Apparatuses with compensator lines laid out along wordlines and spaced apart from wordlines by dielectric, compensator lines being independently controlled relative to the wordlines providing increased on-current in wordlines, reduced leakage in coupled transistors and longer retention time in coupled memory cells
View Patent ↗Some embodiments include an apparatus which has a wordline coupled with a transistor gate, and which has a compensator line extending along the wordline and spaced from the wordline by a dielectric region. A driver is coupled with the wordline, and a controller is coupled with the compensator line. The wordline is coupled with access transistors, and is operated at a first voltage while the access transistors are in an OFF state. The compensator line is operated at a second voltage while the wordline is at the first voltage; with the second voltage being greater than the first voltage. The wordline is operated at a third voltage while the access transistors are in an ON state, and the compensator line is operated at a fourth voltage while the wordline is at the third voltage. The third voltage may or may not be greater than the fourth voltage.
1. An apparatus, comprising:
a wordline coupled with access transistors;
a compensator line extending along the wordline, and spaced from the wordline by a dielectric region;
a driver coupled with the wordline and a controller coupled with the compensator line, wherein the compensator line is independently controlled relative to the wordline;
the compensator line, the dielectric region and the wordline together forming a stack;
the stack having a first vertical thickness, the wordline having a second vertical thickness, the compensator line having a third vertical thickness, and the dielectric region having a fourth vertical thickness;
the third vertical thickness being within a range of from about 10% to about 50% of the first vertical thickness;
the first vertical thickness being at least about 50 nm;
the fourth vertical thickness being within a range of from about 0.5% to about 6% of the first vertical thickness;
the wordline being operated at a first voltage by the driver while the access transistors are in an OFF state; and
the compensator line being operated by the controller at a second voltage while the wordline is operated at the first voltage; the second voltage being greater than the first voltage;
wherein the wordline comprises a first conductive material, and the compensator line comprises a second conductive material; wherein the first and second conductive materials comprise a common composition and said common composition includes one or both of tungsten and ruthenium.
2. The apparatus of claim 1 wherein:
the wordline is operated at a third voltage while the access transistors are in an ON state;
the compensator line is operated at the second voltage while the wordline is operated at the third voltage; and
the third voltage is greater than the second voltage.
3. The apparatus of claim 1 wherein:
the wordline is operated at a third voltage while the access transistors are in an ON state;
the compensator line is operated at a fourth voltage while the wordline is operated at the third voltage; and
the third voltage is less than or equal to the fourth voltage.