IP Library › Granted Patent US 12,549,861
Granted Patent B2
US 12,549,861 · App. 18/228,217 · Granted Feb 10, 2026

Part surface inspection and illumination system

Inventors: Younkoo Jeong (Clifton Park, NY); Ambarish J. Kulkarni (Glenville, NY); Vamshi Krishna Reddy Kommareddy (Bangalore, IN); Jonathan R. Hootman (West Chester, OH); Jean-Philippe Choinière (Orford, CA); Marc-André Blouin (Ste-Catherine, CA); Andrew Crispin Graham (Badminton, GB); Byron Andrew Pritchard (Loveland, OH)
Assignees: General Electric Company; Oliver Crispin Robotics Limited
H04N23/74H04N23/56H04N23/71H04N23/90
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Quick Facts
Patent No.
US 12,549,861
App. No.
18/228,217
Granted
Feb 10, 2026
Kind
B2
Abstract

An inspection system is provided. The inspection system includes a light source and a surface profile compensator. The light source illuminates a contoured surface of a part. The surface profile compensator causes light emitted from the light source to be distributed over an inspection area of the contoured surface according to a target light distribution.

Claims (64)

1 . An inspection system comprising:

at least one light source that illuminates a contoured surface of a part being inspected; and

a surface profile compensator for the light source,

wherein the surface profile compensator causes light emitted from the at least one light source to be distributed over an inspection area of the contoured surface according to a target light distribution,

wherein the surface profile compensator comprises a support structure to which the light source is coupled, wherein the support structure is physically configured to complement contours of the contoured surface to distribute the light over the inspection area according to the target light distribution,

wherein the support structure includes a first support, a second support, and a bridge, wherein the bridge includes the light source and an optical path slot for a camera to view the inspection area through the support structure, is pivotably coupled to the first support, and is removably coupled to the second support to span over the inspection area.

2 . The inspection system of claim 1 further comprising a controller electrically coupled to the light source,

wherein the controller acts as the surface profile compensator by adjusting an intensity of the light source at different locations to distribute the light over the inspection area according to the target light distribution.

3 . The inspection system of claim 2 wherein the controller receives user input identifying a shape of the contoured surface and that, responsive to the user input, adjusts the intensity of the light source at the different locations based on the user input.

4 . The inspection system of claim 2 further comprising a camera that captures images of the contoured surface, wherein the controller receives the images, parses the images to identify regions of the inspection area where the light is distributed contrary to the target light distribution, and adjusts the intensity of the light source at the different locations to correct light distribution in the identified regions to conform to the target light distribution.

5 . The inspection system of claim 1 further comprising one or more actuators that actively deform the support structure to complement the contours of the contoured surface.

6 . An inspection system comprising:

at least one light source that illuminates a contoured surface of a part being inspected; and

a surface profile compensator for the light source,

wherein the surface profile compensator causes light emitted from the at least one light source to be distributed over an inspection area of the contoured surface according to a target light distribution,

wherein the surface profile compensator comprises a support structure to which the light source is coupled, wherein the support structure is physically configured to complement contours of the contoured surface to distribute the light over the inspection area according to the target light distribution,

further comprising one or more actuators that actively deform the support structure to complement the contours of the contoured surface, and

further comprising one or more distance sensors associated with each of the one or more actuators, wherein each of the one or more distance sensors measure a respective current distance to the contoured surface, and wherein a controller directs each of the one or more actuators to deform the support structure such that the respective current distance as measured by each of the one or more distance sensors are within a predetermined range of each other.

7 . An inspection system comprising:

at least one light source that illuminates a contoured surface of a part being inspected; and

a surface profile compensator for the light source,

wherein the surface profile compensator causes light emitted from the at least one light source to be distributed over an inspection area of the contoured surface according to a target light distribution,

wherein the surface profile compensator comprises a support structure to which the light source is coupled, wherein the support structure is physically configured to complement contours of the contoured surface to distribute the light over the inspection area according to the target light distribution,

further comprising one or more actuators that actively deform the support structure to complement the contours of the contoured surface, and

further comprising a controller that receives user input identifying a shape of the contoured surface and that, responsive to the user input, directs the one or more actuators to deform the support structure to complement the shape of the contoured surface based on the user input.

8 . An inspection system comprising:

at least one light source that illuminates a contoured surface of a part being inspected;

a surface profile compensator for the light source,

wherein the surface profile compensator causes light emitted from the at least one light source to be distributed over an inspection area of the contoured surface according to a target light distribution,

wherein the surface profile compensator comprises a support structure to which the light source is coupled, wherein the support structure is physically configured to complement contours of the contoured surface to distribute the light over the inspection area according to the target light distribution,

further comprising one or more actuators that actively deform the support structure to complement the contours of the contoured surface, further comprising:

a camera that captures images of the contoured surface; and

a processor that receives the images, parses the images to identify regions of the inspection area where the light is distributed contrary to the target light distribution, and directs ones of the one or more actuators associated with the regions to deform the support structure to correct light distribution in the identified regions to conform to the target light distribution.

