IP Library Granted Patent US 10,535,564
Granted Patent B2
US 10,535,564 · App. 15/649,457 · Granted Jan 14, 2020

Structures and methods for reliable packages

Inventors: Cyprian Emeka Uzoh (San Jose, CA); Guilian Gao (San Jose, CA); Liang Wang (Milpitas, CA); Hong Shen (Palo Alto, CA); Arkalgud R. Sitaram (Cupertino, CA)
Assignee: Invensas Corporation
H01L21/82H01L21/486H01L21/561H01L23/5389H01L23/562H01L24/96H01L24/97H01L24/98H01L23/3128H01L2924/157H01L2924/15311H01L2924/15313H01L2924/15788H01L2924/3511H01L2924/3512
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Quick Facts
Patent No.
US 10,535,564
App. No.
15/649,457
Granted
Jan 14, 2020
Kind
B2
Abstract

A device and method of forming the device that includes cavities formed in a substrate of a substrate device, the substrate device also including conductive vias formed in the substrate. Chip devices, wafers, and other substrate devices can be mounted to the substrate device. Encapsulation layers and materials may be formed over the substrate device in order to fill the cavities.

Claims (35)

1. A packaged device, comprising:

a substrate device with conductive vias formed in a substrate, the conductive vias extending between a first side and a second side of the substrate;

cavities formed in the substrate with the conductive vias between the cavities;

chip devices mounted at least proximate to the first side of the substrate device for electrical conductivity with the conductive vias, each of the chip devices external to the substrate and to the cavities formed in the substrate such that the cavities in the substrate are located around a perimeter of a chip device of the chip devices; and

an encapsulation layer covering upper and side surfaces of the chip devices and extending into the cavities.

2. The packaged device of claim 1 , wherein the substrate device further includes a redistribution layer in contact with the conductive vias on the first side of the substrate, the redistribution layer interconnecting the chip devices mounted thereon for electrical conductivity with the conductive vias, the cavities extending through the redistribution layer, and the encapsulation layer in contact with a surface of the redistribution layer.

3. The packaged device of claim 2 , wherein the cavities extend to the second side of the substrate to provide isolation between the chip devices and corresponding portions of the substrate and the redistribution layer.

4. The packaged device of claim 1 , wherein the cavities extend from the first side of the substrate toward the second side of the substrate leaving sections of the substrate in place forming corresponding substrate bridges proximate to the second side of the substrate prior to singulation through the cavities.

5. The packaged device of claim 1 , wherein the substrate device further includes a back-end-of-line layer or a bonding layer on the second side of the substrate.

6. A packaged device, comprising:

a substrate device with conductive vias formed in a substrate, the conductive vias extending between a first side and a second side of the substrate;

a wafer mounted at least proximate to the first side of the substrate;

cavities formed in the substrate with the conductive vias between the cavities;

the cavities extending through the substrate from the second side to the first side thereof and into the wafer;

chip devices of the wafer each of which being external to the substrate and to the cavities formed in the substrate such that the cavities in the substrate are located along perimeters of the chip devices of the wafer; and

an encapsulation layer above the second side of the substrate and in the cavities.

7. The packaged device of claim 6 , wherein the substrate device further includes a redistribution layer in contact with the conductive vias on the second side of the substrate, the cavities extending through the redistribution layer, and the encapsulation layer is in contact with a surface of the redistribution layer and in the cavities.

8. The packaged device of claim 7 , further comprising chip devices mounted on the redistribution layer, the redistribution layer interconnecting the chip devices mounted thereon for electrical conductivity with the conductive vias.

9. The packaged device of claim 7 , wherein the substrate device, the conductive vias, and the cavities respectively are a first substrate device, first conductive vias, and first cavities, the packaged device further comprising a second substrate device having second conductive vias extending through a second substrate and having second cavities in the second substrate, the second substrate mounted on the redistribution layer for interconnection with the second conductive vias and for alignment of the first cavities and the second cavities with one another.

10. The packaged device of claim 7 , wherein the redistribution layer is a first redistribution layer, the packaged device further comprising a second redistribution layer on the first side of the substrate, the wafer mounted on the second redistribution layer, wherein the cavities extend through the first redistribution layer, the substrate, and the second redistribution layer, and further extend into the wafer, and wherein the encapsulation layer is in contact with a surface of the second redistribution layer.

11. The packaged device of claim 1 , further comprising a bonding layer on the second side of the substrate.

12. The packaged device of claim 1 , further comprising a redistribution layer on the second side of the substrate.

13. The packaged device of claim 12 , wherein the redistribution layer on the second side of the substrate is in contact with the conductive vias.

14. The packaged device of claim 6 , further comprising a bonding layer on the second side of the substrate.

15. The packaged device of claim 6 , further comprising a redistribution layer on the second side of the substrate.

16. The packaged device of claim 15 , wherein the redistribution layer on the second side of the substrate is in contact with the conductive vias.

17. The packaged device of claim 1 , wherein the cavities are crack arrestors.

18. The packaged device of claim 6 , wherein the cavities are crack arrestors.

19. The packaged device of claim 6 , wherein the substrate device is a first substrate device having first conductive vias formed in a first substrate, the packaged device further comprising:

a second substrate device coupled to the first substrate device;

the second substrate device with second conductive vias formed in a second substrate, the second conductive vias extending between a first side and a second side of the second substrate;

the cavities formed in the second substrate with the second conductive vias between the cavities;

the cavities extending through the second substrate from the second side to the first side thereof to and through the first substrate; and

wherein the encapsulation layer is above the second side of the second substrate and in the cavities.

20. The packaged device of claim 19 , wherein the first substrate device is coupled to the second substrate device with a redistribution layer.

Assignments (4)
CHANGE OF NAME Recorded Jun 28, 2023
From: INVENSAS LLC
To: ADEIA SEMICONDUCTOR TECHNOLOGIES LLC
Reel/Frame 064158/0814 →
CHANGE OF NAME Recorded Aug 30, 2022
From: INVENSAS CORPORATION
To: INVENSAS LLC
Reel/Frame 061357/0485 →
SECURITY INTEREST Recorded Jun 1, 2020
From: ROVI SOLUTIONS CORPORATION; ROVI TECHNOLOGIES CORPORATION; ROVI GUIDES, INC.; TIVO SOLUTIONS INC.; VEVEO, INC.; INVENSAS CORPORATION; INVENSAS BONDING TECHNOLOGIES, INC.; TESSERA, INC.; TESSERA ADVANCED TECHNOLOGIES, INC.; DTS, INC.; PHORUS, INC.; IBIQUITY DIGITAL CORPORATION
To: BANK OF AMERICA, N.A.
Reel/Frame 053468/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 13, 2017
From: UZOH, CYPRIAN EMEKA; GAO, GUILIAN; WANG, LIANG; SHEN, HONG; SITARAM, ARKALGUD R.
To: INVENSAS CORPORATION
Reel/Frame 043002/0578 →
Continuity (2)
Division 14749529 · Jun 24, 2015
Related Publication 20170309518A1 · Oct 26, 2017