IP Library Granted Patent US 11,524,390
Granted Patent B2
US 11,524,390 · App. 15/583,037 · Granted Dec 13, 2022

Methods of making chemical mechanical polishing layers having improved uniformity

Inventors: Bainian Qian (Newark, DE); George C. Jacob (Newark, DE); Andrew Wank (Avondale, PA); David Shidner (Wilmington, DE); Kancharla-Arun K. Reddy (Wilmington, DE); Donna Marie Alden (Bear, DE); Marty W. DeGroot (Middletown, DE)
Assignee: Rohm and Haas Electronic Materials CMP Holdings, Inc.
B24D18/0009B24D3/28B24B37/24
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Quick Facts
Patent No.
US 11,524,390
App. No.
15/583,037
Granted
Dec 13, 2022
Kind
B2
Abstract

The present invention provides methods of manufacturing a chemical mechanical polishing (CMP polishing) layer for polishing substrates, such as semiconductor wafers comprising providing a composition of a plurality of liquid-filled microelements having a polymeric shell; classifying the composition via centrifugal air classification to remove fines and coarse particles and to produce liquid-filled microelements having a density of 800 to 1500 g/liter; and, forming the CMP polishing layer by (i) converting the classified liquid-filled microelements into gas-filled microelements by heating them, then mixing them with a liquid polymer matrix forming material and casting or molding the resulting mixture to form a polymeric pad matrix, or (ii) combining the classified liquid-filled microelements directly with the liquid polymer matrix forming material, and casting or molding.

Claims (47)

1. A method of manufacturing a chemical mechanical polishing (CMP polishing) layer for polishing a substrate selected from at least one of a magnetic substrate, an optical substrate and a semiconductor substrate, comprising:

providing a raw composition of a plurality of liquid-filled microelements having a polymeric shell, the raw composition forming 100 μm blowout holes when casting in polyurethane and a coarse fraction of the new composition forming interconnected pores when casting in polyurethane;

classifying the raw composition via a Coanda block air classifier to remove fines and coarse particles from the raw composition of the plurality of liquid-filled microelements to produce classified liquid-filled microspheres, and the classified liquid-filled microspheres having a density of 800 to 1500 g/liter and an average particle size of 3 to 30 μm and to lower an open cell content in the polishing layer, the open cell content defined as follows:

Open

cell

content

=

(

1

-

Pycnometer

volume

Dimensional

volume

)

×

100

%

=

(

1

-

Dimensional

density

Pycnometer

density

)

×

100

%

;

and,

forming the CMP polishing layer by

combining the classified liquid-filled microspheres with a liquid polymer matrix forming material having a gel time of from 1 to 30 minutes at a casting or molding temperature of from 25 to 125° C. to form a pad forming mixture and casting or molding the pad forming mixture to form a polymeric pad matrix at the casting or molding temperature, and allowing the reaction exotherm to convert the liquid-filled microspheres to gas-filled microspheres and the gas-filled microelements have a density of 10 to 100 g/liter and the polishing layer is free of 100 μm blowout holes and interconnected pores.

2. The method as claimed in claim 1 , wherein the classified liquid-filled microspheres have a density of from 950 to 1300 g/liter.

3. The method as claimed in claim 1 , wherein the classifying removes from 2 to 20 wt. % from the raw composition of the plurality of the liquid-filled microspheres, comprising from 1 to 10 wt. % of the composition as fine particles and from 1 to 10 wt. % of the composition as coarse particles.

4. The method as claimed in claim 1 , wherein the classifying removes from 2 to 12 wt. % of the composition from the raw composition of the plurality of liquid-filled microspheres, comprising from 1 to 6 wt. % of the composition as fine particles and from 1 to 6 wt. % of the composition as coarse particles.

5. The method as claimed in claim 1 , wherein the resulting composition of classified liquid-filled microspheres is substantially free of silica, magnesia and other alkaline earth metal oxides.

6. The method as claimed in claim 1 , wherein the polymeric shell of the liquid-filled microspheres comprises polymers chosen from poly(meth)acrylonitrile, poly(vinylidene chloride), poly(methyl methacrylate), poly (isobornyl acrylate), polystyrene, copolymers thereof with each other, copolymers thereof with vinyl halide monomers, copolymers thereof with C 1 to C 4 alkyl (meth)acrylates, copolymers thereof with C 2 to C 4 hydroxyalkyl (meth)acrylates, or acrylonitrile-methacrylonitrile copolymers.

Assignments (6)
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 073515/0243 →
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 073517/0298 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 17, 2024
From: DOW GLOBAL TECHNOLOGIES LLC
To: THE DOW CHEMICAL COMPANY
Reel/Frame 068971/0226 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 17, 2024
From: THE DOW CHEMICAL COMPANY
To: DDP SPECIALTY ELECTRONIC MATERIALS US, INC
Reel/Frame 068971/0362 →
CHANGE OF LEGAL ENTITY Recorded Sep 17, 2024
From: DDP SPECIALTY ELECTRONIC MATERIALS US, INC
To: DDP SPECIALTY ELECTRONIC MATERIALS US, LLC
Reel/Frame 068972/0210 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 21, 2018
From: QIAN, BAINIAN; WANK, ANDREW; SHIDNER, DAIVD; REDDY, KANCHARLA-ARUN K.; ALDEN, DONNA MARIE; JACOB, GEORGE C.; DEGROOT, MARTY W.
To: ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC.; DOW GLOBAL TECHNOLOGIES LLC
Reel/Frame 044683/0050 →
Continuity (1)
Related Publication 20180311792A1 · Nov 1, 2018