IP Library Assignment 064160/0027
Patent Assignment
Reel/Frame 064160/0027

Release of Security Interest in Patents Recorded at Reel 047734, Frame 0068

Recorded: 2023-06-23 Pages: 431
Assignor
Assignees
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
5005 EAST MCDOWELL ROAD, MAILDROP A700, PHOENIX, ARIZONA, 85008
FAIRCHILD SEMICONDUCTOR CORPORATION
5005 EAST MCDOWELL ROAD, MAILDROP A700, PHOENIX, ARIZONA, 85008
Covered Properties (88)
Methods and Apparatus for an Image Sensor with a Multi-Branch Transistor
Application: 15/861,722 →
Publication: US 2018/0130839
Image Sensors with Split Photodiodes
Application: 15/864,164 →
Publication: US 2019/0215471
Press-Fit Power Module and Related Methods
Application: 15/865,498 →
Publication: US 2019/0214749
Cascode Semiconductor Package and Related Methods
Application: 15/866,248 →
Publication: US 2018/0130726
Hybrid Control Technique for Power Converters
Application: 15/867,212 →
Publication: US 2018/0131285
Active Output Driver Supply Compensation for Noise Reduction
Application: 15/868,142 →
Publication: US 2018/0139550
Power Supply Controller and Related Methods
Application: 15/868,690 →
Publication: US 2018/0138807
Substrate Structures and Methods of Manufacture
Application: 15/868,747 →
Publication: US 2018/0132358
Low Frequency Modulated Chirp Minimum Distance Measurement
Application: 15/868,801 →
Publication: US 2019/0212423
Imaging Systems Having Broadband Monochromatic and Chromatic Image Sensors
Application: 15/869,221 →
Publication: US 2019/0222813
Rotor Position Sensing System for Permanent Magnet Synchronous Motors and Related Methods
Application: 15/869,356 →
Publication: US 2018/0175755
Adaptive Dynamic Element Matching of Circuit Components
Application: 15/869,757 →
Semiconductor Packages with Leadframes and Related Methods
Application: 15/870,215 →
Publication: US 2018/0138144
Reducing Mosfet Body Current
Application: 15/871,231 →
Semiconductor Devices and Methods of Making the Same
Application: 15/871,414 →
Publication: US 2018/0138109
Semiconductor Wafer and Method of Ball Drop on Thin Wafer with Edge Support Ring
Application: 15/871,586 →
Publication: US 2018/0151526
Method of Separating Electronic Devices Having a Back Layer and Apparatus
Application: 15/874,307 →
Publication: US 2018/0158734
High Power Module Semiconductor Package with Multiple Submodules
Application: 15/874,355 →
Publication: US 2019/0221493
Apparatus and Method Related to Sensor Die Esd Protection
Application: 15/876,328 →
Publication: US 2019/0229143
Methods and Apparatus for a Capacitive Touch Sensor
Application: 15/876,417 →
Publication: US 2019/0227648
Adaptive Control of Synchronous Rectifier Switching Device
Application: 15/877,573 →
Publication: US 2019/0229634
Bidirectional Current Sense Amplifier
Application: 15/877,804 →
Publication: US 2019/0068144
Cascode Configured Semiconductor Component
Application: 15/882,478 →
Publication: US 2018/0166557
Trench Semiconductor Device Having Shaped Gate Dielectric and Gate Electrode Structures and Method
Application: 15/883,500 →
Publication: US 2019/0237588
Wafer Level Flat No-Lead Semiconductor Packages and Methods of Manufacture
Application: 15/883,625 →
Publication: US 2018/0174881
Battery Protection System with Reference Voltage Control System
Application: 15/883,687 →
Publication: US 2018/0159314
Image Sensor Chip Scale Packages and Related Methods
Application: 15/884,596 →
Publication: US 2018/0151621
TRENCH-GATE INSULATED-GATE BIPOLAR TRANSISTORS (IGBTs)
Application: 15/884,773 →
Publication: US 2019/0058055
Trench-Gate Insulated-Gate Bipolar Transistors
Application: 15/884,779 →
Publication: US 2019/0058056
Devices, Systems and Processes for Average Current Control
Application: 15/888,290 →
Publication: US 2018/0159420
Low-Latency Streaming for Cros and Bicros
Application: 15/888,313 →
Publication: US 2019/0246221
Devices, Systems and Processes for Average Current Control
Application: 15/888,343 →
Publication: US 2018/0183316
Composite Acoustic Bursts for Multi-Channel Sensing
Application: 15/888,471 →
Publication: US 2019/0025415
Response-Based Determination of Piezoelectric Transducer State
Application: 15/888,543 →
Publication: US 2019/0079173
Measuring Resonance Parameters of Piezoelectric Transducers
Application: 15/888,596 →
Publication: US 2019/0079174
Control Circuit for Programmable Power Supply
Application: 15/891,035 →
