Germanium-silicon light sensing apparatus
An image sensor array including a carrier substrate; a first group of photodiodes coupled to the carrier substrate, where the first group of photodiodes include a first photodiode, and where the first photodiode includes a semiconductor layer configured to absorb photons at visible wavelengths and to generate photo-carriers from the absorbed photons; and a second group of photodiodes coupled to the carrier substrate, where the second group of photodiodes include a second photodiode, and where the second photodiode includes a germanium-silicon region fabricated on the semiconductor layer, the germanium-silicon region configured to absorb photons at infrared or near-infrared wavelengths and to generate photo-carriers from the absorbed photons.
1. An image sensor array comprising:
a carrier substrate;
a first group of photodiodes coupled to the carrier substrate, wherein the first group of photodiodes comprise a first photodiode, and wherein the first photodiode comprises:
a semiconductor layer configured to absorb photons at visible wavelengths and to generate photo-carriers from the absorbed photons;
a first carrier-collection region configured to collect a portion of the photo-carriers generated by the semiconductor layer;
a first readout region coupled to a first readout circuitry, the first readout region configured to provide the photo-carriers collected by the first carrier-collection region to the first readout circuitry; and
a first gate coupled to a first control signal that controls a carrier transport between the first carrier-collection region and the first readout region; and
a second group of photodiodes coupled to the carrier substrate, wherein the second group of photodiodes comprise a second photodiode, and wherein the second photodiode comprises:
a germanium-silicon region fabricated on the semiconductor layer, the germanium-silicon region configured to absorb photons at infrared or near-infrared wavelengths and to generate photo-carriers from the absorbed photons;
a second carrier-collection region configured to collect a portion of the photo-carriers generated by the germanium-silicon region;
a second readout region coupled to a second readout circuitry, the second readout region configured to provide the photo-carriers collected by the second carrier-collection region to the second readout circuitry;
a second gate coupled to a second control signal that controls a carrier transport between the second carrier-collection region and the second readout region;
a third readout region coupled to a third readout circuitry, the third readout region configured to provide the photo-carriers collected by the second carrier-collection region to the third readout circuitry; and
a third gate coupled to a third control signal that controls a carrier transport between the second carrier-collection region and the third readout region.
2. The image sensor array of claim 1 , wherein the first group of photodiodes and the second group of photodiodes are arranged in a two-dimensional array.
3. The image sensor array of claim 1 , wherein each photodiode of the first group of photodiodes and the second group of photodiodes includes a respective wavelength filter configured to transmit a portion of received light and a respective lens element configured to focus the received light.
4. The image sensor array of claim 1 ,
wherein the second photodiode further comprises:
a fourth readout region coupled to a fourth readout circuitry, the fourth readout region configured to provide the photo-carriers collected by the second carrier-collection region to the fourth readout circuitry; and
a fourth gate coupled to a fourth control signal that controls a carrier transport between the second carrier-collection region and the fourth readout region.
5. The image sensor array of claim 4 ,
wherein the second photodiode further comprises:
a fifth readout region coupled to a fifth readout circuitry, the fifth readout region configured to provide the photo-carriers collected by the second carrier-collection region to the fifth readout circuitry; and
a fifth gate coupled to a fifth control signal that controls a carrier transport between the second carrier-collection region and the fifth readout region.
6. The image sensor array of claim 5 ,
wherein the first gate is for an image sensing application, and
wherein at least two gates of the second gate, the third gate, the fourth gate, and the fifth gate are for a time-of-flight application.
7. The image sensor array of claim 1 ,
wherein the first carrier-collection region comprises a p-n junction and the second carrier-collection region comprises a p-i-n junction configured to collect electrons; and
wherein the first readout region and the second readout region are n-doped regions.
8. The image sensor array of claim 1 ,
further comprising an oxide layer planarized across the first group of photodiodes and the second group of photodiodes,
wherein the germanium-silicon region is embedded in the oxide layer.
9. The image sensor array of claim 1 , wherein the first photodiode is configured to collect electrons and the second photodiode is configured to collect holes.
10. The image sensor array of claim 1 ,
wherein the first gate is for an image sensing application, and
wherein the second gate and the third gate are for a time-of-flight application.
11. The image sensor array of claim 4 ,
wherein the first gate is for an image sensing application, and
wherein at least two gates of the second gate, the third gate, and the fourth gate are for a time-of-flight application.