Methods of manufacturing stacked semiconductor die assemblies with high efficiency thermal paths
View Patent ↗Method for packaging a semiconductor die assemblies. In one embodiment, a method is directed to packaging a semiconductor die assembly having a first die and a plurality of second dies arranged in a stack over the first die, wherein the first die has a peripheral region extending laterally outward from the stack of second dies. The method can comprise coupling a thermal transfer structure to the peripheral region of the first die and flowing an underfill material between the second dies. The underfill material is flowed after coupling the thermal transfer structure to the peripheral region of the first die such that the thermal transfer structure limits lateral flow of the underfill material.
1. A method of packaging a semiconductor die assembly, comprising:
positioning at least a portion of a thermal transfer structure at a peripheral region of a first die, wherein a plurality of second dies are arranged in a stack and attached to the first die, wherein the peripheral region extends laterally outward from the stack of second dies, wherein the thermal transfer structure comprises a thermally conductive material including a sidewall, a top integrally formed with the sidewall, a cavity formed by the sidewall and the top, an inlet, and an outlet, and wherein
the inlet is a first passageway through a lower area of the sidewall and the outlet is a second passageway through an upper area of the sidewall;
the sidewall has a foundation configured to surround at least a portion of the first die and a shoulder configured to be positioned over the peripheral region of the first die; and
positioning the thermal transfer structure at the peripheral region of the first die comprises attaching the foundation to a package support substrate and attaching the shoulder to the peripheral region of the first die, wherein the stack of second dies is in the cavity; and
flowing an underfill material between the second dies after positioning the thermal transfer structure at the peripheral region of the first die, wherein the underfill material extends laterally from the stack of second dies, wherein the lateral extension of the underfill material is limited by the thermal transfer structure, and wherein flowing the underfill material between the second dies comprises injecting the underfill material into the cavity via the inlet.
2. The method of claim 1 wherein the method further comprises exhausting a portion of the underfill material from the cavity via the outlet and plugging the outlet.
3. The method of claim 1 wherein the inlet and the outlet are laterally offset from each other.
4. The method of claim 1 wherein the underfill material contacts sides of the second dies.
5. A method of packaging a semiconductor dies assembly, comprising:
positioning at least a portion of a thermal transfer structure at a peripheral region of a first die, wherein a plurality of second dies are arranged in a stack and attached to the first die, wherein the peripheral region extends laterally outward from the stack of second dies, wherein the thermal transfer structure comprises a thermally conductive material including a sidewall, a top integrally formed with the sidewall, a cavity formed by the sidewall and the top, an inlet, and an outlet, and wherein
the inlet and the outlet extend through the sidewall at substantially the same elevation;
the sidewall has a foundation configured to surround at least a portion of the first die and a shoulder configured to be positioned over the peripheral region of the first die; and
positioning the thermal transfer structure at the peripheral region of the first die comprises attaching the foundation to a package support substrate and attaching the shoulder to the peripheral region of the first die, wherein the stack of second dies is in the cavity; and
flowing an underfill material between the second dies after positioning the thermal transfer structure at the peripheral region of the first die, wherein the underfill material extends laterally from the stack of second dies, wherein the lateral extension of the underfill material is limited by the thermal transfer structure, and wherein flowing the underfill material between the second dies comprises injecting the underfill material into the cavity via the inlet.