Operational signals generated from capacitive stored charge
Methods, a memory device, and a system are disclosed. One such method includes applying a select pulse to a snapback device of a memory cell. This causes the memory cell to enter a conductive state. Once in the conductive state, the memory cell can be set or reset by a pulse formed from parasitic capacitive discharge from various paths coupled to the memory cell.
1. A method for a memory operation, the method comprising:
providing a first pulse to a memory cell at a first time using a first portion of a first discharge from a first discharge path;
providing a first portion of a second pulse to the memory cell at a second time, later than the first time, using a second portion of the first discharge from the first discharge path; and
providing a second portion of the second pulse to the memory cell at a third time, later than the second time, using a second discharge from a second discharge path, different from the first discharge path.
2. The method of claim 1 , wherein the first discharge includes a first capacitive discharge, and the second discharge includes a second capacitive discharge.
3. The method of claim 1 , wherein the first discharge includes a first parasitic capacitive discharge.
4. The method of claim 1 , wherein providing the first pulse includes providing a reset pulse, and wherein providing the second pulse includes providing a set pulse.
5. The method of claim 1 , wherein providing the first pulse and the first portion of the second pulse includes using the first discharge from the first discharge path through a first transistor, and
wherein providing the second portion of the second pulse includes using the second discharge from the second discharge path through a second transistor.
6. The method of claim 1 , wherein the first and second portions of the second pulse are sequential portions of a single pulse.
7. The method of claim 1 , including applying a select voltage to a selector device coupled to a memory cell to cause the memory cell to enter a conductive state prior to providing the first and second pulses.
8. The method of claim 7 , wherein the selector device includes a snapback device.
9. A method for a memory operation, the method comprising:
controlling a first transistor using a first control signal to apply a first portion of a first discharge from a first discharge path to provide a first pulse to a memory cell, and to apply a second portion of the first discharge from the first discharge path to provide a first portion of a second pulse to the memory cell; and
controlling a second transistor using the first control signal to apply a second discharge from a second discharge path to provide a second portion of the second pulse to the memory cell.
10. The method of claim 9 , wherein a gate of the first transistor is coupled to a gate of the second transistor.
11. The method of claim 9 , wherein the first discharge includes a first parasitic capacitive discharge, and the second discharge includes a second capacitive discharge.
12. The method of claim 9 , wherein the first pulse includes a reset pulse, and wherein the second pulse includes a set pulse.
13. The method of claim 9 , including applying a select voltage to a selector device coupled to the memory cell to cause the memory cell to enter a conductive state prior to controlling the first and second transistors.
14. The method of claim 13 , wherein the selector device includes a snapback device.
15. The method of claim 9 , wherein the first and second portions of the second pulse are sequential portions of a single pulse.
16. A device comprising:
a memory cell coupled between a data line and an access line; and
operational circuitry coupled to the memory cell, the operational circuitry including:
a first transistor configured to provide a first pulse to the memory cell at a first time using a first portion of a first discharge through a first discharge path, and to provide a first portion of a second pulse to the memory cell at a second time, later than the first time, using a second portion of the first discharge through the first discharge path; and
a second transistor configured to provide a second portion of the second pulse to the memory cell at a third time, later than the second time, using a second discharge through a second discharge path, different from the first discharge path.
17. The device of claim 16 , wherein the device includes:
a controller configured to control the device; and
a selector device configured to receive a select voltage and cause the memory cell to enter a conductive state prior to providing the first and second pulses,
wherein the selector device comprises a snapback device.
18. The device of claim 16 , wherein each of the first and second discharge paths include a respective capacitance, and wherein the first discharge path comprises a parasitic capacitance.
19. The device of claim 16 , wherein the parasitic capacitance comprises one or both of an access line parasitic capacitance or a data line capacitance.
20. The device of claim 16 , wherein the first pulse includes a reset pulse, and wherein the second pulse includes a set pulse.