Detecting a substrate
This disclosure is directed to a system and method for detecting a surface of a substrate within a scanner.
1. A system comprising:
a picker comprising a picker tip;
a substrate comprising
a first side comprising a first target analyte, and
a second side;
a substrate holder comprising the substrate,
a position detector comprising
a sensor fixed at a set distance along a first axis relative to the substrate holder,
a target plate fixed at a set distance along the first axis relative to the picker tip; and
at least one processor programmed to execute a method comprising
driving the picker along the first axis towards the first side of the substrate,
wherein, during the driving step, the sensor or the target plate moves toward or away from the target plate or the sensor, respectively,
contacting the substrate with the picker tip,
overtraveling the substrate with the picker tip,
withdrawing the picker tip from the substrate to at least the point along the first axis at which the contacting step occurs, wherein the withdrawing step is performed after the overtraveling step and before the isolating step, and
isolating the first target analyte from the substrate with the picker.
2. The system of claim 1 , further comprising at least one motor controlled by the processor to execute at least one of the driving, contacting, or overtraveling steps.
3. The system of claim 1 , further comprising
at least one light source; and
a detector.
4. The system of claim 3 , wherein the picker is located on the first side of the substrate; and wherein the detector and the at least one light source are located on the second side of the substrate opposite the picker.
5. The system of claim 4 , wherein the first target analyte is labeled with at least one stain.
6. The system of claim 5 , wherein the method further comprises:
initiating the at least one light source to emit light comprising at least one wavelength;
detecting the at least one stain with the detector based on a signal provided or caused by the at least one stain; and
determining a location of the first target analyte on the substrate.
7. The system of claim 6 , wherein the initiating, detecting, and determining steps occur before the driving, contacting, overtraveling, and isolating steps.
8. The system of claim 7 , wherein the method further comprises moving the substrate along at least one axis perpendicular to the first axis to orient the first target analyte underneath an opening of the picker tip such that the opening, when the picker undergoes the driving and contacting steps, partially or fully envelops the first target analyte.
9. The system of claim 8 , wherein the moving step occurs after the initiating, detecting, and determining steps and before the driving, contacting, overtraveling, and isolating steps.
10. The system of claim 7 , wherein the initiating and detecting steps are performed with the first side facing the detector and the at least one light source; and wherein the driving, contacting, overtraveling, and isolating steps are performed with the first side facing the picker.
11. The system of claim 6 , further comprising a plurality of processors, wherein each processor is programmed to execute a subset of the method.
12. The system of claim 11 , wherein a first processor is located within a scanner, and wherein a second processor is located within an external device in communication with the scanner.
13. The system of claim 1 , wherein the at least one processor is located within a scanner or an external device in communication with the scanner.
14. The system of claim 1 , wherein the substrate is a glass microscope slide.
15. The system of claim 14 , wherein the picker tip is composed of a ceramic, glass, a metal, an organic material, an inorganic material, a plastic material, a polymer, a jewel, or combinations thereof.
16. The system of claim 14 , wherein the picker tip exerts 0.01-16 ounces of force on the substrate during the overtraveling step.