9 . An inspection system comprising:

at least one light source that illuminates a contoured surface of a part being inspected; and

a surface profile compensator for the light source,

wherein the surface profile compensator causes light emitted from the at least one light source to be distributed over an inspection area of the contoured surface according to a target light distribution,

wherein the surface profile compensator comprises a support structure to which the light source is coupled, wherein the support structure is physically configured to complement contours of the contoured surface to distribute the light over the inspection area according to the target light distribution,

wherein the support structure is formed from a pliable material that conforms in part to a shape of the contoured surface when the support structure contacts the contoured surface.

10 . An inspection system comprising:

at least one light source that illuminates a contoured surface of a part being inspected; and

a surface profile compensator for the light source,

wherein the surface profile compensator causes light emitted from the at least one light source to be distributed over an inspection area of the contoured surface according to a target light distribution,

further comprising a controller electrically coupled to the light source,

wherein the controller acts as the surface profile compensator by adjusting an intensity of the light source at different locations to distribute the light over the inspection area according to the target light distribution,

further comprising one or more distance sensors associated with different lighting elements of the light source, wherein each of the one or more distance sensors measures a respective current distance to the contoured surface, and wherein the controller adjusts the intensity of the light source by modifying respective light output from the different lighting elements based on the respective current distance as measured by each of the one or more distance sensors.

11 . A method of illuminating an inspection area of a part being inspected, the method comprising:

determining a contoured shape of the inspection area; and

adjusting, via a surface profile compensator, light emitted from a light source to be distributed over the inspection area based on the contoured shape and a target light distribution,

wherein the surface profile compensator includes a support structure for the light source that physically deforms to complement the contoured shape of the inspection area,

wherein the support structure includes a first support, a second support, and a bridge, wherein the bridge includes the light source and an optical path slot for a camera to view the inspection area through the support structure, is pivotably coupled to the first support, and is removably coupled to the second support to span over the inspection area.

12 . The method of claim 11 wherein the surface profile compensator includes a controller that alters an amount of light output by different lighting elements of the light source at different locations to distribute the light over the inspection area based on the determination of the contoured shape.

13 . The method of claim 12 , wherein the controller receives user input identifying the contoured shape and that, responsive to the user input, adjusts an intensity of the light source at the different locations based on the user input.

14 . The method of claim 11 further comprising one or more actuators that actively deform the support structure to complement the contoured shape of the inspection area.

15 . A method of illuminating an inspection area of a part being inspected, the method comprising:

determining a contoured shape of the inspection area; and

adjusting, via a surface profile compensator, light emitted from a light source to be distributed over the inspection area based on the contoured shape and a target light distribution,

wherein the surface profile compensator includes a controller that alters an amount of light output by different lighting elements of the light source at different locations to distribute the light over the inspection area based on the determination of the contoured shape,

wherein the controller adjusts an intensity of the light source by modifying respective light output from the different lighting elements based on a respective current distance of each of the different lighting elements to the inspection area as measured by each of one or more distance sensors respectively associated with each of the different lighting element.

16 . A method of illuminating an inspection area of a part being inspected, the method comprising:

determining a contoured shape of the inspection area; and

adjusting, via a surface profile compensator, light emitted from a light source to be distributed over the inspection area based on the contoured shape and a target light distribution,

wherein the surface profile compensator includes a support structure for the light source that physically deforms to complement the contoured shape of the inspection area, further comprising one or more actuators that actively deform the support structure to complement the contoured shape of the inspection area,

further comprising one or more distance sensors associated with each of the one or more actuators, wherein each of the one or more distance sensors measure a respective current distance to the inspection area, and wherein a controller directs each of the one or more actuators to deform the support structure such that the respective current distance as measured by each of the one or more distance sensors are within a predetermined range of each other.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 31, 2023
From: JEONG, YOUNKOO; KULKARNI, AMBARISH J.; KOMMAREDDY, VAMSHI KRISHNA REDDY; HOOTMAN, JONATHAN R.; CHOINIERE, JEAN-PHILIPPE; BLOUIN, MARC-ANDRE; PRITCHARD, BYRON ANDREW
To: GENERAL ELECTRIC COMPANY
Reel/Frame 064437/0772 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 31, 2023
From: GRAHAM, ANDREW CRISPIN
To: OLIVER CRISPIN ROBOTICS LIMITED
Reel/Frame 064437/0806 →
Priority Claims (1)
IN 202311033934 · May 15, 2023 · national
Continuity (1)
Related Publication 20240388806A1 · Nov 21, 2024
References Cited (14)
US 10408766B2 · Okada · 2019 [cited by applicant]
US 10869020B2 · Schmidt · 2020 [cited by applicant]
US 20070097686A1 · Dunn · 2007 [cited by examiner]
US 20200340929A1 · Chehaiber · 2020 [cited by examiner]
US 20230062347A1 · Nguyen · 2023 [cited by examiner]
CN 110596128 · 2019 [cited by applicant]
CN 111649697 · 2020 [cited by applicant]
DE 102005021783 · 2006 [cited by applicant]
DE 102022208804 · 2023 [cited by applicant]
EP 3693927 · 2020 [cited by applicant]
JP 3236132B2 · 2001 [cited by applicant]
JP 2016109462 · 2016 [cited by applicant]
JP 2016109462A · 2016 [cited by examiner]
JP 3236132U · 2022 [cited by applicant]