Publication: US 2018/0164861
Packaged Semiconductor Devices with Multi-Use Input Contacts and Related Methods
Application: 15/891,135 →
Publication: US 2018/0166378
Methods and Apparatus for a Current Circuit
Application: 15/891,474 →
Publication: US 2019/0245328
Semiconductor Package with Chamfered Corners and Related Methods
Application: 15/892,114 →
Semiconductor Copper Metallization Structure and Related Methods
Application: 15/892,485 →
Publication: US 2018/0166407
Signal Communication for Circuit with Floating Ground
Application: 15/892,609 →
Alternating Valley Switching for Power Converter
Application: 15/893,300 →
Publication: US 2018/0166993
Electronic Device Including a Conductive Layer Including a Ta-Si Compound and a Process of Forming the Same
Application: 15/893,328 →
Publication: US 2019/0252509
Level-Shifting Circuit Configured to Limit Leakage Current
Application: 15/893,909 →
Publication: US 2019/0253040
Methods and Apparatus for Anti-Eclipse Circuit Verification
Application: 15/895,354 →
Publication: US 2019/0253646
Image Sensors with Deep Silicon Etch and Related Methods
Application: 15/895,668 →
Publication: US 2019/0252333
Error Rate Meter Included in a Semiconductor Die
Application: 15/895,784 →
Publication: US 2019/0025372
Imaging Systems Having Dual Storage Gate Overflow Capabilities
Application: 15/900,136 →
Publication: US 2019/0260949
Power Factor Correction Circuit and Driving Method Thereof
Application: 15/901,228 →
Publication: US 2018/0183326
Semiconductor Device with Backmetal and Related Methods
Application: 15/903,677 →
Publication: US 2019/0267344
Semiconductor Device and Method of Forming Cantilevered Protrusion on a Semiconductor Die
Application: 15/903,704 →
Publication: US 2018/0182698
Negative Voltage Detection and Voltage Surge Protection
Application: 15/904,506 →
Publication: US 2019/0267792
Image Sensors Having High Dynamic Range Functionalities
Application: 15/906,619 →
Publication: US 2018/0191969
Semiconductor Wafer and Method of Probe Testing
Application: 15/907,931 →
Publication: US 2018/0190552
Imaging Systems with Clear Filter Pixels
Application: 15/908,319 →
Publication: US 2018/0192011
Methods and Apparatus for an Encoder
Application: 15/908,931 →
Publication: US 2019/0271961
Method for Operating an Electronic Module
Application: 15/908,981 →
Publication: US 2018/0188345
Low Noise Differential Amplifier
Application: 15/909,098 →
Publication: US 2019/0273471
Electronic Device Including a Junction Field-Effect Transistor Having a Gate Within a Well Region and a Process of Forming the Same
Application: 15/909,622 →
Publication: US 2019/0273169
Preamplifier and Method
Application: 15/911,476 →
Publication: US 2018/0198423
Power Domain Having an Implementation of an on-Chip Voltage Regulator Device
Application: 15/911,894 →
Publication: US 2019/0272023
Cascode Circuit Having a Gate of a Low-Side Transistor Coupled to a High-Side Transistor
Application: 15/911,999 →
Publication: US 2018/0197851
Clip and Related Methods
Application: 15/912,267 →
Publication: US 2018/0197836
Imaging Pixels with Storage Capacitors
Application: 15/914,122 →
Publication: US 2019/0230294
Ignition Control System for a High-Voltage Battery System
Application: 15/914,370 →
Publication: US 2019/0280464
Electronic Device Including a Transistor Including Iii-V Materials and a Process of Forming the Same
Application: 15/916,428 →
Dual Conversion Gain Circuitry with Buried Channels
Application: 15/916,947 →
Publication: US 2019/0280031
Imaging Systems with Boosted Control Signals
Application: 15/918,067 →
Publication: US 2019/0281243
Schottky Device and Method of Manufacture
Application: 15/919,475 →
Publication: US 2019/0288125
Multi-Chip Packages with Stabilized Die Pads
Application: 15/919,516 →
Publication: US 2019/0287884
Variable Resistance Vias and Related Methods
Application: 15/920,880 →
Publication: US 2018/0331045
Thinned Semiconductor Package and Related Methods
Application: 15/921,898 →
Publication: US 2019/0287913
Embedded Stacked Die Packages and Related Methods
Application: 15/926,127 →
Publication: US 2018/0211939
Methods and Apparatus for an Image Sensor Capable of Simultaneous Integration of Electrons and Holes
Application: 15/928,450 →
Publication: US 2019/0297292
Smart Turn-Off for Gate Driver Circuit
Application: 15/935,291 →
Publication: US 2019/0296728
