Inspection device and inspection system
An inspection device includes an illumination unit for illuminating a subject having a bright part and a dark part darker than the bright part, a light path dividing unit for dividing object light from the subject illuminated by the illumination unit into first light and second light that pass through different light paths, a filter for reducing the amount of the first light having passed through the light path dividing unit, a first imaging unit in which the first light having passed through the filter forms an image, a second imaging unit in which the second light having passed through the light path dividing unit forms an image, and an inspection unit for inspecting whether a defect is present in the subject based on information of the bright part taken by the first imaging unit and information of the dark part taken by the second imaging unit.
1. An inspection device comprising:
an illumination unit for illuminating a subject having a bright part and a dark part darker than the bright part;
a light path dividing unit for dividing light from the subject illuminated by the illumination unit into first light and second light that pass through different light paths;
a filter for reducing the intensity of the first light having passed through the light path dividing unit;
a detection unit for capturing a combined image of an image of the bright part and an image of the dark part, the detection unit including
a first imaging unit in which the first light having passed through the filter forms the image of the bright part;
a second imaging unit in which the second light having passed through the light path dividing unit forms the image of the dark part; and
an inspection unit for inspecting whether a defect is present in the subject based on the combined image, wherein defects on the bright part and the dark part of the subject are inspected.
2. The inspection device according to claim 1 , further comprising:
a holding unit on which the subject is rotatably placed, wherein each of the first imaging unit and the second imaging unit includes a plurality of optoelectronic conversion devices disposed linearly.
3. The inspection device according to claim 1 , wherein the light path dividing unit has a prism including a beam splitter.
4. The inspection device according to claim 1 , wherein the light path dividing unit has a reflection member including a first reflection surface and a second reflection surface adjacent to each other, the first reflection surface and the second reflection surface being inclined at angles different from each other.
5. The inspection device according to claim 1 , further comprising:
an image processing unit for combining the image of the bright part taken by the first imaging unit with the image of the dark part taken by the second imaging unit; and
a display unit for displaying an image processed by the image processing unit.
6. An inspection system comprising:
a substantially discoid rotor body rotatable about a shaft;
a table rotatably supporting the subject by an outer rim of the rotor body;
a cap pressing the subject from above; and
the inspection device according to claim 1 for inspecting the subject placed on the table.
7. The inspection device according to claim 1 , wherein the inspection unit inspects the image from the first imaging unit to determine whether a defect is present in the bright part of the subject.
8. The inspection device according to claim 1 , wherein the inspection unit inspects the image from the second imaging unit to determine whether a defect is present in the dark part of the subject.