Components such as edge rings including chemical vapor deposition (CVD) diamond coating with high purity SP3 bonds for plasma processing systems
A pedestal for a plasma processing system includes a substrate supporting surface. An annular edge ring is arranged around a periphery of the substrate supporting surface. A chemical vapor deposition (CVD) diamond coating is arranged on a plasma-exposed surface of the annular edge ring. The CVD diamond coating includes sp3 bonds. A purity of the sp3 bonds in the diamond coating is greater than 90%.
1. A pedestal for a plasma processing system, comprising:
a substrate supporting surface;
an annular edge ring arranged around a periphery of the substrate supporting surface; and
a diamond coating arranged on a plasma-exposed surface of the annular edge ring,
wherein the diamond coating includes sp3 bonds, and
wherein a purity of the sp3 bonds in the diamond coating is greater than 99%.
2. The pedestal of claim 1 , wherein the diamond coating is deposited on the annular edge ring using chemical vapor deposition (CVD).
3. A plasma processing system comprising:
a processing chamber, wherein the pedestal of claim 1 is arranged in the processing chamber; and
a plasma source to create plasma in the processing chamber.
4. The plasma processing system of claim 3 , wherein the plasma source includes a capacitively-coupled plasma (CCP) source.
5. The plasma processing system of claim 3 , wherein the plasma source includes an inductively-coupled plasma (ICP) source.
6. A plasma processing system comprising:
a processing chamber, wherein the pedestal of claim 1 is arranged in the processing chamber; and
a remote plasma source to supply plasma to the processing chamber.
7. A plasma processing system, comprising:
a processing chamber;
a plasma source to one of supply plasma to the processing chamber and create plasma in the processing chamber; and
at least one component arranged in the processing chamber including a diamond coating,
wherein the diamond coating includes sp3 bonds, and
wherein a purity of the sp3 bonds in the diamond coating is greater than 99%.
8. The plasma processing system of claim 7 , wherein the diamond coating is deposited on the at least one component using chemical vapor deposition (CVD).
9. The plasma processing system of claim 7 , wherein the at least one component is selected from a group consisting of:
an edge ring;
a chamber wall;
a gas distribution device;
a gas injector;
a window into the processing chamber; and
an upper surface of a pedestal.
10. An edge ring for a plasma processing system, comprising:
an annular ring; and
a diamond coating arranged on a surface of the annular ring that is exposed to plasma during use,
wherein the diamond coating includes sp3 bonds, and
wherein a purity of the sp3 bonds in the diamond coating is greater than 99%.
11. The edge ring of claim 10 , wherein the diamond coating is deposited on the annular ring using chemical vapor deposition (CVD).
12. The edge ring of claim 10 , wherein the annular ring is made of a material selected from a group consisting of silicon (Si), silicon carbide (SiC) and silicon dioxide (SiO 2 ).
13. The edge ring of claim 10 , wherein the diamond coating has a thickness of 1 μm to 1 mm.
14. The edge ring of claim 10 , wherein the diamond coating has a thickness of 100 μm to 1 mm.
15. A component for a plasma processing system, comprising:
a surface that is exposed to plasma during use of the plasma processing system; and
a diamond coating arranged on the surface of the component,
wherein the diamond coating includes sp3 bonds, and
wherein a purity of the sp3 bonds in the diamond coating is greater than 99%.
16. The component of claim 15 , wherein the diamond coating is deposited on the component using chemical vapor deposition (CVD).
17. The component of claim 15 , wherein the component is made of a material selected from a group consisting of silicon (Si), silicon carbide (SiC) and silicon dioxide (SiO 2 ).
18. The component of claim 15 , wherein the diamond coating has a thickness of 1 μm to 1 mm.
19. The component of claim 15 , wherein the diamond coating has a thickness of 100 μm to 1 mm.
20. The component of claim 15 , wherein the component is selected from a group consisting of:
an edge ring;
a chamber wall;
a gas distribution device;
a gas injector;
a window into a processing chamber; and
an upper surface of a pedestal.