IP Library Granted Patent US 10,608,142
Granted Patent B2
US 10,608,142 · App. 15/703,649 · Granted Mar 31, 2020

Method of making a light emitting device having a patterned protective layer

Inventors: Jar-Yu Wu (Hsinchu, TW); Ching-Jang Su (Hsinchu, TW); Chun-Lung Tseng (Hsinchu, TW); Ching-Hsing Shen (Hsinchu, TW)
Assignee: EPISTAR CORPORATION
H01L33/38H01L33/22H01L33/42H01L33/44H01L33/002H01L2933/0025
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Quick Facts
Patent No.
US 10,608,142
App. No.
15/703,649
Granted
Mar 31, 2020
Kind
B2
Abstract

A method of manufacturing a light-emitting device includes: providing a substrate; forming a light-emitting structure comprising an active layer on the substrate; forming a protective layer having a first thickness on the light-emitting structure; etching the protective layer such that the protective layer has a second thickness less than the first thickness; and patterning the protective layer.

Claims (25)

1. A method of making a light emitting device, comprising steps of:

providing a substrate;

forming a light-emitting structure comprising an active layer on the substrate;

forming a protective layer having a first thickness on the light-emitting structure;

etching the protective layer to form a protective thin layer having a second thickness smaller than the first thickness; and

patterning the protective thin layer.

2. The method of claim 1 , wherein the protective layer is formed on a top surface and a sidewall of the light-emitting structure.

3. The method of claim 1 , wherein a difference between the first thickness and the second thickness is larger than 300 Å.

4. The method of claim 1 , further comprising applying a laser after forming the protective layer.

5. The method of claim 4 , further comprising cutting the protective layer by the laser.

6. The method of claim 4 , further comprising forming a trench in the substrate by the laser.

7. The method of claim 1 , wherein the step of etching the protective layer comprises etching the protective layer by an acidic solution.

8. The method of claim 1 , wherein the second thickness is between 3000-9700 Å.

9. The method of claim 1 , wherein a patterned protective layer is formed by the step of patterning the protective thin layer, and the method further comprising:

forming a transparent conductive layer on the patterned protective layer and the light-emitting structure; and

forming a first electrode on the transparent conductive layer.

10. The method of claim 9 , wherein the first electrode is formed on the transparent conductive layer at a position corresponding to the patterned protective layer.

11. The method of claim 10 , wherein the patterned protective layer comprises a shape substantially the same as the first electrode and an area larger than that of the first electrode.

12. The method of claim 9 , wherein the patterned protective layer comprises an inclined sidewall.

13. The method of claim 9 , wherein the patterned protective layer is configured to be a current barrier layer.

14. The method of claim 1 , wherein the step of forming the light-emitting structure comprises:

sequentially forming a first semiconductor layer, an active layer, and a second semiconductor layer on the substrate; and

etching the light-emitting structure to expose a part of the first semiconductor layer before forming the protective layer.

15. The method of claim 14 , further comprising forming a second electrode on the first semiconductor layer.

16. The method of claim 1 , wherein the protective layer comprises an insulating material.

Assignments (2)
CHANGE OF NAME Recorded Feb 26, 2026
From: EPISTAR CORPORATION
To: ENNOSTAR CORPORATION
Reel/Frame 075152/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 19, 2017
From: WU, JAR-YU; SU, CHING-JANG; TSENG, CHUN-LUNG; SHEN, CHING-HSING
To: EPISTAR CORPORATION
Reel/Frame 043627/0799 →
Priority Claims (1)
TW 101146337 A · Dec 7, 2012 · national
Continuity (3)
Continuation 15240264 · Aug 18, 2016
Continuation 14098643 · Dec 6, 2013
Related Publication 20180013038A1 · Jan 11, 2018