IP Library Granted Patent US 10,147,705
Granted Patent B2
US 10,147,705 · App. 15/438,691 · Granted Dec 4, 2018

Stacked semiconductor die assemblies with die substrate extensions

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Quick Facts
Patent No.
US 10,147,705
App. No.
15/438,691
Granted
Dec 4, 2018
Kind
B2
Abstract

Stacked semiconductor die assemblies with die substrate extensions are disclosed herein. In one embodiment, a semiconductor die assembly can include a package substrate, a first die mounted to the package substrate, and a second die mounted to the first die. The first die includes a first die substrate, and the second die includes a second die substrate attached to the first die substrate. At least one of the first and second dies includes a semiconductor substrate and a die substrate extension adjacent the semiconductor substrate. The die substrate extension comprises a mold material that at least partially defines a planform.

Claims (14)

1. A semiconductor die assembly, comprising:

a package substrate;

a stack of dies attached to the package substrate, wherein the stack of dies includes—

a first die having a first die substrate, and

a second die having a second die substrate attached to the first die substrate, wherein the second die includes (1) a semiconductor substrate having a peripheral portion and (2) a first mold material extending from the peripheral portion, wherein the peripheral portion and the first mold material defines the second die substrate; and

a second mold material encapsulating the stack of dies,

wherein the first die is between the package substrate and the second die, and wherein the first mold material of the second die extends beyond the first die and overhangs the package substrate.

2. The semiconductor die assembly of claim 1 wherein the first die substrate includes a first portion attached to the semiconductor substrate of the second die, and a second portion attached to the first mold material of the second die.

3. The semiconductor die assembly of claim 2 wherein the first die substrate has a perimeter, and wherein both the first mold material and the semiconductor substrate of the second die extend beyond the perimeter.

4. The semiconductor die assembly of claim 1 wherein the first mold material completely surrounds the semiconductor substrate of the second die.

5. The semiconductor die assembly of claim 1 wherein the first mold material and the semiconductor substrate of the second die are coplanar.

6. The semiconductor die assembly of claim 1 , further comprising a die-attach film between the first die and the second die substrate, wherein the die-attach film is attached to both the first mold material and the second die substrate.

7. The semiconductor die assembly of claim 1 wherein the first mold material of the second die comprises at least one of an epoxy resin and a thermoset material.

8. The semiconductor die assembly of claim 1 wherein at least one of the first and second dies is a memory die.

Assignments (5)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050702/0451 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
SUPPLEMENT NO. 4 TO PATENT SECURITY AGREEMENT Recorded May 4, 2017
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042405/0909 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 21, 2017
From: WATANABE, FUMITOMO; KUSANAGI, KEIYO
To: MICRON TECHNOLOGY, INC.
Reel/Frame 041773/0162 →