Granted Patent B2

US 10,600,770 · App. 15/978,778 · Granted Mar 24, 2020

Abstract

Claims (49)

1. An assembly, comprising:

an interposer comprising a glass material;

a semiconductor die comprising a logic die having a proximity coupling on a side of the interposer; and

at least one other semiconductor die comprising a proximity coupling configured for

communicating signals with the proximity coupling of the semiconductor die, on an opposing side of the interposer, the at least one other die comprising a number of stacked memory dice, each of the logic die and the memory dice comprising a proximity coupling for mutual signal communication;

wherein:

the logic die is in electrically conductive communication with conductive traces of the interposer for communicating power and ground/bias;

the number of stacked memory dice comprises memory dice stacked in stair-step fashion with exposed bond pads on treads of stairs; and

further comprising wire bonds respectively extending from the exposed bond pads to conductive traces of the interposer for communicating power and ground/bias; and

the interposer comprises an optical waveguide for signal communication with an optical I/O of the logic die and extends to a socket for optical signal communication with higher level packaging.

2. The assembly of claim 1 , further comprising additional structure for electrically conductively communicating power and ground/bias to the logic die and the number of stacked memory dice.

3. An assembly, comprising:

an interposer comprising a glass material;

a semiconductor die comprising a logic die having a proximity coupling on a side of the interposer; and

at least one other semiconductor die comprising a proximity coupling configured for

communicating signals with the proximity coupling of the semiconductor die, on an opposing side of the interposer, the at least one other die comprising a number of stacked memory dice, each of the logic die and the memory dice comprising a proximity coupling for mutual signal communication, wherein:

the logic die is in electrically conductive communication with conductive traces of the interposer for communicating power and ground/bias;

the number of stacked memory dice comprises memory dice stacked in vertical alignment;

TSVs and conductive pillars extend between the stacked memory dice and conductive traces of the interposer, the TSVs, conductive pillars and the conductive traces in combination for communicating power and ground/bias to the memory dice; and

the interposer comprises an optical waveguide for signal communication with an optical I/O of the logic die and extends to a socket for optical signal communication with higher level packaging.

4. An assembly, comprising:

an interposer comprising a glass material;

a semiconductor die comprising a logic die having a proximity coupling on a side of the interposer; and

at least one other semiconductor die comprising a proximity coupling configured for

communicating signals with the proximity coupling of the semiconductor die, on an opposing side of the interposer, the at least one other die comprising a number of stacked memory dice, each of the logic die and the memory dice each comprising a proximity coupling for mutual signal communication, wherein:

the logic die is in electrically conductive communication with conductive traces of the interposer for communicating power and ground/bias;

the number of stacked memory dice comprises dice stacked in vertical alignment;

TSVs and conductive pillars extend between the number of stacked memory dice and conductive traces of the interposer, the TSVs, the conductive pillars and the conductive traces in combination for communicating power and ground/bias to the memory dice; and

the interposer comprises conductive traces for signal communication with the logic die, the conductive traces extending to conductive structure for signal communication with higher-level packaging.

5. The assembly of claim 1 , wherein the proximity couplings comprise inductive couplings.

6. A semiconductor device package, comprising:

an interposer comprising a glass material;

a logic die on a side of the interposer;

a stack of DRAM dice on an opposing side of the interposer;

each of the logic die and the DRAM dice configured with proximity couplings for mutual signal communication among and between the logic die and the DRAM dice;

conductive traces on the side of the interposer for communicating power and ground/bias to the logic die, the conductive traces extending to conductive structures terminating externally to the package;

other conductive traces on the opposing side of the interposer for communicating power and ground/bias to the DRAM dice, the other conductive traces extending to other conductive structures terminating externally to the package;

dielectric molding compound encapsulating the logic die and the DRAM dice; and

a heat spreader extending over and in thermally conductive contact with the logic die, the heat spreader extending to and in contact with the interposer proximate a periphery thereof;

at least some of the conductive structures and the other conductive structures extending through the interposer and through a portion of the dielectric molding compound.

7. The package of claim 6 , wherein the interposer carries an optical waveguide in communication with an optical I/O of the logic die and with socket structure terminating externally to the package for signal communication with higher level packaging.

8. The package of claim 6 , wherein the logic die is operably coupled to conductive traces on the side of the interposer extending to conductive structures terminating externally to the package for signal communication with higher level packaging.

9. The package of claim 6 , wherein the DRAM dice are stacked in stair-step fashion with bond pads exposed on stair treads; and

further comprising wire bonds respectively extending from the exposed bond pads to the conductive traces on the opposing side of the interposer.

10. The package of claim 6 , wherein the DRAM dice are stacked in vertical alignment; and

TSVs and conductive pillars extend between the DRAM dice and the conductive traces on the opposing side of the interposer.

11. The package of claim 6 , wherein the proximity couplings comprise inductive couplings.

12. The assembly of claim 3 , wherein the proximity couplings comprise inductive couplings.

13. The assembly of claim 4 , wherein the proximity couplings comprise inductive couplings.

Assignments (6)