Memory block select circuitry including voltage bootstrapping control
Some embodiments include apparatuses, and methods of operating the apparatuses. Some of the apparatuses include a first memory cell string; a second memory cell string; a first group of conductive lines to access the first and second memory cell strings; a second group of conductive lines; a group of transistors, each transistor of the group of transistors coupled between a respective conductive line of the first group of conductive lines and a respective conductive line of the second group of conductive lines, the group of transistors having a common gate; and a circuit including a first transistor and a second transistor coupled in series between a first node and a second node, the first transistor including a gate coupled to the second node, and a third transistor coupled between the second node and the common gate.
1. An apparatus comprising:
a first group of semiconductor structures located in different levels of the apparatus and located over a substrate;
a pillar extending through the first group of semiconductor structures, the pillar being part of a memory cell string;
a second group of semiconductor structures located in the different levels, the second group of semiconductor structures being electrically separated from the first group of semiconductor structures;
a capacitor including a first conductive plate formed from part of a first semiconductor structure of the second group of semiconductor structures, and a second conductive plate formed from part of a second semiconductor structure of the second group of semiconductor structures;
a first conductive path coupled between the first conductive plate of the capacitor and a first node;
a second conductive path coupled between the second conductive plate of the capacitor and a second node;
a first transistor and a second transistor coupled in series between a third node and a fourth node, the first transistor including a gate directly coupled to the fourth node;
a third transistor including a first terminal directly coupled to the fourth node and a second terminal directly coupled to the first node; and
a fourth transistor having a gate directly coupled to the first node and a terminal coupled to the second conductive plate of the capacitor.
2. The apparatus of claim 1 , wherein each of the first and second groups of semiconductor structures includes conductively doped polysilicon.
3. The apparatus of claim 1 , wherein each of the first and third transistors includes a depletion-mode transistor.
4. The apparatus of claim 1 , further comprising a group of transistors having a common gate coupled to the first node.
5. An apparatus comprising:
a first group of semiconductor structures located in different levels of the apparatus and located over a substrate;
a pillar extending through the first group of semiconductor structures, the pillar being part of a memory cell string;
a second group of semiconductor structures located in the different levels, the second group of semiconductor structures being electrically separated from the first group of semiconductor structures;
a capacitor including a first conductive plate formed from part of a first semiconductor structure of the second group of semiconductor structures, and a second conductive plate formed from part of a second semiconductor structure of the second group of semiconductor structures;
a first conductive path coupled between the first conductive plate of the capacitor and a first node;
a second conductive path coupled between the second conductive plate of the capacitor and a second node;
a first transistor and a second transistor coupled in series between a third node and a fourth node, the first transistor including a gate coupled to the fourth node; and
a third transistor coupled between the fourth node and the first node, wherein:
the first conductive path includes a first conductive segment going through a location between the first group of semiconductor structures and the second group of semiconductor structures; and
the second conductive path includes a second conductive segment going through the location between the first group of semiconductor structures and the second group of semiconductor structures.
6. The apparatus of claim 5 , wherein:
the first conductive path includes a first additional conductive segment coupled to the first conductive segment, the first additional conductive segment having a length extending perpendicularly to the first conductive segment; and
the second conductive path includes a second additional conductive segment coupled to the second conductive segment, the second additional conductive segment having a length extending perpendicularly to the second conductive segment.
7. An apparatus comprising:
a group of semiconductor structures located in different levels of the apparatus and over a substrate;
a pillar extending through the group of semiconductor structures, the pillar being part of a memory cell string;
a group of conductive structures located over the group of semiconductor structures, the group of conductive structures being electrically separated from the group of semiconductor structures;
a capacitor including a first conductive plate formed from part of a first conductive structure of the group of conductive structures, and second conductive plate formed from part of a second conductive structure of the group of conductive structures;
a first conductive path coupled between the first conductive plate of the capacitor and a first node;
a second conductive path coupled between the second conductive plate of the capacitor and a second node;
a first transistor and a second transistor coupled in series between a third node and a fourth node, the first transistor including a gate directly coupled to the fourth node;
a third transistor including a first terminal directly coupled to the fourth node and a second terminal directly coupled to the second node; and
a fourth transistor having a gate directly coupled to the first node and a terminal coupled to the second conductive plate of the capacitor.
8. The apparatus of claim 7 , wherein each of the group of semiconductor structures and the group of conductive structures includes conductively doped polysilicon.
9. The apparatus of claim 7 , wherein each of the first and third transistors includes a depletion-mode transistor.
10. The apparatus of claim 7 , further comprising:
a fourth transistor coupled between the first node and a fifth node.
11. An apparatus comprising:
a group of semiconductor structures located in different levels of the apparatus and over a substrate;
a pillar extending through the group of semiconductor structures, the pillar being part of a memory cell string;
a group of conductive structures located over the group of semiconductor structures, the group of conductive structures being electrically separated from the group of semiconductor structures;
a capacitor including a first conductive plate formed from part of a first conductive structure of the group of conductive structures, and second conductive plate formed from part of a second conductive structure of the group of conductive structures;
a first conductive path coupled between the first conductive plate of the capacitor and a first node;
a second conductive path coupled between the second conductive plate of the capacitor and a second node;
a first transistor and a second transistor coupled in series between a third node and a fourth node, the first transistor including a gate coupled to the fourth node;
a third transistor coupled between the fourth node and the second node;
an additional group of conductive structures located in the levels that the group of conductive structures is located; and
an additional pillar extending through the additional group of conductive structures, the additional pillar being electrically coupled to a semiconductor structure of the group of semiconductor structures.
12. The apparatus of claim 11 , wherein:
the first conductive path includes a first conductive segment going through a location between the group of conductive structures and the additional group of conductive structures; and
the second conductive path includes a second conductive segment going through the location between the group of conductive structures and the additional group of conductive structures.
13. The apparatus of claim 12 , wherein:
the first conductive path includes a first additional conductive segment coupled to the first conductive segment, the first additional conductive segment having a length extending perpendicularly to the first conductive segment; and
the second conductive path includes a second additional conductive segment coupled to the second conductive segment, the second additional conductive segment having a length extending perpendicularly to the second conductive segment.