IP Library Granted Patent US 10,008,540
Granted Patent B2
US 10,008,540 · App. 15/586,638 · Granted Jun 26, 2018

Spin-orbitronics device and applications thereof

Inventors: Parviz Keshtbod (Los Altos Hills, CA); Xiaobin Wang (Fremont, CA); Kimihiro Satoh (Fremont, CA); Zihui Wang (Milpitas, CA); Huadong Gan (Fremont, CA)
Assignee: Avalanche Technology, Inc.
H01L27/228H01L43/08
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Quick Facts
Patent No.
US 10,008,540
App. No.
15/586,638
Granted
Jun 26, 2018
Kind
B2
Abstract

The present invention is directed to a spin-orbitronics device including an array of MTJs with each of the MTJs coupled to a respective one of a plurality of selection transistors; a plurality of transverse polarizing lines with each of the transverse polarizing lines coupled to a row of the MTJs along a first direction; a plurality of word lines with each of the word lines coupled to gates of a row of the selection transistors along a second direction; and a plurality of source lines with each of the source lines coupled to a row of the selection transistors along a direction substantially perpendicular to the second direction. Each MTJ includes a magnetic comparison layer structure having a pseudo-invariable magnetization direction, which is configured to switch between two stable states by passing a comparison current through one of the plurality of transverse polarizing lines formed adjacent to the magnetic comparison layer structure.

Claims (32)

1. A spin-orbitronics device comprising:

an array of magnetic tunnel junctions (MTJs) with each of said MTJs coupled to a respective one of a plurality of selection transistors;

a plurality of transverse polarizing lines with each of said transverse polarizing lines coupled to a row of said MTJs along a first direction;

a plurality of word lines with each of said word lines coupled to gates of a row of said selection transistors along a second direction; and

a plurality of conductive lines that function as bit lines or source lines, each of said conductive lines coupled to a row of said selection transistors along a direction that is substantially perpendicular to said second direction,

wherein each of said MTJs comprises:

a magnetic comparison layer structure having a pseudo-invariable magnetization direction formed adjacent to a respective one of said transverse polarizing lines, said pseudo-invariable magnetization direction being switched between two stable states by passing a comparison current through said respective one of said transverse polarizing lines along a direction that is substantially parallel to said transverse polarizing lines;

a magnetic free layer structure having a variable magnetization direction that is switched by a switching current passing between said magnetic comparison layer structure and said magnetic free layer structure; and

an insulating tunnel junction layer interposed between said magnetic comparison layer structure and said magnetic free layer structure.

2. The spin-orbitronics device of claim 1 , wherein said first direction and said second direction are substantially perpendicular to each other.

3. The spin-orbitronics device of claim 1 , wherein said first direction and said second direction are substantially parallel to each other.

4. The spin-orbitronics device of claim 1 , wherein said transverse polarizing lines is made of a heavy metal.

5. The spin-orbitronics device of claim 1 , wherein said transverse polarizing lines is made of a topological insulator.

6. The spin-orbitronics device of claim 1 , wherein said magnetic comparison layer structure has a higher coercivity than said magnetic free layer structure.

7. The spin-orbitronics device of claim 1 , wherein said pseudo-invariable magnetization direction of said magnetic comparison layer structure and said variable magnetization direction of said magnetic free layer structure are substantially parallel to layer planes thereof.

8. The spin-orbitronics device of claim 1 , wherein each of said MTJs further comprises a magnetic field layer structure having an in-plane invariable magnetization direction separated from said magnetic free layer structure by a non-magnetic spacer layer.

9. The spin-orbitronics device of claim 1 , wherein each of said MTJs further comprises a magnetic field layer structure having an in-plane invariable magnetization direction formed adjacent to said respective one of said transverse polarizing lines opposite said magnetic comparison layer structure.

10. A spin-orbitronics device comprising:

an array of magnetic tunnel junctions (MTJs) with each of said MTJs coupled to a respective one of a plurality of selection transistors;

a plurality of transverse polarizing lines with each of said transverse polarizing lines coupled to a row of said MTJs along a first direction;

a plurality of word lines with each of said word lines coupled to gates of a row of said selection transistors along a second direction; and

a plurality of conductive lines that function as bit lines or source lines, each of said conductive lines coupled to a row of said selection transistors along a direction that is substantially perpendicular to said second direction,

wherein each of said MTJs comprises:

a magnetic comparison layer structure having a pseudo-invariable magnetization direction formed adjacent to a respective one of said transverse polarizing lines, said pseudo-invariable magnetization direction being switched by passing a comparison current through said respective one of said transverse polarizing lines along a direction that is substantially parallel to said transverse polarizing lines;

a magnetic free layer structure having a variable magnetization direction that is switched by a switching current passing between said magnetic comparison layer structure and said magnetic free layer structure; and

an insulating tunnel junction layer interposed between said magnetic comparison layer structure and said magnetic free layer structure,

wherein said pseudo-invariable magnetization direction is substantially perpendicular to a layer of said magnetic comparison layer structure and said variable magnetization direction is substantially perpendicular to a layer of said magnetic free layer structure.

11. The spin-orbitronics device of claim 10 , wherein said first direction and said second direction are substantially perpendicular to each other.

12. The spin-orbitronics device of claim 10 , wherein said transverse polarizing lines is made of a heavy metal.

13. The spin-orbitronics device of claim 10 , wherein said transverse polarizing lines is made of a topological insulator.

14. The spin-orbitronics device of claim 10 , wherein said magnetic comparison layer structure has a higher coercivity than said magnetic free layer structure.

15. The spin-orbitronics device of claim 10 , wherein each of said MTJs further comprises a magnetic field layer structure having an in-plane invariable magnetization direction separated from said magnetic free layer structure by a non-magnetic spacer layer.

Assignments (6)
SECURITY INTEREST Recorded Mar 18, 2022
From: AVALANCHE TECHNOLOGY, INC.
To: STRUCTURED ALPHA LP
Reel/Frame 059436/0203 →
SECURITY INTEREST Recorded Apr 19, 2021
From: AVALANCHE TECHNOLOGY, INC.
To: STRUCTURED ALPHA LP
Reel/Frame 057213/0050 →
SECURITY INTEREST Recorded Apr 19, 2021
From: AVALANCHE TECHNOLOGY, INC.
To: STRUCTURED ALPHA LP
Reel/Frame 057217/0674 →
SECURITY INTEREST Recorded Jul 8, 2020
From: AVALANCHE TECHNOLOGY, INC.
To: SILICON VALLEY BANK
Reel/Frame 053156/0223 →
SECURITY INTEREST Recorded Feb 13, 2020
From: AVALANCHE TECHNOLOGY, INC.
To: STRUCTURED ALPHA LP
Reel/Frame 051930/0396 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 4, 2017
From: KESHTBOD, PARVIZ; WANG, XIAOBIN; SATOH, KIMIHIRO; WANG, ZIHUI; GAN, HUADONG
To: AVALANCHE TECHNOLOGY, INC.
Reel/Frame 042240/0558 →
Continuity (3)
Division 14831546 · Aug 20, 2015
Provisional Application 62042623 · Aug 27, 2014
Related Publication 20170236868A1 · Aug 17, 2017