IP Library Granted Patent US 10,090,378
Granted Patent B1
US 10,090,378 · App. 15/462,501 · Granted Oct 2, 2018

Efficient metal-insulator-metal capacitor

Inventors: Kisup Chung (Albany, NY); Isabel C. Estrada-Raygoza (Albany, NY); Hemanth Jagannathan (Niskayuna, NY); Chi-Chun Liu (Altamont, NY); Yann A. M. Mignot (Slingerlands, NY); Hao Tang (Albany, NY)
Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
H01L28/60
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Quick Facts
Patent No.
US 10,090,378
App. No.
15/462,501
Granted
Oct 2, 2018
Kind
B1
Abstract

Capacitors and methods of forming the same include forming a self-assembled pattern of periodic first and second domains using first and second block copolymer materials over a substrate. The second block copolymer material is etched away. Material from the substrate is etched based on a pattern defined by the first block copolymer material to form cavities in the substrate. A capacitor stack is conformally deposited over the substrate, such that the capacitor stack is formed on horizontal surfaces of the substrate and vertical surfaces of the cavities.

Claims (14)

1. A capacitor, comprising:

a stack, comprising:

a first metallic layer conformally formed over a substrate that comprises at least one high domain and at least one low domain;

an insulator conformally formed over the first metallic layer; and

a second metallic layer conformally formed over the insulator;

a bottom contact formed in the substrate having a top surface that is even with a top surface of the substrate in the at least one high domain and that is in electrical contact with the first metallic layer;

a cap layer formed directly on the substrate in the high domains, under the stack; and

a hardmask layer formed directly on the cap layer in the high domains, under the stack.

2. The capacitor of claim 1 , wherein the cap layer and the hardmask layer are absent over the low domains.

3. The capacitor of claim 1 , wherein a surface of the substrate in the low domains has a height that is lower than a surface of the substrate in the high domains.

4. The capacitor of claim 1 , further comprising:

a protective layer formed over the stack; and

a dielectric layer formed over and around the protective layer and the stack.

5. The capacitor of claim 4 , further comprising a top contact that penetrates the dielectric layer and the protective layer to form an electrical contact with the second metallic layer.

Assignments (5)
CHANGE OF NAME Recorded Nov 21, 2025
From: TESSERA, INC.
To: TESSERA LLC
Reel/Frame 073658/0771 →
CHANGE OF NAME Recorded Nov 21, 2025
From: TESSERA LLC
To: ADEIA SEMICONDUCTOR SOLUTIONS LLC
Reel/Frame 073658/0868 →
SECURITY INTEREST Recorded Jun 1, 2020
From: ROVI SOLUTIONS CORPORATION; ROVI TECHNOLOGIES CORPORATION; ROVI GUIDES, INC.; TIVO SOLUTIONS INC.; VEVEO, INC.; INVENSAS CORPORATION; INVENSAS BONDING TECHNOLOGIES, INC.; TESSERA, INC.; TESSERA ADVANCED TECHNOLOGIES, INC.; DTS, INC.; PHORUS, INC.; IBIQUITY DIGITAL CORPORATION
To: BANK OF AMERICA, N.A.
Reel/Frame 053468/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 7, 2020
From: INTERNATIONAL BUSINESS MACHINES CORPORATION
To: TESSERA, INC.
Reel/Frame 051493/0546 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 17, 2017
From: CHUNG, KISUP; ESTRADA-RAYGOZA, ISABEL C.; JAGANNATHAN, HEMANTH; LIU, CHI-CHUN; MIGNOT, YANN A.M.; TANG, HAO
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 041623/0078 →
Cited By (1)
US 12,575,402