IP Library Granted Patent US 10,947,326
Granted Patent B2
US 10,947,326 · App. 15/747,967 · Granted Mar 16, 2021

Adhesive composition, cured article, semiconductor device, and production method for same

Inventors: Sadaaki Katou (Tokyo, JP); Takuya Komine (Tokyo, JP); Shinjiro Fujii (Tokyo, JP)
Assignee: SHOWA DENKO MATERIALS CO., LTD.
C08F2/44C08F265/06C09J11/04C09J11/06C09J133/00C09J151/003G02B3/00G02B7/025G02B13/0085H01L23/29H01L23/31H01L27/14627H01L27/14685H01L31/0203H01L2224/48091H01L2924/181
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Quick Facts
Patent No.
US 10,947,326
App. No.
15/747,967
Granted
Mar 16, 2021
Kind
B2
Abstract

An adhesive composition comprising (a) a (meth)acrylic polymer, (b) a compound having at least two (meth)acryloyl groups, (c) a polymerization initiator and (d) a filler.

Claims (31)

1. An adhesive composition comprising:

(a) a (meth)acrylic polymer;

(b) a compound having at least two (meth)acryloyl groups, a content of the compound

(b) relative to a total of 100 parts by mass of the component (a) and the component (b) being 20 parts by mass or more;

(c) a polymerization initiator; and

(d) a filler.

2. The adhesive composition according to claim 1 , wherein a content of the component (d) relative to the total of 100 parts by mass of the component (a) and the component (b) is 0.1 to 40 parts by mass.

3. The adhesive composition according to claim 1 , wherein an average particle size of the component (d) is 5 to 10000 nm.

4. The adhesive composition according to claim 1 , wherein the component (a) has an alicyclic structure.

5. The adhesive composition according to claim 1 , wherein the component (a) has an epoxy group.

6. The adhesive composition according to claim 1 , wherein the component (a) has a structural unit represented by the following general formula (1):

wherein, in formula (I), R 1a represents a hydrogen atom or a methyl group, and X a represents a group containing an epoxy group.

7. The adhesive composition according to claim 1 , further comprising an antioxidant.

8. A cured article of the adhesive composition according to claim 1 .

9. A method for producing a semiconductor device, comprising:

a step of forming an adhesive layer containing the adhesive composition according to claim 1 on a semiconductor substrate; and

a step of curing the adhesive layer in a state that the adhesive layer is disposed between the semiconductor substrate and a transparent base material.

10. A semiconductor device comprising:

a semiconductor substrate;

an adhesive layer disposed on the semiconductor substrate; and

a transparent base material bonded to the semiconductor substrate via the adhesive layer, wherein

the adhesive layer contains the adhesive composition according to claim 1 or a cured article thereof.

11. The semiconductor device according to claim 10 , which is optical part.

12. The adhesive composition according to claim 1 , wherein a weight average molecular weight of the component (a) is 100000 or more.

13. The adhesive composition according to claim 12 , wherein the content of the component (b) relative to the total of 100 parts by mass of the component (a) and the component (b) is 30 parts by mass or more.

14. The adhesive composition according to claim 12 , wherein an average particle size of the component (d) is 500 nm or less.

15. The adhesive composition according to claim 14 , wherein a content of the component (d) relative to the total of 100 parts by mass of the component (a) and the component (b) is 5 parts by mass or more.

16. The adhesive composition according to claim 1 , wherein a weight average molecular weight of the component (a) is 200000 or more.

17. The adhesive composition according to claim 16 , wherein a content of the component (d) relative to the total of 100 parts by mass of the component (a) and the component (b) is 5 parts by mass or more.

18. The adhesive composition according to claim 1 , wherein a weight average molecular weight of the component (a) is 400000 or more.

19. The adhesive composition according to claim 1 , wherein a content of the component (d) relative to Han the total of 100 parts by mass of the component (a) and the component (b) is 0.1 parts by mass or more.

Assignments (4)
CHANGE OF ADDRESS Recorded Feb 14, 2024
From: RESONAC CORPORATION
To: RESONAC CORPORATION
Reel/Frame 066599/0037 →
CHANGE OF NAME Recorded Mar 8, 2023
From: SHOWA DENKO MATERIALS CO., LTD.
To: RESONAC CORPORATION
Reel/Frame 062992/0805 →
CHANGE OF NAME Recorded Nov 16, 2020
From: HITACHI CHEMICAL COMPANY, LTD.
To: SHOWA DENKO MATERIALS CO., LTD.
Reel/Frame 054431/0445 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 13, 2018
From: KATOU, SADAAKI; KOMINE, TAKUYA; FUJII, SHINJIRO
To: HITACHI CHEMICAL COMPANY, LTD.
Reel/Frame 045190/0570 →
Cited By (1)
US 12,668,709