IP Library Granted Patent US 10,323,162
Granted Patent B2
US 10,323,162 · App. 15/410,942 · Granted Jun 18, 2019

Abrasive material

Inventors: Mikimasa Horiuchi (Tokyo, JP); Ryutaro Kuroda (Tokyo, JP); Yasuhide Yamaguchi (Tokyo, JP)
Assignee: Mitsui Minig & Smelting Co., Ltd.
C09G1/02B24B7/10C09K3/1409C08K2003/2262
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Quick Facts
Patent No.
US 10,323,162
App. No.
15/410,942
Granted
Jun 18, 2019
Kind
B2
Abstract

The present invention provides an abrasive material capable of polishing difficult-to-polish silicon carbide at a high degree of surface precision. The present invention relates to an abrasive material including manganese dioxide particles having a non-needle-like shape possessing a ratio of the longitudinal axis to the transverse axis of the particles observed with a scanning electron microscope of 3.0 or less. The abrasive material is preferable if the average particle size D SEM of the longitudinal axis of the observed particles is 1.0 μm or less, and if the particle size D 50 of the volume-based cumulative fraction of 50% in laser diffraction/scattering particle size distribution measurement is 2.0 μm or less.

Claims (28)

1. A method of polishing a substrate, comprising:

(a) providing an abrasive material comprising manganese dioxide particles having a non-needle-like shape having a longitudinal axis and a transverse axis, wherein a ratio of the longitudinal axis to the transverse axis of the particles is 3.0 or less; and

(b) polishing a substrate with said abrasive material;

wherein the substrate is polished to a surface roughness of 0.17 nm or less.

2. The method according to claim 1 , wherein the average particle size D SEM of the longitudinal axis of the manganese dioxide particles is 1.0 μm or less.

3. The method according to claim 1 , wherein the particle size D 50 of the volume-based cumulative fraction of 50% in laser diffraction/scattering particle size distribution measurement is 2.0 μm or less.

4. The method according to claim 1 , wherein specific surface area of the abrasive material is 20 m 2 /g or more.

5. The method according to claim 1 , wherein the crystal structure of manganese dioxide is of the γ-type.

6. The method according to claim 1 , wherein the crystal structure of manganese dioxide is of the β-type.

7. The method according to claim 5 , wherein the manganese dioxide particles have been formed by a dry pulverization step of dry pulverizing γ-type manganese dioxide deposited on an anode by electrolysis.

8. The method according to claim 6 , wherein the manganese dioxide particles have been formed by a heating step of heating γ-type manganese dioxide deposited on an anode by electrolysis in a hot atmosphere set at 200° C. to 600° C.; and a dry pulverization step of dry pulverizing the heated manganese dioxide.

9. The method according to claim 1 , wherein a ratio of the longitudinal axis to the transverse axis of the particles is 1.00 to 1.67.

10. The method according to claim 1 , wherein the abrasive material is in the form of a slurry.

11. The method according to claim 1 , wherein the substrate comprises silicon carbide.

12. The method according to claim 1 , wherein step (b) comprises polishing the substrate at a polishing rate of 0.07 μm/hr or more.

13. A method of polishing a substrate, comprising:

(a) providing an abrasive material comprising manganese dioxide particles having a non-needle-like shape having a longitudinal axis and a transverse axis, wherein a ratio of the longitudinal axis to the transverse axis of the particles is 3.0 or less, wherein the average particle size D SEM of the longitudinal axis of the particles is 1.0 μm or less, and wherein the particle size D 50 of the volume-based cumulative fraction of 50% in laser diffraction/scattering particle size distribution measurement is 2.0 μm or less; and

(b) polishing a substrate with said abrasive material;

wherein the manganese dioxide particles have been formed by a heating step of heating γ-type manganese dioxide deposited on an anode by electrolysis in a hot atmosphere set at 200° C. to 600° C.; and a dry pulverization step of dry pulverizing the heated manganese dioxide.

14. The method according to claim 13 , wherein the abrasive material is in the form of a slurry.

15. The method according to claim 13 , wherein the substrate comprises silicon carbide.

16. The method according to claim 13 , wherein the specific surface area of the abrasive material is 20 m 2 /g or more.

17. The method according to claim 13 , wherein a ratio of the longitudinal axis to the transverse axis of the particles is 1.00 to 1.67.

18. A method of polishing a substrate, comprising:

(a) providing an abrasive material comprising manganese dioxide particles having a non-needle-like shape having a longitudinal axis and a transverse axis, wherein a ratio of the longitudinal axis to the transverse axis of the particles is 3.0 or less; and

(b) polishing a substrate with said abrasive material;

wherein the crystal structure of manganese dioxide is of the β-type;

wherein the manganese dioxide particles have been formed by a heating step of heating γ-type manganese dioxide deposited on an anode by electrolysis in a hot atmosphere set at 200° C. to 600° C.; and a dry pulverization step of dry pulverizing the heated manganese dioxide.

Assignments (2)
CHANGE OF NAME Recorded Mar 31, 2026
From: MITSUI MINING AND SMELTING COMPANY, LIMITED
To: MITSUI KINZOKU COMPANY, LIMITED
Reel/Frame 075357/0342 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 20, 2017
From: HORIUCHI, MIKIMASA; KURODA, RYUTARO; YAMAGUCHI, YASUHIDE
To: MITSUI MINING & SMELTING CO., LTD.
Reel/Frame 041024/0332 →
Priority Claims (1)
JP 2009-282084 · Dec 11, 2009 · national
Continuity (2)
Division 13513917
Related Publication 20170130097A1 · May 11, 2017