IP Library Granted Patent US 10,602,620
Granted Patent B2
US 10,602,620 · App. 15/426,435 · Granted Mar 24, 2020

Laminate for printed wiring board, method of manufacturing printed wiring board, and method of manufacturing electronic device

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Quick Facts
Patent No.
US 10,602,620
App. No.
15/426,435
Granted
Mar 24, 2020
Kind
B2
Abstract

A laminate for printed wiring board is used in a method of manufacturing printed wiring boards that includes a process of forming a circuit by any one of a semi-additive method, a partly additive method, a modified semi-additive method, and an embedding method. The laminate includes an insulating resin substrate, a metal layer 1 and a metal layer 2 in this order. When a cross section that is parallel to the thickness direction of the laminate is processed by means of ion milling and the cross sections of the metal layer 1 and the metal layer 2 were observed with EBSD, each of the metal layer 1 and the metal layer 2 has one or plural crystal grain(s) at the processed cross section, and an area ratio of the total area of crystal grains of which a difference in angle of the <100> crystal direction from a perpendicular of the processed cross section is 15° or less from among the one or plural crystal grains to the total area of the plural crystal grains was 15% or higher but less than 97% in the metal layer 1 and the metal layer 2.

Claims (41)

1. A laminate for a printed circuit board,

wherein the laminate is used in a printed circuit board manufacturing method that includes a step of forming a circuit by any one of a semi-additive method, a partly additive method, a modified semi-additive method, and an embedding method, and

wherein the laminate includes an insulating resin substrate, a metal layer 1 and a metal layer 2 in this order, and when a cross section parallel to a thickness direction of the laminate is processed by means of ion milling and the cross section of the metal layer 1 and the metal layer 2 is observed with EBSD (Electron Backscatter Diffraction), in the cross section, each of the metal layer 1 and the metal layer 2 has one or a plurality of crystal grains, and an area ratio of a total area of at least one crystal grain of which a difference in angle of a <100> crystal direction from a perpendicular of the cross section is 15° or less from among the one or plurality of crystal grains of the metal layer 1 and the one or plurality of crystal grains of the metal layer 2 to a total area of the one or plurality of crystal grains in the metal layer 1 and the one or plurality of crystal grains in the metal layer 2 is 15% or higher and less than 97%.

2. The laminate for the printed circuit board according to claim 1 ,

wherein when the cross section parallel to the thickness direction of the laminate is processed by means of ion milling and the cross section of the metal layer 1 is observed with EBSD, in the cross section, the metal layer 1 has one or a plurality of crystal grains, an area ratio of an area of at least one crystal grain of which a difference in angle of a <100> crystal direction from a perpendicular of the cross section is 15° or less from among the one or plurality of crystal grains in the metal layer 1 to a total area of the one or plurality of crystal grains in the metal layer 1 is 40% or higher.

3. The laminate for the printed wiring board according to claim 2 ,

wherein the area ratio of the total area of the at least one crystal grain of which the difference in angle of the <100> crystal direction from the perpendicular of the processed cross section is 15° or less from among the one or plurality of crystal grains in the metal layer 1 and the one or plurality of crystal grains in the metal layer 2 to the total area of the one or plurality of crystal grains in the metal layer 1 and the one or plurality of crystal grains in the metal layer 2 is 15% or higher and 90% or less.

4. The laminate for the printed wiring board according to claim 3 ,

wherein the area ratio of the total area of the at least one crystal grain of which the difference in angle of the <100> crystal direction from the perpendicular of the processed cross section is 15° or less from among the one or plurality of crystal grains in the metal layer 1 and the one or plurality of crystal grains in the metal layer 2 to the total area of the one or plurality of crystal grains in the metal layer 1 and the one or plurality of crystal grains in the metal layer 2 is 18% or higher and less than 90%.

5. The laminate for the printed circuit board according to claim 4 ,

wherein when the cross section parallel to the thickness direction of the laminate is processed by means of ion milling and the cross section of the metal layer 1 and the metal layer 2 is observed, a thickness of the metal layer 2 is 1.3 times or more thicker than a thickness of the metal layer 1.

6. The laminate for the printed circuit board according to claim 5 ,

wherein the laminate comprises a circuit or wiring, and

wherein when the cross section parallel to the thickness direction of the circuit or wiring is processed by means of ion milling and the cross section is observed with EBSD, in the cross section, the circuit or wiring has a plurality of crystal grains, and an area ratio of a total area of at least one crystal grain of which a difference in angle of a <100> crystal direction from a perpendicular of the cross section from among the plurality of crystal grains in the circuit or wiring is 15° or less to a total area of the plurality of crystal grains in the circuit or wiring is 15% or higher and less than 97%.

7. The laminate for the printed circuit board according to claim 3 ,

wherein when the cross section parallel to the thickness direction of the laminate is processed by means of ion milling and the cross section of the metal layer 1 and the metal layer 2 is observed, a thickness of the metal layer 2 is 1.1 times or more thicker than a thickness of the metal layer 1.