Method of Forming a Power Supply Control Circuit and Structure Therefor
Application: 15/935,840 →
Method of Separating a Back Layer on a Substrate Using Exposure to Reduced Temperature and Related Apparatus
Application: 15/938,115 →
Publication: US 2018/0342423
CISCSP Package and Related Methods
Application: 15/939,582 →
Publication: US 2019/0006531
Leadframe with Sockets for Solderless Pins
Application: 15/939,632 →
Publication: US 2019/0304883
Ultra-Thin Multichip Power Devices
Application: 15/939,843 →
Publication: US 2019/0304940
Fast Response for Current Doubling Dc-Dc Converter
Application: 15/940,299 →
Current Doubling Dc-Dc Converter with Efficient Sleep Mode
Application: 15/940,362 →
Leadframe with Efficient Heat Dissipation for Semiconductor Device Package Assembly
Application: 15/941,424 →
Pulse Width Control for Switching Mode Power Converters
Application: 15/941,528 →
Publication: US 2018/0337599
Methods and Apparatus for a Microphone System
Application: 62/620,707 →
Capacitors with Electrode Topography
Application: 62/621,265 →
Ultra-Low Leakage Diode Circuit
Application: 62/647,322 →
Electronic Device Including an Enhancement-Mode Hemt and a Method of Using the Same
Application: 62/649,249 →
Related Assignments (20)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Jan 4, 2018
From: MAURITZSON, RICHARD
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 044532/0219 →
Assignment of Assignor's Interest Jan 8, 2018
From: OH, MINSEOK
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 044558/0059 →
Assignment of Assignor's Interest Jan 9, 2018
From: CHANG, JIE; CHEN, HUIBIN; MALDO, TIBURCIO; LEE, KEUNHYUK
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 044571/0280 →
Assignment of Assignor's Interest Jan 9, 2018
From: LE, PHUONG TRONG; YOUNG, ALEXANDER
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 044577/0768 →
Assignment of Assignor's Interest Jan 10, 2018
From: STULER, ROMAN
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 044587/0624 →
Assignment of Assignor's Interest Jan 11, 2018
From: LIN, YUSHENG; TAKAKUSAKI, SADAMICHI
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 044602/0707 →
Assignment of Assignor's Interest Jan 11, 2018
From: COENEN, IVO LEONARDUS; HEUBI, ALEXANDER
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 044598/0227 →
Assignment of Assignor's Interest Jan 11, 2018
From: PFOF, ZDENEK; BUBLA, JIRI; VECERA, IVO
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 044602/0399 →
Assignment of Assignor's Interest Jan 11, 2018
From: HUSTAVA, MAREK; SUCHY, TOMAS
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 044603/0064 →
Assignment of Assignor's Interest Jan 12, 2018
From: KANE, PAUL JAMES; JENKIN, ROBIN BRIAN
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 044605/0810 →
Assignment of Assignor's Interest Jan 12, 2018
From: OKUBAYASHI, MASANORI
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 044606/0685 →
Assignment of Assignor's Interest Jan 15, 2018
From: SEDDON, MICHAEL J.; NOMA, TAKASHI; SATO, KAZUHIRO
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 044622/0835 →
Assignment of Assignor's Interest Jan 15, 2018
From: EGGERMONT, JEAN-PAUL; JANSSENS, JOHAN CAMIEL JULIA
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 044620/0386 →
Assignment of Assignor's Interest Jan 15, 2018
From: CELAYA, PHILLIP; LETTERMAN, JAMES P., JR.; MARQUIS, ROBERT L.; TRUHITTE, DARRELL
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 044620/0851 →
Assignment of Assignor's Interest Jan 15, 2018
From: ST. GERMAIN, STEPHEN; ARBUTHNOT, ROGER M.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 044621/0872 →
Assignment of Assignor's Interest Jan 17, 2018
From: JASA, HRVOJE; DAIGLE, TYLER; JORDAN, ANDREW; MAHER, GREGORY
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 044642/0528 →
Assignment of Assignor's Interest Jan 18, 2018
From: GRIVNA, GORDON M.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 044657/0120 →
Assignment of Assignor's Interest Jan 25, 2018
From: CHANG, JIE; CHEN, HUIBIN; LEE, KEUNHYUK; TEYSSEYRE, JEROME
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 044726/0412 →
Security Interest Dec 6, 2018
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 047734/0068 →
Security Interest Jul 13, 2023
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; GTAT CORPORATION
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 064271/0971 →