IP Library Granted Patent US 10,497,569
Granted Patent B2
US 10,497,569 · App. 15/354,076 · Granted Dec 3, 2019

Carbon materials for carbon implantation

Inventors: Joseph D. Sweeney (Winsted, CT); Oleg Byl (Southbury, CT); Robert Kaim (Brookline, MA)
Assignee: ENTEGRIS, INC.
H01L21/265C23C14/06C23C14/0605C23C14/48H01J37/3171H01L21/2236H01J2237/08H01J2237/31701
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Quick Facts
Patent No.
US 10,497,569
App. No.
15/354,076
Granted
Dec 3, 2019
Kind
B2
Abstract

A method of implanting carbon ions into a target substrate, including: ionizing a carbon containing dopant material to produce a plasma having ions; optionally co-flowing an additional gas or series of gases with the carbon-containing dopant material; and implanting the ions into the target substrate. The carbon-containing dopant material is of the formula C w F x O y H z wherein if w=1, then x>0 and y and z can take any value, and wherein if w>1 then x or y is >0, and z can take any value. Such method significantly improves the efficiency of an ion implanter tool, in relation to the use of carbon source gases such as carbon monoxide or carbon dioxide.

Claims (46)

1. A method of implanting carbon in a substrate from a carbon-containing dopant material, comprising:

flowing a carbon-containing dopant material comprising a carbon-containing gas; into an ion implantation chamber;

ionizing the carbon-containing dopant material to form ions comprising positive carbon ions;

implanting the carbon ions in the substrate; and

flowing a fluorine-containing gas into the ion implantation chamber, while the carbon ions are being implanted, thereby increasing an amount of the carbon ions implanted in the substrate and reducing an amount of carbon or non-carbon elements deposited on the ion implantation chamber.

2. The method of claim 1 , wherein an additional gas or gases, selected from the group consisting of oxygen, an oxygen-containing gas that is different than CO 2 and CO, air, hydrogen, nitrogen, argon, xenon, and helium, flows with the carbon-containing and fluorine-containing gases.

3. The method of claim 2 , wherein the additional gas or gases comprises hydrogen or helium.

4. The method of claim 2 , wherein the additional gas or gases comprises inert gas selected from the group consisting of nitrogen, argon, xenon, helium, and combinations thereof.

5. The method of claim 2 , wherein the additional gas or gases comprises an oxygen-containing gas.

6. The method of claim 1 , wherein the fluorine-containing gas comprises COF 2 .

7. The method of claim 1 , wherein the carbon-containing gas comprises CO.

8. The method of claim 1 , wherein the carbon-containing gas comprises CO 2 .

9. The method of claim 1 , wherein the fluorine-containing gas comprises fluorine and carbon, oxygen, or both carbon and oxygen.

10. The method of claim 1 , comprising implantation of multiple implantation species.

11. The method of claim 1 , wherein the ionizing is conducted in an arc chamber of the ion implantation chamber, to which the carbon-containing and fluorine-containing gases are flowed.

12. The method of claim 1 , comprising separating C + ions via mass analysis.

13. The method of claim 1 , wherein the carbon-containing and fluorine-containing gases, and an optional additional gas, comprise a gas combination selected from the group consisting of:

(i) CO+F 2 ;

(ii) CO+F 2 +O 2 ;

(iii) CO+F 2 +H 2 ;

(iv) CO+F 2 +H 2 +O 2 ;

(v) CO+COF 2 ;

(vi) CO+COF 2 +H 2 ;

(vii) CO+CF 4 ;

(viii) CO+CH 3 F;

(ix) CO+H 2 +CF 4 ;

(x) CO+H 2 +CH 3 F;

(xi) CF 4 +CH 4 ;

(xii) CF 4 +CH 4 +O 2 ;

(xiii) CO 2 +F 2 ;

(xiv) CO 2 +F 2 +O 2 ;

(xv) CO 2 +F 2 +H 2 ;

(xvi) CO 2 +F 2 +H 2 +O 2 ;

(xvii) CO 2 +COF 2 ;

(xviii) CO 2 +COF 2 +H 2 ;

(xix) CO 2 +CF 4 ;

(xx) CO 2 +CH 3 F;

(xxi) CO 2 +H 2 +CF 4 ; and

(xxii) CO 2 +H 2 +CH 3 F.

14. The method of claim 1 wherein the carbon-containing gas and fluorine-containing gas comprises CO, CO 2 , or both CO and CO 2 , and COF 2 .

15. The method of claim 14 wherein ionizing generates carbon ions, oxygen ions, and fluorine ions from the CO, CO 2 , or both CO and CO 2 , and COF 2 .

16. The method of claim 15 wherein CO, CO 2 , or both CO and CO 2 , and COF 2 , are present in a molar ratio which maximizes that amount of carbon implanted and minimizes the amounts of carbon or non-carbon elements deposited on the chamber.

17. The method of claim 1 which minimizes carbon, non-carbon elements, or both, deposited on the ion implantation chamber.

18. The method of claim 1 wherein ionizing generates fluorine ions and fluorine ions minimize oxidation of a cathode or filament in the ion implantation chamber.

19. The method of claim 1 wherein, the fluorine-containing gas is introduced into the ion implantation chamber as a co-flow with the carbon-containing gas.

20. The method of claim 1 wherein, the fluorine-containing gas is simultaneously flowed with the carbon-containing gas.

Assignments (7)
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
ASSIGNMENT OF PATENT SECURITY INTEREST RECORDED AT REEL/FRAME 048811/0679 Recorded Nov 5, 2019
From: GOLDMAN SACHS BANK USA
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 050965/0035 →
MERGER Recorded Oct 23, 2019
From: ADVANCED TECHNOLOGY MATERIALS, INC.
To: ENTEGRIS, INC.
Reel/Frame 050806/0894 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 23, 2019
From: SWEENEY, JOSEPH D.; BYL, OLEG; KAIM, ROBERT
To: ADVANCED TECHNOLOGY MATERIALS, INC.
Reel/Frame 050806/0863 →
SECURITY INTEREST Recorded Nov 13, 2018
From: ENTEGRIS, INC.; SAES PURE GAS, INC.
To: GOLDMAN SACHS BANK USA
Reel/Frame 048811/0679 →
SECURITY INTEREST Recorded May 15, 2017
From: ENTEGRIS, INC.; POCO GRAPHITE, INC.
To: GOLDMAN SACHS BANK USA, AS COLLATERAL AGENT
Reel/Frame 042375/0769 →
SECURITY INTEREST Recorded May 15, 2017
From: ENTEGRIS, INC.; POCO GRAPHITE, INC.
To: GOLDMAN SACHS BANK USA, AS COLLATERAL AGENT
Reel/Frame 042375/0740 →