IP Library Granted Patent US 9,935,185
Granted Patent B2
US 9,935,185 · App. 15/584,851 · Granted Apr 3, 2018

Superlattice lateral bipolar junction transistor

Inventors: Karthik Balakrishnan (White Plains, NY); Stephen W. Bedell (Wappingers Falls, NY); Pouya Hashemi (White Plains, NY); Bahman Hekmatshoartabari (White Plains, NY); Alexander Reznicek (Troy, NY)
Assignee: International Business Machines Corporation
H01L29/735H01L21/02507H01L21/8249H01L29/06H01L29/0821H01L29/6625H01L29/66234
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,935,185
App. No.
15/584,851
Granted
Apr 3, 2018
Kind
B2
Abstract

A bipolar junction transistor includes an intrinsic base formed on a substrate. The intrinsic base includes a superlattice stack including a plurality of alternating layers of semiconductor material. A collector and emitter are formed adjacent to the intrinsic base on opposite sides of the base. An extrinsic base structure is formed on the intrinsic base.

Claims (13)

1. A method for forming a bipolar junction transistor, comprising:

depositing a superlattice stack including a plurality of alternating layers of semiconductor material on a substrate;

patterning an extrinsic base on the superlattice stack;

etching an intrinsic base in the superlattice stack; and

growing a collector and emitter adjacent to the intrinsic base on opposite sides of the intrinsic base from a seed layer that includes a portion of a layer of the plurality of alternating layers.

2. The method as recited in claim 1 , wherein the superlattice stack includes alternating layers of Si and Ge.

3. The method as recited in claim 1 , wherein the superlattice stack is deposited on a strained semiconductor layer.

4. The method as recited in claim 3 , further comprising adjusting a mass valiance to increase thermal conductivity of the strained semiconductor layer by isotope enrichment of the strained semiconductor layer.

5. The method as recited in claim 1 , further comprising adjusting a mass variance to increase thermal conductivity of the superlattice stack by isotope enrichment of the superlattice stack.

6. The method as recited in claim 1 , wherein the superlattice stack includes alternating materials in the alternating layers.

7. The method as recited in claim 1 , wherein the substrate is an extremely thin semiconductor-on-insulator (ETSOI) substrate.

8. The method as recited in claim 7 , wherein a semiconductor layer of the ETSOI substrate forms a layer of the superlattice stack.

9. The method as recited in claim 1 , wherein the alternating layers are lattice mismatched to each other.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 13, 2020
From: INTERNATIONAL BUSINESS MACHINES CORPORATION
To: ELPIS TECHNOLOGIES INC.
Reel/Frame 052644/0868 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 2, 2017
From: BALAKRISHNAN, KARTHIK; BEDELL, STEPHEN W.; HASHEMI, POUYA; HEKMATSHOARTABARI, BAHMAN; REZNICEK, ALEXANDER
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 042214/0168 →
Continuity (2)
Division 14978430 · Dec 22, 2015
Related Publication 20170236924A1 · Aug 17, 2017