IP Library Granted Patent US 10,401,524
Granted Patent B2
US 10,401,524 · App. 15/968,582 · Granted Sep 3, 2019

Reflectivity and fracing

Inventors: Trevor Keith Charles Pugh (Tomball, TX); Robert Michael Payton (The Woodlands, TX)
Assignee: Deep Imaging Technologies, Inc.
G01V3/083E21B43/26G01V3/12
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Quick Facts
Patent No.
US 10,401,524
App. No.
15/968,582
Granted
Sep 3, 2019
Kind
B2
Abstract

A system and method allows determining the movement of subsurface fluids, gases or solids in the subsurface structure of interest. This allows quantitatively determining the results of surface and subsurface equipment and materials changes. These simple observations may result in significant improvements in field efficiency.

Claims (47)

1. A machine readable medium, on which are stored instructions, comprising instructions that when executed cause a machine to:

analyze a secondary field of a designed waveform received by a receiver of a controlled source electromagnetic system from a subsurface area of interest; and

indicate changes in impedance of structures in the subsurface area of interest contemporaneously with the changes, responsive to the analysis.

2. The machine readable medium of claim 1 , further comprising instructions that when executed cause the machine to:

detect a contrast boundary in a fluid plume in the secondary field of the designed waveform.

3. The machine readable medium of claim 1 , further comprising instructions that when executed cause the machine to:

identify an efficient pumping rate and extent responsive to indicated changes in impedance of the structures in the subsurface area of interest.

4. The machine readable medium of claim 1 , further comprising instructions that when executed cause the machine to:

determine in the subsurface area of interest, responsive to the analysis of the secondary field of the designed waveform one or more of:

a half fracing length;

a fracing height; and

a fracing volume.

5. The machine readable medium of claim 1 , further comprising instructions that when executed cause the machine to:

monitoring and imaging an impedance interface in the subsurface area of interest responsive to the analysis of the secondary field of the designed waveform.

6. The machine readable medium of claim 1 , further comprising instructions that when executed cause the machine to:

detect electromechanical voltages in signals received by the receiver of the controlled source electromagnetic system generated from cracking in the subsurface area of interest, wherein the electromechanical voltages are not coherent with the designed waveform transmitted by a transmitter of the controlled source electromagnetic system.

7. The machine readable medium of claim 1 , further comprising instructions that when executed cause the machine to:

detect a timing shift in the secondary field of the designed waveform caused by a deformation of structures in the subsurface area of interest.

8. The machine readable medium of claim 1 , further comprising instructions that when executed cause the machine to:

resolve location of a hydraulic fracturing fluid independent of a location of a proppant material in the subsurface area of interest.

9. The machine readable medium of claim 1 , further comprising instructions that when executed cause the machine to adjust a forward model of the subsurface area of interest.

10. A method of determining movement of subsurface fluid, gasses, or solids in a subsurface area of interest, comprising:

analyzing a secondary field of a designed waveform received by a receiver of a controlled source electromagnetic system; and

indicating changes in impedance of structures in the subsurface area of interest contemporaneously with the changes, responsive to the analysis.

11. The method of claim 10 , further comprising detecting a contrast boundary in a fluid plume in the secondary field of the designed waveform.

12. The method of claim 10 , further comprising identifying an efficient pumping rate and extent responsive to indicated changes in impedance of the structures in the subsurface area of interest.

13. The method of claim 10 , further comprising:

determining in the subsurface area of interest, responsive to the analysis of the secondary field of the designed waveform, one or more of:

a half fracing length;

a fracing height; and

a fracing volume.

14. The method of claim 10 , further comprising monitoring and imaging an impedance interface in the subsurface area of interest responsive to the analysis of the secondary field of the designed waveform.

15. The method of claim 10 , further comprising detecting electromechanical voltages in signals received by the receiver of the controlled source electromagnetic system generated from cracking in the subsurface area of interest, wherein the electromechanical voltages are not coherent with the designed waveform transmitted by a transmitter of the controlled source electromagnetic system.

16. The method of claim 10 , further comprising detecting a timing shift in the secondary field of the designed waveform caused by a deformation of structures in the subsurface area of interest.

17. The method of claim 10 , further comprising resolving a location of a hydraulic fracturing fluid independent of a location of a proppant material in the subsurface area of interest.

18. The method of claim 10 , further comprising adjusting a forward model of the subsurface area of interest.

19. A controlled source electromagnetic system for determining movement of subsurface fluid, gasses, or solids in a subsurface structure of interest, comprising:

a transmitter, configured to transmit a designed waveform;

a plurality of receivers, configured to receive the designed waveform;

an analysis unit configured to:

analyze a secondary field of a designed waveform received by a receiver of a controlled source electromagnetic system; and

indicate changes in impedance of structures in the subsurface area of interest contemporaneously with the changes, responsive to the analysis.

20. The controlled source electromagnetic system of claim 19 , wherein the analysis unit is further configured to:

determine in the subsurface area of interest, responsive to the analysis of the secondary field of the designed waveform one or more of:

a half fracing length;

a fracing height; and

a fracing volume.

Assignments (1)
CHANGE OF NAME Recorded Apr 16, 2024
From: DEEP IMAGING TECHNOLOGIES, INC.
To: ESG SOLUTIONS GROUP, INC.
Reel/Frame 067128/0855 →
Continuity (3)
Division 14593741 · Jan 9, 2015
Provisional Application 61925560 · Jan 9, 2014
Related Publication 20180252833A1 · Sep 6, 2018