Method, apparatus, and system for fin-over-nanosheet complementary field-effect-transistor
A semiconductor device at least one first transistor of a first type disposed above a substrate and comprising a channel wider in one cross-section than tall, wherein the first type is a PFET transistor or an NFET transistor; and at least one second transistor of a second type disposed above the at least one first transistor and comprising a channel taller in the one cross-section than wide, wherein the second type is a PFET transistor or an NFET transistor, and the second type is different from the first type. Methods and systems for forming the semiconductor structure.
1. A semiconductor device, comprising:
at least one first transistor of a first type disposed above a substrate and comprising (i) a channel having a first width and a first height in a cross-section of the semiconductor device, wherein the first width is greater than the first height, and (ii) a first source and a first drain; and
at least one second transistor of a second type disposed directly above the at least one first transistor and comprising (i) a channel having a second width and a second height in the cross-section, wherein the second height is greater than the second width, and (ii) a second source and a second drain; wherein the second source is vertically aligned with the first source, the second drain is vertically aligned with the first drain, and the second type is different from the first type;
an isolation layer disposed between the first source and the second source, and disposed between the first drain and the second drain; and
a spacer between the channel of the at least one first transistor and the channel of the at least one second transistor, wherein the spacer comprises at least one crenel.
2. The semiconductor device of claim 1 , wherein the channels of the at least one first transistor and the at least one second transistor comprise silicon.
3. The semiconductor device of claim 1 , wherein the spacer has a height at least four times the first height of the channel of the at least one first transistor and four times the second width of the channel of the at least one second transistor.
4. The semiconductor device of claim 1 , wherein the first type is NFET and the second type is PFET.
5. The semiconductor device of claim 1 , wherein the first type is PFET and the second type is NFET.