IP Library Granted Patent US 10,361,362
Granted Patent B2
US 10,361,362 · App. 15/815,516 · Granted Jul 23, 2019

Magnetic random access memory with ultrathin reference layer

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,361,362
App. No.
15/815,516
Granted
Jul 23, 2019
Kind
B2
Abstract

The present invention is directed to a magnetic memory element including a magnetic free layer and a first magnetic reference layer with an insulating tunnel junction layer interposed therebetween; a second magnetic reference layer made of a material comprising cobalt and formed adjacent to the first magnetic reference layer opposite the insulating tunnel junction layer; an iridium layer formed adjacent to the second magnetic reference layer opposite the first magnetic reference layer; and a magnetic fixed layer formed adjacent to the iridium layer. The magnetic free layer has a variable magnetization direction substantially perpendicular to the layer plane thereof. The first and second magnetic reference layers have a first fixed magnetization direction substantially perpendicular to the layer planes thereof. The magnetic fixed layer has a second fixed magnetization direction that is substantially perpendicular to the layer plane thereof and is substantially opposite to the first fixed magnetization direction.

Claims (23)

1. A magnetic memory element including:

a magnetic free layer and a first magnetic reference layer with an insulating tunnel junction layer interposed therebetween;

a second magnetic reference layer formed adjacent to said first magnetic reference layer opposite said insulating tunnel junction layer, said second magnetic reference layer is made of a magnetic material comprising cobalt;

an iridium layer formed adjacent to said second magnetic reference layer opposite said first magnetic reference layer; and

a magnetic fixed layer formed adjacent to said iridium layer opposite said second magnetic reference layer,

wherein said magnetic free layer has a variable magnetization direction substantially perpendicular to a plane of said magnetic free layer, said first and second magnetic reference layers have a first fixed magnetization direction substantially perpendicular to layer planes of said first and second magnetic reference layers, said magnetic fixed layer has a second fixed magnetization direction that is substantially perpendicular to a layer plane of said magnetic fixed layer and is substantially opposite to said first fixed magnetization direction.

2. The magnetic memory element according to claim 1 , wherein said magnetic free layer is made of a magnetic material comprising cobalt, iron, and boron.

3. The magnetic memory element according to claim 1 , wherein said magnetic free layer is made of a magnetic material comprising cobalt, iron, and tantalum.

4. The magnetic memory element according to claim 1 , wherein said magnetic free layer is made of a magnetic material comprising cobalt, iron, and molybdenum.

5. The magnetic memory element according to claim 1 , wherein said first magnetic reference layer is made of a magnetic material comprising cobalt, iron, and boron.

6. The magnetic memory element according to claim 1 , wherein said first magnetic reference layer is made of a magnetic material comprising cobalt, iron, and tantalum.

7. The magnetic memory element according to claim 1 , wherein said first magnetic reference layer is made of a magnetic material comprising cobalt, iron, and molybdenum.

8. The magnetic memory element according to claim 1 , wherein said magnetic material of said second magnetic reference layer further comprises iron.

9. The magnetic memory element according to claim 1 , wherein said magnetic material of said second magnetic reference layer further comprises platinum.

10. The magnetic memory element according to claim 1 , wherein said magnetic material of said second magnetic reference layer further comprises iron and boron.

11. The magnetic memory element according to claim 1 , wherein said magnetic material of said second magnetic reference layer further comprises iron and molybdenum.

12. The magnetic memory element according to claim 1 , wherein said magnetic material of said second magnetic reference layer further comprises iron and tantalum.

13. The magnetic memory element according to claim 1 , wherein said magnetic fixed layer is made of a magnetic material comprising cobalt and platinum.

14. The magnetic memory element according to claim 1 , wherein said magnetic fixed layer is made of a magnetic material comprising iron and platinum.

15. The magnetic memory element according to claim 1 , wherein said magnetic fixed layer has a multilayer structure formed by interleaving one or more layers of a first type material with one or more layers of a second type material, at least one of said first type and second type materials being magnetic.

16. The magnetic memory element according to claim 15 , wherein said first type material is cobalt.

17. The magnetic memory element according to claim 15 , wherein said second type material is nickel.

18. The magnetic memory element according to claim 15 , wherein said second type material is platinum or palladium.

Assignments (6)
SECURITY INTEREST Recorded Mar 18, 2022
From: AVALANCHE TECHNOLOGY, INC.
To: STRUCTURED ALPHA LP
Reel/Frame 059436/0203 →
SECURITY INTEREST Recorded Apr 19, 2021
From: AVALANCHE TECHNOLOGY, INC.
To: STRUCTURED ALPHA LP
Reel/Frame 057213/0050 →
SECURITY INTEREST Recorded Apr 19, 2021
From: AVALANCHE TECHNOLOGY, INC.
To: STRUCTURED ALPHA LP
Reel/Frame 057217/0674 →
SECURITY INTEREST Recorded Jul 8, 2020
From: AVALANCHE TECHNOLOGY, INC.
To: SILICON VALLEY BANK
Reel/Frame 053156/0223 →
SECURITY INTEREST Recorded Feb 13, 2020
From: AVALANCHE TECHNOLOGY, INC.
To: STRUCTURED ALPHA LP
Reel/Frame 051930/0396 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 16, 2017
From: GAN, HUADONG; HUAI, YIMING; ZHOU, YUCHEN; WANG, ZIHUI
To: AVALANCHE TECHNOLOGY, INC.
Reel/Frame 044156/0461 →