IP Library Granted Patent US 10,054,483
Granted Patent B1
US 10,054,483 · App. 15/610,998 · Granted Aug 21, 2018

Micromirror spectrophotometer assembly

Inventors: Jerome J. Workman, Jr. (Marlborough, MA); John Coates (Newtown, CT); David Naranjo (Dracut, MA)
Assignee: WESTCO SCIENTIFIC INSTRUMENTS, INC
G01J3/021G01J3/18G01J3/28G01J2003/2866
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Quick Facts
Patent No.
US 10,054,483
App. No.
15/610,998
Granted
Aug 21, 2018
Kind
B1
Abstract

Aspects of a micromirror spectrophotometer assembly are described. In one example case, an instrument includes a diffraction grating to disperse broadband light over a range of wavelengths, a detector, a digital micromirror device (DMD) configured to scan through and reflect at least a portion of the range of wavelengths toward the detector, and a base platform having a number of integrally formed assembly mounts. The assembly mounts are formed to align and secure the diffraction grating, the detector, the DMD, and other optical components of the instrument in a predetermined arrangement. The instrument can also include a reference paddle having a reference material for calibration of the instrument, and a rotatable sample tray to rotate a sample placed on the sample tray for measurement.

Claims (58)

1. An instrument, comprising:

a diffraction grating to disperse broadband light over a range of wavelengths;

a detector;

a digital micromirror device (DMD) configured to scan through and reflect at least a portion of the range of wavelengths toward the detector; and

a plurality of assembly mounts integrally formed as a base platform to align and secure the diffraction grating, the detector, the DMD, and a plurality of optical components of the instrument in a predetermined arrangement, wherein:

the plurality of the assembly mounts comprise a plurality of integral seats to align and secure the plurality of optical components of the instrument in a predetermined arrangement relative to each other and the diffraction grating, the detector, and the DMD; and

the plurality of integral seats are individually separated by a predetermined spacing along at least one optical pathway in the instrument.

2. The instrument of claim 1 , wherein at least one of the plurality of assembly mounts comprises:

a first integral seat formed for a first optical component of a focusing optics assembly; and

a second integral seat for a second optical component of the focusing optics assembly, the first integral seat and the second integral seat being separated by a predetermined spacing along an optical pathway that extends along the at least one of the plurality of assembly mounts.

3. The instrument of claim 1 , wherein:

a first of the plurality of assembly mounts is aligned along a first optical pathway in the instrument;

a second of the plurality of assembly mounts is aligned along a second optical pathway parallel to the first optical pathway in the instrument; and

a third of the plurality of assembly mounts is aligned along a third optical pathway at an angle with respect to at least one of the first optical pathway and the second optical pathway in the instrument.

4. The instrument of claim 3 , wherein:

the plurality of optical components are aligned and secured in the first, second, and third of the plurality of assembly mounts; and

an assembly mount cover is secured over the first, second, and third of the plurality of assembly mounts.

5. The instrument of claim 3 , wherein a fourth of the plurality of assembly mounts is aligned at one end of the first optical pathway to secure a light source and an entrance optics assembly of the instrument.

6. The instrument of claim 5 , wherein a fifth of the plurality of assembly mounts is positioned about an intersection of the first optical pathway and the second optical pathway to secure the diffraction grating.

7. The instrument of claim 6 , wherein:

a sixth of the plurality of assembly mounts is positioned about an intersection of the second optical pathway and the third optical pathway to secure the DMD; and

the sixth of the plurality of assembly mounts includes a number of baffles integral to the base platform.

8. The instrument of claim 1 , wherein the base platform is continuously formed from a single material using an additive manufacturing process.

9. The instrument of claim 1 , further comprising:

a motor comprising a shaft; and

a reference paddle mechanically coupled to the shaft of the motor, wherein:

the reference paddle includes a reference material for calibration of the instrument; and

the motor is configured to rotate the reference paddle to cover a sample window of the instrument for calibration of the instrument.

10. The instrument of claim 1 , further comprising:

a motor comprising a shaft that extends through a sample platform 30 of the instrument; and

a sample tray mechanically coupled to the shaft of the motor, wherein the motor is configured to rotate a sample placed on the sample tray for measurement.

