wherein the thermal acid generator is of the following general formula (I):
wherein: Ar 1 represents an optionally substituted carbocyclic or heterocyclic aromatic group; W independently represents a group chosen from carboxyl, hydroxy, nitro, cyano, C1-5 alkoxy and formyl; X is a cation; Y independently represents a linking group; Z independently represents a group chosen from hydroxyl, fluorinated alcohols, esters, optionally substituted alkyl, C5 or higher optionally substituted monocyclic, polycyclic, fused polycyclic cycloaliphatic, or aryl, which may optionally comprise a heteroatom, provided at least one occurrence of Z is a fluorinated alcohol group; a is an integer of 0 or greater; b is an integer of 1 or greater; provided that a+b is at least 1 and not greater than the total number of available aromatic carbon atoms of the aromatic group.
5. An ionic thermal acid generator, comprising: an anion of an aromatic sulfonic acid comprising one or more fluorinated alcohol group, and a cation, wherein the fluorinated alcohol group comprises: a fluorine atom bonded to a carbon at the alpha position of the hydroxyl group and/or a fluorinated group bonded pendant to a carbon at the alpha position of the hydroxyl group.
6. The ionic thermal acid generator of claim 5 , wherein the thermal acid generator anion is chosen from the following:
7. A photoresist pattern trimming composition, comprising: an ionic thermal acid generator of claim 1 , a matrix polymer and a solvent.
8. The photoresist pattern trimming composition of claim 7 , wherein the solvent is an organic solvent.
9. The photoresist pattern trimming composition of claim 7 , wherein the anion comprises a plurality of fluorinated alcohol groups of the formula —C(CF 3 ) 2 OH.
10. The photoresist pattern trimming composition of claim 7 , wherein the fluorinated alcohol group is bonded to an aromatic ring of the anion through an ester group.
11. The photoresist pattern trimming composition of claim 7 , wherein the thermal acid generator is of the following general formula (I):
wherein: Ar 1 represents an optionally substituted carbocyclic or heterocyclic aromatic group; W independently represents a group chosen from carboxyl, hydroxy, nitro, cyano, C1-5 alkoxy and formyl; X is a cation; Y independently represents a linking group; Z independently represents a group chosen from hydroxyl, fluorinated alcohols, esters, optionally substituted alkyl, C5 or higher optionally substituted monocyclic, polycyclic, fused polycyclic cycloaliphatic, or aryl, which may optionally comprise a heteroatom, provided at least one occurrence of Z is a fluorinated alcohol group of the formula —C(CF 3 ) 2 OH; a is an integer of 0 or greater; b is an integer of 1 or greater; provided that a+b is at least 1 and not greater than the total number of available aromatic carbon atoms of the aromatic group.
12. A method of trimming a photoresist pattern, comprising:
(a) providing a substrate;
(b) forming a photoresist pattern on the substrate, wherein the photoresist pattern is formed from a photoresist composition comprising: a matrix polymer comprising an acid labile group; a photoacid generator; and a solvent;
(c) coating a photoresist trimming composition of claim 8 on the substrate over the photoresist pattern;
(d) heating the coated substrate, thereby causing a change in polarity of the photoresist matrix polymer in a surface region of the photoresist pattern; and
(e) contacting the photoresist pattern with a rinsing agent to remove the surface region of the photoresist pattern, thereby forming a trimmed photoresist pattern.
13. The method of claim 12 , wherein the anion comprises a plurality of fluorinated alcohol groups of the formula —C(CF 3 ) 2 OH.
14. The method of claim 12 , wherein the fluorinated alcohol group is bonded to an aromatic ring of the anion through an ester group.
15. The method of claim 12 , wherein the thermal acid generator is of the following general formula (I):
wherein: Ar 1 represents an optionally substituted carbocyclic or heterocyclic aromatic group; W independently represents a group chosen from carboxyl, hydroxy, nitro, cyano, C1-5 alkoxy and formyl; X is a cation; Y independently represents a linking group; Z independently represents a group chosen from hydroxyl, fluorinated alcohols, esters, optionally substituted alkyl, C5 or higher optionally substituted monocyclic, polycyclic, fused polycyclic cycloaliphatic, or aryl, which may optionally comprise a heteroatom, provided at least one occurrence of Z is a fluorinated alcohol group of the formula —C(CF 3 ) 2 OH; a is an integer of 0 or greater; b is an integer of 1 or greater; provided that a+b is at least 1 and not greater than the total number of available aromatic carbon atoms of the aromatic group.
16. A photoresist pattern trimming composition, comprising: an ionic thermal acid generator of claim 5 , a matrix polymer and a solvent.
17. The photoresist pattern trimming composition of claim 16 , wherein the thermal acid generator anion is chosen from the following:
18. A method of trimming a photoresist pattern, comprising:
(a) providing a substrate;
(b) forming a photoresist pattern on the substrate, wherein the photoresist pattern is formed from a photoresist composition comprising: a matrix polymer comprising an acid labile group; a photoacid generator; and a solvent;
(c) coating a photoresist trimming composition of claim 16 on the substrate over the photoresist pattern;
(d) heating the coated substrate, thereby causing a change in polarity of the photoresist matrix polymer in a surface region of the photoresist pattern; and
(e) contacting the photoresist pattern with a rinsing agent to remove the surface region of the photoresist pattern, thereby forming a trimmed photoresist pattern.