IP Library Granted Patent US 10,509,579
Granted Patent B2
US 10,509,579 · App. 15/981,841 · Granted Dec 17, 2019

Memory system quality threshold intersection analysis and configuration

Inventors: Bruce A. Liikanen (Berthoud, CO); Gerald L. Cadloni (Longmont, CO); David Miller (Longmont, CO)
Assignee: Micron Technology, Inc.
G06F3/0632G06F3/0604G06F3/064G06F3/067G06F3/0619G06F3/0644G06F11/076G06F11/079G06F11/0727
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Quick Facts
Patent No.
US 10,509,579
App. No.
15/981,841
Filed
May 16, 2018
Granted
Dec 17, 2019
Kind
B2
Art Unit
2131
USPC
711/170
Abstract

A memory quality engine can improve the operation of a memory system by setting more effective operating parameters, disabling or removing memory devices unable to meet performance requirements, and providing evaluations between memory populations. These improvements can be accomplished by converting quality measurements of a memory population into CDF-based data, formulating comparisons of the CDF-based data to metrics for quality analysis, and applying the quality analysis. In some implementations, the metrics for quality analysis can use one or more thresholds, such as a system trigger threshold or an uncorrectable error correction condition threshold, which are set based on the error correction capabilities of a memory system. Formulating the comparison to these metrics can include determining an intersection between the CDF-based data and one of the thresholds.

Claims (52)

1. A method comprising:

obtaining quality measures for a memory population, wherein the quality measures comprise a histogram indicating counts of errors per memory unit in the memory population of a memory system;

converting the quality measures into logarithmic cumulative distribution function (CDF)-based data by computing a cumulative distribution function of the histogram;

formulating one or more comparisons of the CDF-based data to metrics for a quality analysis, by:

obtaining a threshold condition;

fitting a function to at least a portion of the CDF-based data; and

computing an intersection between the function and the threshold condition; and

applying results of the quality analysis to make improvements in the memory system by causing, based on the computed intersection, one or more actions in relation to the memory population, the one or more actions comprising a modification to operating parameters for the memory population.

2. The method of claim 1 , wherein the memory population comprises: a plurality of memory cells, a plurality of memory pages, a plurality of memory word lines, a plurality of memory blocks, a plurality of memory planes, a plurality of memory dies, or a plurality of memory devices, or a combination thereof.

3. The method of claim 1 , wherein the errors per memory unit in the quality measures for the memory population comprise bit errors per codeword.

4. The method of claim 1 , wherein converting the quality measures into CDF-based data comprises computing the CDF-based data as one minus the cumulative distribution function of the histogram.

5. The method of claim 1 , wherein the threshold condition is a system trigger threshold that specifies an error count correlated to data recovery speed as an error rate above which the memory system has to invoke secondary methods to perform data recovery by a controller of the memory system.

6. The method of claim 1 , wherein the threshold condition is an uncorrectable error correction condition (UECC) threshold specifying an error rate above which errors are not recoverable by a drive controller of the memory population.

7. The method of claim 1 , wherein fitting the function to at least the portion of the CDF-based data comprises:

identifying a section of the CDF-based data where the CDF-based data approximates, within a threshold amount, a line; and

fitting a linear function to the identified section of the CDF-based data.

8. The method of claim 7 , wherein the computing the intersection between the linear function and the threshold condition is in response to a determination that the CDF-based data does not comprise an extrinsic tail by determining that, past the section of the CDF-based data on the x-axis, the fit linear function and the CDF-based data do not differ above a threshold amount.

9. The method of claim 1 , wherein the modification to the operating parameters comprises adjusting a voltage, a clock rate, or a latency, or a combination thereof for the memory population, based on the computed intersection.

10. A non-transitory computer-readable storage medium storing instructions that, when executed by a computing system, cause the computing system to perform operations comprising:

obtaining quality measures for a memory population of a memory system;

converting the quality measures into cumulative distribution function (CDF)-based data;

formulating one or more comparisons of the CDF-based data to metrics for a quality analysis, by:

obtaining an error amount threshold condition;

fitting a function to at least a portion of the CDF-based data; and

computing an intersection between the function and the error amount threshold condition; and

applying results of the quality analysis to make improvements in the memory system by causing, based on the computed intersection, one or more actions in relation to the memory population.

11. The non-transitory computer-readable storage medium of claim 10 ,

wherein the quality measures comprise a histogram indicating counts of errors per memory unit in the memory population; and

wherein converting the quality measures into CDF-based data is performed by computing a cumulative distribution function of the histogram.

12. The non-transitory computer-readable storage medium of claim 10 , wherein the error amount threshold condition either specifies an error amount correlated to data recovery speed or specifies an error amount above which errors are not recoverable by a controller of the memory population.

13. The non-transitory computer-readable storage medium of claim 10 , wherein the function is a linear function on a logarithmic scale.

14. The non-transitory computer-readable storage medium of claim 10 , wherein the computing the intersection between the function and the threshold condition is in response to a determination that the CDF-based data does not comprise an extrinsic tail.

15. The non-transitory computer-readable storage medium of claim 10 , wherein causing the one or more actions comprises causing a modification to operating parameters for the memory population.

16. The non-transitory computer-readable storage medium of claim 10 , wherein causing the one or more actions comprises generating a report indicating the computed intersection.

17. The non-transitory computer-readable storage medium of claim 10 , wherein the function is a linear function on a logarithmic scale and wherein fitting the function to at least the portion of the CDF-based data comprises:

identifying a section of the CDF-based data where the CDF-based data approximates, within a threshold amount, a line; and

fitting the linear function to the identified section of the CDF-based data.

18. A system comprising:

a memory;

one or more processors;

an interface configured to, using the one or more processors:

obtain quality measures for a memory population of a memory system; and

obtain an error amount threshold condition;

a cumulative distribution function (CDF) converter configured to, using the one or more processors, convert the quality measures into CDF-based data;

an intercept analysis engine configured to, using the one or more processors, formulate one or more comparisons of the CDF-based data to metrics for a quality analysis, by:

fitting a function to at least a portion of the CDF-based data; and

computing an intersection between the function and the threshold condition; and

an analysis application engine configured to, using the one or more processors, apply results of the quality analysis to make improvements in the memory system by causing, based on the computed intersection, one or more actions in relation to the memory population.

19. The system of claim 18 ,

wherein the quality measures comprise a histogram indicating counts of errors per memory unit in the memory population; and

wherein converting the quality measures into CDF-based data is performed by computing a cumulative distribution function of the histogram.

20. The system of claim 18 , wherein the error amount threshold condition either specifies an error amount correlated to data recovery speed or specifies an error amount above which errors are not recoverable by a controller of the memory population.

Assignments (5)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 11, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050713/0001 →
SUPPLEMENT NO. 9 TO PATENT SECURITY AGREEMENT Recorded Aug 9, 2018
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 047282/0463 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 17, 2018
From: LIIKANEN, BRUCE A.; CADLONI, GERALD L.; MILLER, DAVID
To: MICRON TECHNOLOGY, INC.
Reel/Frame 045832/0405 →
Continuity (1)
Related Publication 20190354299A1 · Nov 21, 2019