11. A method of assembly for an instrument, comprising:

forming a base platform comprising a plurality of integral assembly mounts;

securing a diffraction grating in a first of the plurality of integral assembly mounts;

securing a digital micromirror device (DMD) in a second of the plurality of integral assembly mounts;

securing a detector in a third of the plurality of integral assembly mounts; and

seating at least one optical component of the instrument in a fourth of the plurality of integral assembly mounts, wherein the diffraction grating, the DMD, the detector, and the at least one optical component are aligned and secured in a predetermined arrangement based on relative positions of the plurality of integral assembly mounts of the base platform.

12. The method of assembly for the instrument of claim 11 , further comprising installing a cover over the base platform.

13. The method of assembly for the instrument of claim 11 , further comprising installing an assembly mount cover over the fourth of the plurality of integral assembly mounts.

14. The method of assembly for the instrument of claim 11 , wherein:

the first of the plurality of integral assembly mounts is aligned along a first optical pathway in the instrument; and

the second of the plurality of integral assembly mounts is aligned along a second optical pathway parallel to the first optical pathway in the instrument.

15. The method of assembly for the instrument of claim 11 , wherein forming the base platform comprises forming the base platform using an additive manufacturing process.

16. An instrument, comprising:

a diffraction grating to disperse broadband light over a range of wavelengths;

a detector;

a digital micromirror device (DMD) configured to scan through and reflect at least a portion of the range of wavelengths toward the detector; and

a plurality of assembly mounts integrally formed as a base platform to align and secure the diffraction grating, the detector, the DMD, and at least one optical component of the instrument in a predetermined arrangement.

17. The instrument of claim 16 , wherein at least one of the plurality of the assembly mounts comprises a seat to align and secure the at least one optical component of the instrument in a predetermined arrangement relative to the diffraction grating, the detector, and the DMD.

18. The instrument of claim 17 , wherein the at least one of the plurality of the assembly mounts comprises:

a first integral seat formed for a first optical component of an optics assembly; and

a second integral seat for a second optical component of the optics assembly, the first integral seat and the second integral seat being separated by a predetermined spacing along an optical pathway in the instrument.

19. The instrument of claim 16 , wherein the base platform is continuously formed from a single material using an additive manufacturing process.

20. The instrument of claim 1 , further comprising:

a motor comprising a shaft; and

a reference paddle mechanically coupled to the shaft of the motor, wherein:

the reference paddle includes a reference material for calibration of the instrument; and

the motor is configured to rotate the reference paddle to cover a sample window of the instrument for calibration of the instrument.

Assignments (7)
PATENT SECURITY AGREEMENT Recorded Feb 13, 2026
From: KPM ANALYTICS NORTH AMERICA CORPORATION
To: CCP AGENCY, LLC, AS ADMINISTRATIVE AGENT
Reel/Frame 074852/0543 →
RELEASE OF SECURITY INTEREST RECORDED AT REEL/FRAME 047989/0327 Recorded Jul 7, 2021
From: CRYSTAL FINANCIAL LLC
To: KPM ANALYTICS NORTH AMERICA CORPORATION (FORMERLY KNOWN AS PROCESS SENSORS CORPORATION)
Reel/Frame 057106/0699 →
SECURITY INTEREST Recorded Jul 2, 2021
From: KPM ANALYTICS NORTH AMERICA CORPORATION (FORMERLY KNOWN AS PROCESS SENSORS CORPORATION)
To: SOUND POINT AGENCY LLC
Reel/Frame 056741/0373 →
CHANGE OF NAME Recorded Jan 22, 2019
From: PROCESS SENSORS CORPORATION
To: KPM ANALYTICS NORTH AMERICA CORPORATION
Reel/Frame 049514/0312 →
MERGER AND CHANGE OF NAME Recorded Jan 22, 2019
From: WESTCO SCIENTIFIC INSTRUMENTS, INC.; PROCESS SENSORS CORPORATION
To: PROCESS SENSORS CORPORATION
Reel/Frame 048093/0794 →
PATENT SECURITY AGREEMENT Recorded Dec 28, 2018
From: KPM ANALYTICS NORTH AMERICA CORPORATION (FORMERLY KNOWN AS PROCESS SENSORS CORPORATION)
To: CRYSTAL FINANCIAL LLC, AS AGENT
Reel/Frame 047989/0327 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 27, 2017
From: WORKMAN, JEROME J., JR.; COATES, JOHN; NARANJO, DAVID
To: WESTCO SCIENTIFIC INSTRUMENTS, INC
Reel/Frame 042830/0476 →
Cited By (1)
US 12,339,234