Event-driven design simulation
An event-driven simulation system is provided. The simulation system classifies events into bypass-events and perform-events. The simulation system performs simulation by executing instructions based on the perform-events and skips simulation for the bypass-events. The simulation system produces partial simulation result data based events that are actually simulated but not the events that are skipped. A post processor is provided to generate the missing simulation result data for the bypass-events and to merge the bypass-event with the partial simulation result to generate a complete simulation result.
1. A method comprising:
receiving, at a first computing device, a testbench for a design of an integrated circuit (IC);
classifying a first type of events scheduled by the testbench to operate at a first set of simulation time steps as perform-events and a second type of events scheduled by the testbench to operate at a second set of simulation time steps as bypass-events; and
compiling the testbench to generate (i) a set of instructions that are executable at a second computing device for performing event-driven simulation at the first set of simulation time steps and (ii) a configuration for configuring the second computing device to bypass event-driven simulation at the second set of simulation time steps; and
providing the generated set of instructions and the configuration to the second computing device to generate simulation data for perform-events at the first set of simulation time steps but not the bypass-events at the second set of simulation time steps.
2. The method of claim 1 , wherein the configuration is a filter setting that allows the second computing device to perform simulation based on the perform-events and prevents the second computing device from performing simulation based on the bypass-events.
3. The method of claim 1 , wherein the first type of events comprises rising edges of a clock signal and the second type of events comprises falling edges of the clock signal.
4. The method of claim 1 , wherein said classifying comprises identifying a fan-out of the first type of events and a fan-out of the second type of events.
5. The method of claim 1 , wherein said classifying comprises classifying events scheduled by a particular module in the testbench as bypass-events.
6. The method of claim 1 , wherein said classifying comprises identifying events that do not affect a simulation result of subsequent time steps as bypass-events.
7. The method of claim 1 , wherein the first type of events are rising edges of a clock signal and the second type of events are falling edges of the clock signal.
8. One or more non-transitory computer-readable media of a computing device storing computer-executable instructions that upon execution cause one or more processors to perform acts comprising:
receiving, at a first computing device, a testbench for a design of an integrated circuit (IC);
classifying a first type of events scheduled by the testbench to operate at a first set of simulation time steps as perform-events and a second type of events scheduled by the testbench to operate at a second set of simulation time steps as bypass-events;
compiling the testbench to generate (i) a set of instructions that are executable at a second computing device for performing event-driven simulation at the first set of simulation time steps and (ii) a configuration for configuring the second computing device to bypass event-driven simulation at the second set of simulation time steps; and
providing the generated set of instructions and the configuration to the second computing device to generate simulation data for perform-events at the first set of simulation time steps but not the bypass-events at the second set of simulation time steps.
9. The one or more non-transitory computer-readable media of claim 8 , wherein the configuration is a filter setting that allows the second computing device to perform simulation based on the perform-events and prevents the second computing device from performing simulation based on the bypass-events.
10. The one or more non-transitory computer-readable media of claim 8 , wherein the first type of events comprises rising edges of a clock signal and the second type of events comprises falling edges of the clock signal.
11. The one or more non-transitory computer-readable media of claim 8 , wherein said classifying comprises identifying a fan-out of the first type of events and a fan-out of the second type of events.
12. The one or more non-transitory computer-readable media of claim 8 , wherein said classifying comprises classifying events scheduled by a particular module in the testbench as bypass-events.
13. The one or more non-transitory computer-readable media of claim 8 , wherein said classifying comprises identifying events that do not affect a simulation result of subsequent time steps as bypass-events.
14. The one or more non-transitory computer-readable media of claim 8 , wherein the first type of events are rising edges of a clock signal and the second type of events are falling edges of the clock signal.