Wiring structure and method of manufacturing the same, semiconductor device, multilayer wiring structure and method of manufacturing the same, semiconductor element mounting substrate, method of forming pattern structure, imprint mold and method of manufacturing the same, imprint mold set, and method of manufacturing multilayer wiring board
A mold includes a mold base material and a rugged structure located at a main surface of the mold base material. The rugged structure includes a plurality of linearly shaped projected portions for forming wiring, and a circularly shaped projected portion for forming a pad portion, in which a light-shielding layer is provided at a top portion flat surface of the circularly shaped projected portion for forming the pad portion.
1. An imprint mold comprising:
a mold base material; and
a rugged structure located at a main surface of the mold base material, the rugged structure having:
linearly shaped projected portions for forming wiring;
circularly shaped projected portions for forming pad portions; and
a light-shielding layer formed at top portion flat surfaces of the circularly shaped projected portions and not formed on top portion flat surfaces of the linearly shaped projected portions,
wherein:
the height of the top portion flat surfaces of the linearly shaped projected portions and the height of the top portion flat surfaces of the circularly shaped projected portions are the same, and
the light-shielding layer is provided over a whole surface of each top portion flat surface of the circularly shaped projected portions, and has an elastic modulus of not more than 100 GPa.
2. The imprint mold according to claim 1 , wherein the circularly shaped projected portions are continuous with the linearly shaped projected portions.
3. The imprint mold according to claim 1 , wherein the circularly shaped projected portions include those continuous with the linearly shaped projected portions and those separate from the linearly shaped projected portions.
4. The imprint mold according to claim 1 , wherein the main surface side of the mold base material is a projected structure with two or more steps.
5. The imprint mold according to claim 1 , wherein a width of the linearly shaped projected portion is set within the range of 0.5 to 10 μm, and a height of the linearly shaped projected portion from the main surface is set within the range of 0.5 to 10 μm.
6. The imprint mold according to claim 1 , wherein a diameter of the circularly shaped projected portion is set within the range of 5 to 30 μm, and a height of the circularly shaped projected portion from the main surface is set within the range of 0.5 to 10 μm.
7. The imprint mold according to claim 1 , wherein the light-shielding layer is a layer having an optical density (OD) of not less than 2.
8. The imprint mold according to claim 1 , wherein a material of the light-shielding layer is chromium, and a thickness of the light-shielding layer is in the range of from 50 to 150 nm.
9. The imprint mold according to claim 1 , wherein the light-shielding layer includes a first light-shielding layer with an optical density of less than 2, and a second light-shielding layer with an optical density of not less than 2.
10. The imprint mold according to claim 1 , wherein the light-shielding layer is formed only on the top portion flat surfaces of the circularly shaped projected portions.
11. The imprint mold according to claim 1 , wherein the light-shielding layer is bonded to the top portion flat surfaces of the circularly shaped projected portions through siloxane linkage.
12. The imprint mold according to claim 1 , wherein a height of the linearly shaped and a height of the circularly shaped projected portions from the main surface is set within the range of 0.5 to 10 μm, and a thickness of the light-shielding layer is in the range of 50 to 150 nm.