Providing data of a memory system based on an adjustable error rate
View Patent ↗A first data stored at a first portion of a memory cell and a second data stored at a second portion of the memory cell are identified. A first error rate associated with first data stored at the first portion of the memory cell is determined. The first error rate is adjusted to exceed a second error rate associated with the second data stored at the second portion of the memory cell. A determination is made as to whether the first error rate exceeds a threshold. The second data stored at the second portion of the memory cell is provided for use in an error correction operation in response to determining that the first error rate exceeds the threshold.
1. A system comprising:
a memory device; and
a processing device, operatively coupled with the memory device, to:
identify a first data stored at a first portion of a memory cell and a second data stored at a second portion of the memory cell;
determine a first error rate associated with the first data stored at the first portion of the memory cell, the first error rate being adjusted to exceed a second error rate associated with the second data stored at the second portion of the memory cell;
determine whether the first error rate exceeds a threshold; and
in response to determining that the first error rate exceeds the threshold:
provide the second data stored at the second portion of the memory cell for use in an error correction operation; and
provide third data stored at a third portion of the memory cell to a controller associated with the memory cell.
2. The system of claim 1 , wherein the processing device is further to:
perform the error correction operation on the second data stored at the second portion of memory cell; and
provide corrected second data to the second portion of the memory cell.
3. The system of claim 2 , wherein the corrected second data is provided to the second portion of the memory cell during a second programming operation performed on the memory cell.
4. The system of claim 1 , wherein the first error rate associated with the first data stored at the first portion of the memory cell is based on a first programming operation performed on the memory cell.
5. The system of claim 1 , wherein the processing device is further to:
perform a read operation on the first data stored at the first portion of the memory cell; and
provide the first data stored at the first portion of the memory cell to the controller associated with the memory cell, wherein determining whether the first error rate exceeds the threshold is based on providing the first data stored at the first portion of the memory cell to the controller associated with the memory cell.
6. The system of claim 1 , wherein to determine the first error rate associated with the first data stored at the first portion of the memory cell, the processing device is further to:
adjust the first error rate associated with the first data stored at the first portion of the memory cell by modifying one or more program voltages associated with the first data stored at the first portion of the memory cell.
7. The system of claim 6 , wherein to adjust the first error rate associated with the first data stored at the first portion of the memory cell, the processing device is further to modify the one or more program voltages to increase a subsequent first error rate, and wherein the modifying the one or more program voltages to increase the subsequent first error rate corresponds to a decrease in a subsequent second error rate associated with the second data stored at the second portion of the memory cell.
8. A method comprising:
identifying a first data stored at a first portion of a memory cell and a second data stored at a second portion of the memory cell;
determining a first error rate associated with the first data stored at the first portion of the memory cell, the first error rate being adjusted to exceed a second error rate associated with the second data stored at the second portion of the memory cell;
determining whether the first error rate exceeds a threshold; and
in response to determining that the first error rate exceeds the threshold:
providing, by a processing device, the second data stored at the second portion of the memory cell for use in an error correction operation; and
providing third data stored at a third portion of the memory cell to a controller associated with the memory cell.
9. The method of claim 8 , further comprising:
performing the error correction operation on the second data stored at the second portion of memory cell; and
providing corrected second data to the second portion of the memory cell.
10. The method of claim 9 , wherein the corrected second data is provided to the second portion of the memory cell during a second programming operation performed on the memory cell.
11. The method of claim 8 , wherein the first error rate associated with the first data stored at the first portion of the memory cell is based on a first programming operation performed on the memory cell.
12. The method of claim 8 , further comprising:
performing a read operation on the first data stored at the first portion of the memory cell; and
providing the first data stored at the first portion of the memory cell to the controller associated with the memory cell, wherein determining whether the first error rate exceeds the threshold is based on providing the first data stored at the first portion of the memory cell to the controller associated with the memory cell.
13. The method of claim 8 , wherein determining the first error rate associated with the first data stored at the first portion of the memory cell further comprises:
adjusting the first error rate associated with the first data stored at the first portion of the memory cell by modifying one or more program voltages associated with the first data stored at the first portion of the memory cell.
14. The method of claim 13 , wherein adjusting the first error rate associated with the first data stored at the first portion of the memory cell further comprises modifying the one or more program voltages to increase a subsequent first error rate, and wherein the modifying the one or more program voltages to increase the subsequent first error rate corresponds to a decrease in a subsequent second error rate associated with the second data stored at the second portion of the memory cell.
15. A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to:
identify a first data stored at a first portion of a memory cell and a second data stored at a second portion of the memory cell;
determine a first error rate associated with the first data stored at the first portion of the memory cell, the first error rate being adjusted to exceed a second error rate associated with the second data stored at the second portion of the memory cell;
determine whether the first error rate exceeds a threshold; and
in response to determining that the first error rate exceeds the threshold:
provide the second data stored at the second portion of the memory cell for use in an error correction operation; and
provide third data stored at a third portion of the memory cell to a controller associated with the memory cell.
16. The non-transitory computer-readable storage medium of claim 15 , wherein the processing device is further to:
perform the error correction operation on the second data stored at the second portion of memory cell; and
provide corrected second data to the second portion of the memory cell.
17. The non-transitory computer-readable storage medium of claim 16 , wherein the corrected second data is provided to the second portion of the memory cell during a second programming operation performed on the memory cell.
18. The non-transitory computer-readable storage medium of claim 15 , wherein the first error rate associated with the first data stored at the first portion of the memory cell is based on a first programming operation performed on the memory cell.
19. The non-transitory computer-readable storage medium of claim 15 , wherein to determine the first error rate associated with the first data stored at the first portion of the memory cell, the processing device is further to:
adjust the first error rate associated with the first data stored at the first portion of the memory cell by modifying one or more program voltages associated with the first data stored at the first portion of the memory cell.
20. The non-transitory computer-readable storage medium of claim 19 , wherein to adjust the first error rate associated with the first data stored at the first portion of the memory cell, the processing device is further to modify the one or more program voltages to increase a subsequent first error rate, and wherein the modifying the one or more program voltages to increase the subsequent first error rate corresponds to a decrease in a subsequent second error rate associated with the second data stored at the second portion of the memory cell.