Direct bonded copper semiconductor packages and related methods
A power semiconductor package includes a first direct bonded copper (DBC) substrate having a plurality of connection traces on a first face of the first DBC substrate. A plurality of die are coupled to the connection traces, each die coupled to one of the connection traces at a first face of the die. A second DBC substrate includes connection traces on a first face of the second DBC substrate. A second face of each die is coupled to one of the connection traces of the first face of the second DBC substrate. A cavity between the first face of the first DBC substrate and the first face of the second DBC substrate is filled with an encapsulating compound. Terminal pins may be coupled to connection traces on the first face of the first DBC substrate. More than two DBC substrates may be stacked to form a stacked power semiconductor package.
1. A power semiconductor package, comprising:
a first direct bonded copper (DBC) substrate having a plurality of connection traces on a first face of the first DBC substrate;
a plurality of die, each die comprising a first face coupled to one of the connection traces of the first face of the first DBC substrate; and
a second DBC substrate having a plurality of connection traces on a first face of the second DBC substrate;
wherein a second face of each of the plurality of die is coupled to one of the connection traces of the first face of the second DBC substrate; and
wherein the connection traces on the first face of the second DBC substrate are thinner than the connection traces on the first face of the first DBC substrate.
2. The power semiconductor package of claim 1 , further comprising a silicone gel encapsulating compound filling a cavity between the first face of the first DBC substrate and the first face of the second DBC substrate.
3. The power semiconductor package of claim 1 , further comprising a plurality of terminal pins, each terminal pin coupled to one of the connection traces of the first face of the first DBC substrate.
4. The power semiconductor package of claim 1 , wherein the first face of each die is coupled to the first face of the first DBC substrate using a sintering paste.
5. The power semiconductor package of claim 4 , wherein the sintering paste is a silver sintering paste.
6. The power semiconductor package of claim 1 , wherein the second face of each die is coupled to the first face of the second DBC substrate using a sintering paste.
7. The power semiconductor package of claim 6 , wherein the sintering paste is a silver sintering paste.
8. The power semiconductor package of claim 1 , wherein the first DBC substrate is a double-sided DBC substrate comprising a ceramic plate sandwiched between a first copper layer and a second copper layer, the first copper layer comprising the connection traces of the first DBC substrate.
9. The power semiconductor package of claim 1 , wherein the second DBC substrate is a double-sided DBC substrate comprising a ceramic plate sandwiched between a first copper layer and a second copper layer, the first copper layer comprising the connection traces of the second DBC substrate.
10. The power semiconductor package of claim 1 , wherein the power semiconductor package comprises no wirebonds.
11. A power semiconductor package, comprising:
a first direct bonded copper (DBC) substrate having a plurality of connection traces on a first face of the first DBC substrate;
a first plurality of die, each die comprising a first face coupled to one of the connection traces of the first face of the first DBC substrate; and
a second DBC substrate having a plurality of connection traces on a first face of the second DBC substrate and on a second face of the second DBC substrate, wherein a second face of each of the first plurality of die is coupled to one of the connection traces of the first face of the second DBC substrate;
a second plurality of die, each die comprising a first face coupled to one of the connection traces of the second face of the second DBC substrate; and
a third DBC substrate having a plurality of connection traces on a first face of the third DBC substrate, wherein a second face of each of the second plurality of die is coupled to one of the connection traces of the first face of the third DBC substrate.
12. The power semiconductor package of claim 11 , further comprising an encapsulating compound filling a cavity between the first face of the first DBC substrate and the first face of the second DBC substrate, and filling a cavity between the second face of the second DBC substrate and the first face of the third DBC substrate with an encapsulating compound.
13. The power semiconductor package of claim 11 , further comprising a third plurality of die, each die comprising a first face coupled with one of a plurality of connection traces of a second face of the third DBC substrate.
14. The power semiconductor package of claim 1 , wherein the first face and second face of each die of the first plurality of die and the first face and second face of the each die of the second plurality of die is coupled to one of the first DBC substrate, the second DBC substrate, and the third DBC substrate using a sintering paste.
15. The power semiconductor package of claim 14 , wherein the sintering paste is a silver sintering paste.
16. The power semiconductor package of claim 11 , wherein the first DBC substrate is a double-sided DBC substrate comprising a ceramic plate sandwiched between a first copper layer and a second copper layer.
17. The power semiconductor package of claim 11 , wherein the second DBC substrate is a double-sided DBC substrate comprising a ceramic plate sandwiched between a first copper layer and a second copper layer.
18. The power semiconductor package of claim 11 , wherein the third DBC substrate is a double-sided DBC substrate comprising a ceramic plate sandwiched between a first copper layer and a second copper layer.
19. The power semiconductor package of claim 11 , wherein the power semiconductor package comprises no wirebonds.