IP Library Granted Patent US 10,490,716
Granted Patent B2
US 10,490,716 · App. 15/947,245 · Granted Nov 26, 2019

Semiconductor device with optically-transmissive layer and manufacturing method thereof

Inventors: David Clark (Ipswich, GB); Curtis Zwenger (Chandler, AZ)
Assignee: AMKOR TECHNOLOGY, INC.
H01L33/58H01L24/00H01L33/44H01L33/62H01L2224/16225H01L2224/73204H01L2224/73253H01L2224/81005H01L2924/15311H01L2924/18161
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,490,716
App. No.
15/947,245
Granted
Nov 26, 2019
Kind
B2
Abstract

A method for manufacturing a semiconductor device and a semiconductor device produced thereby. For example and without limitation, various aspects of this disclosure provide a method for manufacturing a semiconductor device, and a semiconductor device produced thereby, that that comprises a transparent, translucent, non-opaque, or otherwise optically-transmissive, external surface.

Claims (25)

1. A semiconductor package, comprising:

a redistribution structure comprising one or more conductive layers and one or more dielectric layers;

a first semiconductor die comprising one or more optical devices that are configured to transmit light;

a second semiconductor die operatively coupled to the one or more conductive layers of the redistribution structure; and

an optically-transmissive layer;

an upper redistribution structure comprising one or more upper conductive layers; and

one or more conductive vias about a periphery of at least the second semiconductor die,

wherein the one or more conductive vias electrically couple the one or more conductive layers of the redistribution structure with the one or more upper conductive layers of the upper redistribution structure;

wherein the first semiconductor die is positioned over the optically-transmissive layer, and

wherein the optically-transmissive layer is configured to permit light from the one or more optical devices to pass therethrough.

2. The semiconductor package of claim 1 , wherein the optically-transmissive layer comprises a plurality of material layers of different refractive indices.

3. The semiconductor package of claim 1 , wherein the second semiconductor die includes a controller.

4. The semiconductor package of claim 1 , wherein a portion of at least one upper conductive layer of the one or more upper conductive layers extends over a periphery of a top surface of the second semiconductor die.

5. The semiconductor package of claim 1 , further comprising a plurality of conductive attachment structures along a surface of the second semiconductor die, wherein the second semiconductor die is electrically coupled to an upper conductive layer of the one or more upper conductive layers via the plurality of conductive attachment structures.

6. The semiconductor package of claim 1 , wherein the optically-transmissive layer comprises one or more lenses configured to direct light from the one or more optical devices.

7. The semiconductor package of claim 1 , wherein:

the second semiconductor die is laterally adjacent the first semiconductor die and comprises one or more second optical devices; and

the second semiconductor die is positioned over the optically-transmissive layer.

8. The semiconductor package of claim 1 , wherein:

the optically-transmissive layer comprises a first surface, a second surface opposite the first surface of the optically-transmissive layer, and a side surface between the first surface and the second surface of the optically-transmissive layer; and

the side surface of the optically-transmissive layer defines at least part of an external surface of the semiconductor package.

9. The semiconductor package of claim 1 , further comprising:

an encapsulant material between the upper redistribution structure and the optically-transmissive layer;

wherein a surface of the encapsulant material is coplanar with a top surface of the first semiconductor die.

10. The semiconductor package of claim 1 , further comprising an encapsulant material that contacts a side surface of the first semiconductor die, wherein the side surface of the first semiconductor die joins a top surface of the first semiconductor die to a bottom surface of the first semiconductor die.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 12, 2020
From: AMKOR TECHNOLOGY, INC.
To: AMKOR TECHNOLOGY SINGAPORE HOLDING PTE.LTD.
Reel/Frame 054046/0673 →
SECURITY INTEREST Recorded Aug 1, 2018
From: AMKOR TECHNOLOGY, INC.
To: BANK OF AMERICA, N.A., AS AGENT
Reel/Frame 046683/0139 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 6, 2018
From: CLARK, DAVID; ZWENGER, CURTIS
To: AMKOR TECHNOLOGY, INC.
Reel/Frame 045462/0422 →
Cited By (1)
US 12,660,388