IP Library Granted Patent US 11,194,028
Granted Patent B2
US 11,194,028 · App. 15/888,596 · Granted Dec 7, 2021

Measuring resonance parameters of piezoelectric transducers

Inventors: Jiri Kutej (Brno, CZ); Tomas Suchy (Brno, CZ); Marek Hustava (Bratislava, SK); Pavel Horsky (Brno, CZ); Zdenek Axman (Sebetov, CZ)
Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
G01S7/52004B06B1/0215G01H11/08G01H13/00G01N29/30G01S15/931B06B2201/40B06B2201/55G01S2015/938
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Quick Facts
Patent No.
US 11,194,028
App. No.
15/888,596
Granted
Dec 7, 2021
Kind
B2
Abstract

Piezoelectric sensor controllers may facilitate detection and identification of various potential fault states with novel parameter measurements. In an illustrative embodiment of a piezoelectric-based sensor having a shorted-reverberation based resonant frequency measurement, the sensor includes a piezoelectric transducer that provides residual reverberation after being driven. The sensor further includes a controller that provides a low impedance path for the piezoelectric transducer during the residual reverberation and that measures current through the low impedance path to determine a resonant frequency of the piezoelectric transducer. In an illustrative embodiment of a sensing method having a shorted-reverberation based resonant frequency measurement, the method includes: driving a piezoelectric transducer that provides residual reverberation after being driven; providing a low impedance path for the piezoelectric transducer during the residual reverberation; and measuring current through the low impedance path to determine a resonant frequency of the piezoelectric transducer.

Claims (31)

1. A piezoelectric-based sensor that comprises:

a piezoelectric transducer that provides residual reverberation after being driven; and

a controller that provides a low impedance path for the piezoelectric transducer during the residual reverberation and measures current through the low impedance path to determine a resonant frequency of the piezoelectric transducer.

2. The sensor of claim 1 , wherein the controller identifies, based at least in part on the resonant frequency, a transducer state from a set of potential states including multiple transducer fault states.

3. The sensor of claim 1 , wherein the controller further determines a quality factor or impedance of the piezoelectric transducer based on the current through the low impedance path.

4. The sensor of claim 3 , wherein the controller identifies, based at least in part on the resonant frequency and on the quality factor or impedance, a transducer state from a set of potential states including multiple transducer fault states.

5. The sensor of claim 4 , wherein the set of potential states includes: normal, loaded, impeded, and defective.

6. A method of operating a piezoelectric-based sensor, the method comprising:

driving a piezoelectric transducer that provides residual reverberation after being driven;

providing a low impedance path for the piezoelectric transducer during the residual reverberation; and

measuring current through the low impedance path to determine a resonant frequency of the piezoelectric transducer.

7. The method of claim 6 , further comprising: identifying, based at least in part on the resonant frequency, a transducer state from a set of potential states including multiple transducer fault states.

8. The method of claim 6 , further comprising: determining a quality factor or impedance of the piezoelectric transducer based on the current through the low impedance path.

9. The method of claim 8 , further comprising: identifying, based at least in part on the resonant frequency and on the quality factor or impedance, a transducer state from a set of potential states including multiple transducer fault states.

10. The method of claim 9 , wherein the set of potential states includes: normal, loaded, impeded, and defective.

11. A piezoelectric-based sensor that comprises:

a piezoelectric transducer that provides residual reverberation after being driven; and

a controller that provides a low impedance path for the piezoelectric transducer during the residual reverberation and measures current through the low impedance path to determine a quality factor Q of the piezoelectric transducer.

12. The sensor of claim 11 , wherein the controller identifies, based at least in part on the quality factor Q, a transducer state from a set of potential states including multiple transducer fault states.

13. The sensor of claim 11 , wherein the controller drives the piezoelectric transducer at a series of different frequencies and measures the low impedance path current as a function of frequency.

14. A piezoelectric-based sensor that comprises:

a piezoelectric transducer; and

a controller that drives the piezoelectric transducer to generate bursts of acoustic energy and, based on a response of the piezoelectric transducer to said driving, derives a quality factor,

wherein the controller measures the quality factor during said driving.

15. The sensor of claim 14 , wherein the controller measures the quality factor by measuring the frequency dependence of the response.

16. A controller for a piezoelectric transducer, the controller comprising:

a transmitter configured to drive a piezoelectric transducer with a carrier signal pulse and to provide a low impedance path during a residual reverberation period after the carrier signal pulse;

a receiver configured to sense a response of the piezoelectric transducer during said residual reverberation by measuring a current through the low impedance path; and

a core logic circuit coupled to the transmitter and to the receiver, the core logic operable to measure a resonant frequency of the piezoelectric transducer based on the response.

17. The controller of claim 16 , wherein the core logic is configured to derive a quality factor Q from the response.

18. The controller of claim 16 , wherein the transmitter is configured to drive the piezoelectric transducer at a series of different frequencies and the receiver measures the low impedance path current as a function of frequency.

Assignments (3)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 047734, FRAME 0068 Recorded Jun 23, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064160/0027 →
SECURITY INTEREST Recorded Dec 6, 2018
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 047734/0068 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 21, 2018
From: KUTEJ, JIRI; SUCHY, TOMAS; HUSTAVA, MAREK; HORSKY, PAVEL; AXMAN, ZDENEK
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 044990/0720 →