8. The laminate for the printed wiring board according to claim 2 ,

wherein the area ratio of the total area of the at least one crystal grain of which the difference in angle of the <100> crystal direction from the perpendicular of the processed cross section is 15° or less from among the one or plurality of crystal grains in the metal layer 1 and the one or plurality of crystal grains in the metal layer 2 to the total area of the one or plurality of crystal grains in the metal layer 1 and the one or plurality of crystal grains in the metal layer 2 is 18% or higher and less than 97%.

9. The laminate for the printed wiring board according to claim 1 ,

wherein the area ratio of the total area of the at least one crystal grain of which the difference in angle of the <100> crystal direction from the perpendicular of the processed cross section is 15° or less from among the one or plurality of crystal grains in the metal layer 1 and the one or plurality of crystal grains in the metal layer 2 to the total area of the one or plurality of crystal grains in the metal layer 1 and the one or plurality of crystal grains in the metal layer 2 is 15% or higher and 90% or less.

10. The laminate for the printed wiring board according to claim 9 ,

wherein the area ratio of the total area of the at least one crystal grain of which the difference in angle of the <100> crystal direction from the perpendicular of the processed cross section is 15° or less from among the one or plurality of crystal grains in the metal layer 1 and the one or plurality of crystal grains in the metal layer 2 to the total area of the one or plurality of crystal grains in the metal layer 1 and the one or plurality of crystal grains in the metal layer 2 is 18% or higher and less than 90%.

11. The laminate for the printed wiring board according to claim 1 ,

wherein the area ratio of the total area of the at least one crystal grain of which the difference in angle of the <100> crystal direction from the perpendicular of the processed cross section is 15° or less from among the one or plurality of crystal grains in the metal layer 1 and the one or plurality of crystal grains in the metal layer 2 to the total area of the one or plurality of crystal grains in the metal layer 1 and the one or plurality of crystal grains in the metal layer 2 is 18% or higher and less than 97%.

12. The laminate for the printed circuit board according to claim 1 ,

wherein when the cross section parallel to the thickness direction of the laminate is processed by means of ion milling and the cross section of the metal layer 1 and the metal layer 2 is observed, a thickness of the metal layer 2 is the same as or thicker than a thickness of the metal layer 1.

13. The laminate for the printed circuit board according to claim 1 ,

wherein the metal layer 1 is a rolled copper foil.

14. The laminate for the printed circuit board according to claim 1 ,

wherein the cross section parallel to the thickness direction of the laminate is a cross section parallel to the thickness direction of the laminate and parallel to a rolling direction when the metal layer 1 is a rolled copper foil, or is a cross section parallel to the thickness direction of the laminate and parallel to an MD direction when the metal layer 1 is an electrolytic copper foil.

15. The laminate for the printed circuit board according to claim 1 ,

wherein the laminate for printed wiring board is bent for use, and

wherein the cross section parallel to the thickness direction of the laminate is parallel to the thickness direction of the laminate and when the laminate for printed wiring board is bent for use, the cross section corresponds to a cross section perpendicular to a direction to which an bending axis extends.

16. The laminate for the printed circuit board according to claim 1 ,

wherein the laminate comprises a circuit or wiring, and

wherein when the cross section parallel to the thickness direction of the circuit or wiring is processed by means of ion milling and the cross section is observed with EBSD, in the cross section, the circuit or wiring has a plurality of crystal grains, and an area ratio of a total area of at least one crystal grain of which a difference in angle of a <100> crystal direction from a perpendicular of the cross section from among the plurality of crystal grains in the circuit or wiring is 15° or less to a total area of the plurality of crystal grains in the circuit or wiring is 15% or higher and less than 97%.

17. The laminate for the printed wiring board according to claim 16 ,

wherein the cross section parallel to the thickness direction of the circuit or wiring is a cross section parallel to the thickness direction of the circuit or wiring and parallel to a direction to which the circuit or wiring extends, or is a cross section parallel to the thickness direction of the circuit or wiring and parallel to a width direction of the circuit or wiring.

18. The laminate for the printed circuit board according to claim 16 ,

wherein the laminate for printed wiring board is bent for use, and

wherein the cross section parallel to the thickness direction of the circuit or wiring is parallel to the thickness direction of the circuit or wiring and when the laminate for printed wiring board is bent for use, the cross section corresponds to a cross section perpendicular to a direction to which an bending axis extends.

Assignments (2)
CHANGE OF ADDRESS Recorded Aug 11, 2021
From: JX NIPPON MINING & METALS CORPORATION
To: JX NIPPON MINING & METALS CORPORATION
Reel/Frame 057160/0114 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 28, 2017
From: MIKI, ATSUSHI; KANMURI, KAZUKI
To: JX NIPPON MINING & METALS CORPORATION
Reel/Frame 041399/0912 →